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Journal Articles

Irradiation energy dependence of ion probes on soft error rate in SOI-SRAM

Abo, Satoshi*; Mokuno, Yoshiaki*; Kinomura, Atsushi*; Onoda, Shinobu; Hirao, Toshio; Oshima, Takeshi; Iwamatsu, Toshiaki*; Takai, Mikio*

Proceedings of the 8th International Workshop on Radiation Effects on Semiconductor Devices for Space Applications (RASEDA-8), p.183 - 186, 2008/12

no abstracts in English

Journal Articles

Ion beam modification of ZnO thin films on MgO

Matsunami, Noriaki*; Ito, Masaharu*; Takai, Yoshiaki*; Tazawa, Masato*; Sataka, Masao

Nuclear Instruments and Methods in Physics Research B, 206, p.282 - 286, 2003/05

https://doi.org/10.1016/S0168-583X(03)00745-6
 Times Cited Count：24 Percentile：81.09(Instruments & Instrumentation)

no abstracts in English

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