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Journal Articles

Lattice dynamics of the Zn-Mg-Sc icosahedral quasicrystal and its Zn-Sc periodic 1/1 approximant

de Boissieu, M.*; Francoual, S.*; Minalkovi$v{c}$, M.*; Shibata, Kaoru; Baron, A. Q. R.*; Sidis, Y.*; Ishimasa, Tsutomu*; Wu, D.*; Lograsso, T.*; Regnault, L.-P.*; et al.

Nature Materials, 6(12), p.977 - 984, 2007/12

 Times Cited Count:42 Percentile:81.31(Chemistry, Physical)

We have carried out inelastic X-ray and neutron scattering experiments on single-grain samples of the Zn-Mg-Sc icosahedral quasicrystal and of the Zn-Sc periodic cubic 1/1 approximant, with the aim of studying the respective influence of the local order and the long-range order (periodic or quasiperiodic) on lattice dynamics. Besides the overall similarities and the existence of a pseudo-gap in the transverse dispersion relation, marked difference are observed, the pseudo-gap being larger and better defined in the approximant than in the quasicrystal. These results are compared with simulations on atomic models and using oscillating pair potentials, and the simulations reproduce in detail the experimental results.

Oral presentation

Trace very light element analysis using soft X-ray emission spectrometry in FE-SEM/EPMA

Takahashi, Hideyuki*; Asahina, Shunsuke*; Murano, Takanori*; Takakura, Yu*; Terauchi, Masami*; Koike, Masato; Imazono, Takashi; Koeda, Masaru*; Nagano, Tetsuya*; Sasai, Hiroyuki*; et al.

no journal, , 

We developed a soft X-ray emission spectrometer (SXES) with a detection range of 50-210 eV to be able to be installed in commercially available EMPAs and FE-SEMs. This SXES has the spectral resolution of 0.2 eV comparably high with X-ray photo emission spectrometers (XPSs) and electron energy-loss spectrometers (EELSs). In addition, it allows us to perform trace light element analysis with high sensitivity because of high peak-to-background ratio (P/B). Therefore, it is shown that the SXES installed in a FE-SEM can detect trace carbon in steel at the level of 100 ppm and below.

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