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Takeda, Shinichiro*; Katsuragawa, Miho*; Takahashi, Tadayuki*; Watanabe, Shin*; Chiu, I.-H.; Ninomiya, Kazuhiko*; Arai, Toshihiko*; Onishi, Mitsunobu*; Tampo, Motonobu*; Shimomura, Koichiro*; et al.
Analytical Chemistry, 98(24), p.17618 - 17626, 2026/06
Times Cited Count：0Yamaguchi, Yuji; Niikura, Megumi*; Mizuno, Rurie*; Tampo, Motonobu*; Harada, Masahide; Kawamura, Naritoshi*; Umegaki, Izumi*; Takeshita, Soshi*; Haga, Katsuhiro
Nuclear Instruments and Methods in Physics Research B, 567, p.165801_1 - 165801_11, 2025/10
Times Cited Count：1 Percentile：51.17(Instruments & Instrumentation)As part of the development of a sample radioactivity calculation program, we have measured radionuclide production probabilities in negative muon nuclear capture to update experimental data and to validate a calculation dataset obtained by a Monte Carlo simulation code. The probabilities have been obtained by an activation experiment on 
Al, 
Si, 
Co, and Ta targets. The obtained probabilities expand the validation scope to the radionuclide production processes outside of the existing data coverage. By comparing the resultant probabilities with the calculated dataset, it has been revealed that the dataset is generally on the safe side in radioactivity estimation and needs to be corrected in the following three cases: (i) isomer production; (ii) radionuclide production by the multiple neutron emission; (iii) radionuclide production by particle emissions involving a proton. The present probabilities and the new findings on the correction provide valuable clues to improvements of the simulation models.
Gomi, Yuibi*; Takami, Kazusa*; Mizuno, Rurie*; Niikura, Megumi*; Yasuda, Ryuichi*; Deng, Y.*; Kawase, Shoichiro*; Watanabe, Yukinobu*; Abe, Shinichiro; Liao, W.*; et al.
IEEE Transactions on Nuclear Science, 72(8), p.2751 - 2762, 2025/08
Times Cited Count：2 Percentile：73.73(Engineering, Electrical & Electronic)The study of muon-induced soft errors in terrestrial settings remains underexplored even though the incidence of muon-induced soft errors tends to increas. In this study, we conducted positive and negative muon irradiation experiments on four types of 12-nm FinFET SRAMs. At the momentum where the SEU cross section peaks, 2-fin cells exhibit larger SEU cross sections than 1-fin cells for negative muons. Conversely, for positive muons, the SEU cross section is larger in 1-fin cells than in 2-fin cells due to the increased diffusion capacitance in 2-fin cells. We also performed the Monte Carlo simulations. The results suggest that a single sensitive volume with the same critical charge value cannot consistently reproduce the SEU cross sections for both types of muons.
Shimomura, Koichiro*; Koda, Akihiro*; Pant, A. D.*; Sunagawa, Hikaru*; Fujimori, Hiroshi*; Umegaki, Izumi*; Nakamura, Jumpei*; Fujihara, Masayoshi; Tampo, Motonobu*; Kawamura, Naritoshi*; et al.
Interactions (Internet), 245(1), p.31_1 - 31_6, 2024/12
Times Cited Count：3 Percentile：91.16(Physics, Atomic, Molecular & Chemical)Ninomiya, Kazuhiko*; Kubo, Kenya*; Inagaki, Makoto*; Yoshida, Go*; Takeshita, Soshi*; Tampo, Motonobu*; Shimomura, Koichiro*; Kawamura, Naritoshi*; Strasser, P.*; Miyake, Yasuhiro*; et al.
