Initialising ...
Initialising ...
Initialising ...
Initialising ...
Initialising ...
Initialising ...
Initialising ...
Yoon, J.-Y.*; Takeuchi, Yutaro*; Takechi, Ryota*; Han, J.*; Uchiyama, Tomohiro*; Yamane, Yuta*; Kanai, Shun*; Ieda, Junichi; Ohno, Hideo*; Fukami, Shunsuke*
Nature Communications (Internet), 16, p.1171_1 - 1171_8, 2025/02
Times Cited Count：0 Percentile：0.00(Multidisciplinary Sciences)Han, J.*; Uchimura, Tomohiro*; Araki, Yasufumi; Yoon, J.-Y.*; Takeuchi, Yutaro*; Yamane, Yuta*; Kanai, Shun*; Ieda, Junichi; Ohno, Hideo*; Fukami, Shunsuke*
Nature Physics, 20(7), p.1110 - 1117, 2024/07
Times Cited Count：8 Percentile：94.14(Physics, Multidisciplinary)Quantum metric and Berry curvature are two fundamental and distinct factors to describe the geometry of quantum eigenstates. While Berry curvature is known for playing crucial roles in several condensed-matter states, quantum metric, which was predicted to induce new classes of topological phenomena, has rarely been touched, particularly in an ambient circumstance. Using a topological chiral antiferromagnet Mn
Sn adjacent to Pt, at room temperature, we successfully manipulate the quantum-metric structure of electronic states through its interplay with the nanoscale spin texture at the MnSn/Pt interface. This is manifested by a time-reversal-odd second-order Hall effect that is robust against extrinsic electron scattering, in contrast to any transport effects from the Berry curvature. We also verify the flexibility of controlling the quantum-metric structure, as the interacting spin texture can be tuned by moderate magnetic fields or by interface engineering via spin-orbit interactions. Our work paves a way for harnessing the quantum-metric structure to unveil emerging topological physics in practical environments and to build applicable nonlinear devices.
Sn nanodotSato, Yuma*; Takeuchi, Yutaro*; Yamane, Yuta*; Yoon, J.-Y.*; Kanai, Shun*; Ieda, Junichi; Ohno, Hideo*; Fukami, Shunsuke*
Applied Physics Letters, 122(12), p.122404_1 - 122404_5, 2023/03
Times Cited Count：4 Percentile：54.88(Physics, Applied)Sn thin films by magneto-optical Kerr effectUchimura, Tomohiro*; Yoon, J.-Y.*; Sato, Yuma*; Takeuchi, Yutaro*; Kanai, Shun*; Takechi, Ryota*; Kishi, Keisuke*; Yamane, Yuta*; DuttaGupta, S.*; Ieda, Junichi; et al.
Applied Physics Letters, 120(17), p.172405_1 - 172405_5, 2022/04
Times Cited Count：22 Percentile：87.95(Physics, Applied)Takeuchi, Yutaro*; Yamane, Yuta*; Yoon, J.-Y.*; Ito, Ryuichi*; Jinnai, Butsurin*; Kanai, Shun*; Ieda, Junichi; Fukami, Shunsuke*; Ohno, Hideo*
Nature Materials, 20(10), p.1364 - 1370, 2021/10
Times Cited Count：121 Percentile：98.78(Chemistry, Physical)
Sn
thin filmsYoon, J.-Y.*; Takeuchi, Yutaro*; DuttaGupta, S.*; Yamane, Yuta*; Kanai, Shun*; Ieda, Junichi; Ohno, Hideo*; Fukami, Shunsuke*
AIP Advances (Internet), 11(6), p.065318_1 - 065318_6, 2021/06
Times Cited Count：18 Percentile：76.47(Nanoscience & Nanotechnology)Wada, Ryutaro*; Yamaguchi, Kenji*; Nishimura, Tsutomu*; Kurimoto, Yoshitaka*; Nakanishi, Tomoaki*; Takeuchi, Yasunori*; Fujiwara, Kazuo*; Tateishi, Tsuyoshi*
JNC TJ8400 2002-001, 121 Pages, 2002/02
JNC-TJ8400-2002-001.pdf:4.34MB
The overpack is expected to have long-term soundness, and corrosion behavior models of the overpack have been constructed. To verify validity and maintainability of the models, this study conducted a research on a super-long-term test of overpack materials for several decades. (1)We designed a testing device that would allow long-term monitoring of the corrosion behavior of carbon steel, an overpack candidate material, and the condition in the buffer material in an environment corresponding to the environment immediately after disposal. (2)We examined and prototyped a test container that would allow long-term immersion tests of carbon steel without maintenance operations such as solution exchange. (3)We proposed super-long-term tests (about 20 years) that would contribute to future geological disposal projects and safety rules. (4)We investigated a method for managing and preserving the records of the super-long-term test for the test period (20 years).
Han, J.*; Uchimura, Tomohiro*; Araki, Yasufumi; Yoon, J.-Y.*; Takeuchi, Yutaro*; Yamane, Yuta*; Kanai, Shun*; Ieda, Junichi; Ohno, Hideo*; Fukami, Shunsuke*
no journal, ,
no abstracts in English
Han, J.*; Uchimura, Tomohiro*; Araki, Yasufumi; Yoon, J.-Y.*; Takeuchi, Yutaro*; Yamane, Yuta*; Kanai, Shun*; Ieda, Junichi; Ohno, Hideo*; Fukami, Shunsuke*
no journal, ,