Journal of Radioanalytical and Nuclear Chemistry, 333(7), p.3445 - 3450, 2024/07
Times Cited Count：1 Percentile：20.46(Chemistry, Analytical)Deng, Y.*; Watanabe, Yukinobu*; Manabe, Seiya*; Liao, W.*; Hashimoto, Masanori*; Abe, Shinichiro; Tampo, Motonobu*; Miyake, Yasuhiro*
IEEE Transactions on Nuclear Science, 71(4, Part 2), p.912 - 920, 2024/04
Times Cited Count：2 Percentile：20.46(Engineering, Electrical & Electronic)With the miniaturization of semiconductors and the decrease in operating voltage, there is a growing interest and discussion in whether the muons in cosmic rays may be the source of single event upsets (SEUs). In the case of neutron-induced SEUs, it was reported that the irradiation side has the impact on SEU cross sections. Here, to investigate the impact of irradiation direction on muon-induced SEUs, we have measured and simulate muon-induced SEUs in 65-nm bulk SRAMs with different muon irradiation directions. It was found that the peak SEU cross section for the package side irradiation is about twice large as that for the board side irradiation. We also revealed that the difference in observed SEU cross sections between the package side and the board side irradiation is caused by differences in energy straggling due to changes in penetration depth depending on the incident direction.
Gomi, Yuibi*; Takami, Kazusa*; Mizuno, Rurie*; Niikura, Megumi*; Deng, Y.*; Kawase, Shoichiro*; Watanabe, Yukinobu*; Abe, Shinichiro; Liao, W.*; Tampo, Motonobu*; et al.
Proceedings of 23rd European Conference on Radiation and its Effects on Components and Systems (RADECS 2023)(Internet) , 4 Pages, 2023/09
Times Cited Count：1 Percentile：58.55(Engineering, Electrical & Electronic)It has been suggested that the effect of muon-induced soft errors will increase by shrinking of the semiconductor process. However, muon irradiation experiments for FinFETs has not been reported. We performed positive and negative muon irradiation experiments on 12-nm FinFET and 28-nm planar SRAMs at MUSE in J-PARC. The negative muon-induced single event upset (SEU) cross section is more than ten times larger than that of the positive muon. The negative muon-induced SEU cross section of FinFETs decreases by the same ratio as neutron-induced one compared to planar SRAMs.
Osawa, Takahito; Nagasawa, Shunsaku*; Ninomiya, Kazuhiko*; Takahashi, Tadayuki*; Nakamura, Tomoki*; Wada, Taiga*; Taniguchi, Akihiro*; Umegaki, Izumi*; Kubo, Kenya*; Terada, Kentaro*; et al.
ACS Earth and Space Chemistry (Internet), 7(4), p.699 - 711, 2023/04
Times Cited Count：9 Percentile：65.21(Chemistry, Multidisciplinary)The concentrations of carbon and other major elements in asteroid samples provide very important information on the birth of life on the Earth and the solar-system evolution. Elemental analysis using muonic X-rays is one of the best analytical methods to determine the elemental composition of solid materials, and notably, is the only method to determine the concentration of light elements in bulk samples in a non-destructive manner. We developed a new analysis system using muonic X-rays to measure the concentrations of carbon and other major elements in precious and expectedly tiny samples recovered from the asteroid Ryugu by spacecraft Hayabusa2. Here we report the development process of the system in 4 stages and their system configurations, The analysis system is composed of a stainless-steel analysis chamber, an acrylic glove box for manipulating asteroid samples in a clean environment, and Ge semiconductor detectors arranged to surround the analysis chamber. The performance of the analysis system, including the background level, which is crucial for the measurement, was greatly improved from the first stage to the later ones. Our feasibility study showed that the latest model of our muonic X-ray analysis system is capable of determining the carbon concentration in Hayabusa2's sample model with an uncertainty of less than 10 percent in a 6-day measurement.
Shimomura, Koichiro*; Koda, Akihiro*; Pant, A. D.*; Natori, Hiroaki*; Fujimori, Hiroshi*; Umegaki, Izumi*; Nakamura, Jumpei*; Tampo, Motonobu*; Kawamura, Naritoshi*; Teshima, Natsuki*; et al.
Journal of Physics; Conference Series, 2462, p.012033_1 - 012033_5, 2023/03
Times Cited Count：2 Percentile：92.31(Physics, Applied)Okutsu, Kenichi*; Yamashita, Takuma*; Kino, Yasushi*; Nakashima, Ryota*; Miyashita, Konan*; Yasuda, Kazuhiro*; Okada, Shinji*; Sato, Motoyasu*; Oka, Toshitaka; Kawamura, Naritoshi*; et al.
Fusion Engineering and Design, 170, p.112712_1 - 112712_4, 2021/09
Times Cited Count：5 Percentile：39.71(Nuclear Science & Technology)A muonic molecule which consists of two hydrogen isotope nuclei (deuteron (d) or tritium (t)) and a muon decays immediately via nuclear fusion and the muon will be released as a recycling muon, and start to find another hydrogen isotope nucleus. The reaction cycle continues until the muon ends up its lifetime of 2.2 
s. Since the muon does not participate in the nuclear reaction, the reaction is so called a muon catalyzed fusion (CF). The recycling muon has a particular kinetic energy (KE) of the muon molecular orbital when the nuclear reaction occurs. Since the KE is based on the unified atom limit where distance between two nuclei is zero. A precise few-body calculation estimating KE distribution (KED) is also in progress, which could be compared with the experimental results. In the present work, we observed recycling muons after CF reaction.
Yamashita, Takuma*; Okutsu, Kenichi*; Kino, Yasushi*; Nakashima, Ryota*; Miyashita, Konan*; Yasuda, Kazuhiro*; Okada, Shinji*; Sato, Motoyasu*; Oka, Toshitaka; Kawamura, Naritoshi*; et al.
Fusion Engineering and Design, 169, p.112580_1 - 112580_5, 2021/08
Times Cited Count：4 Percentile：32.33(Nuclear Science & Technology)A muon () having 207 times larger mass of electron and the same charge as the electron has been known to catalyze a nuclear fusion between deuteron (d) and triton (t). These two nuclei are bound by and form a muonic hydrogen molecular ion, dt. Due to the short inter-nuclear distance of dt, the nuclear fusion, d +t
+ n + 17.6 MeV, occurs inside the molecule. This reaction is called muon catalyzed fusion (CF). Recently, the interest on CF is renewed from the viewpoint of applications, such as a source of high-resolution muon beam and mono-energetic neutron beam. In this work, we report a time evolution calculation of CF in a two-layered hydrogen isotope target.
X raysOkumura, Takuma*; Azuma, Toshiyuki*; Bennet, D. A.*; Caradonna, P.*; Chiu, I. H.*; Doriese, W. B.*; Durkin, M. S.*; Fowler, J. W.*; Gard, J. D.*; Hashimoto, Tadashi; et al.
Physical Review Letters, 127(5), p.053001_1 - 053001_7, 2021/07
Times Cited Count：23 Percentile：79.49(Physics, Multidisciplinary)We observed electronic X rays emitted from muonic iron atoms using a superconducting transition-edge-type sensor microcalorimeter. The energy resolution of 5.2 eV in FWHM allowed us to observe the asymmetric broad profile of the electronic characteristic 
and 
X rays together with the hypersatellite X rays around 6 keV. This signature reflects the time-dependent screening of the nuclear charge by the negative muon and the 
-shell electrons, accompanied by electron side-feeding. Assisted by a simulation, this data clearly reveals the electronic - and -shell hole production and their temporal evolution during the muon cascade process.
Liao, W.*; Hashimoto, Masanori*; Manabe, Seiya*; Watanabe, Yukinobu*; Abe, Shinichiro; Tampo, Motonobu*; Takeshita, Soshi*; Miyake, Yasuhiro*
IEEE Transactions on Nuclear Science, 67(7), p.1566 - 1572, 2020/07
Times Cited Count：2 Percentile：14.22(Engineering, Electrical & Electronic)Muon-induced single event upset (SEU) is predicted to increase with technology scaling. The angle of incidence of terrestrial muons is not always perpendicular to the chip surface. Consequently, the impact of the angle of incidence of muons on SEUs should be evaluated. This study conducts negative muon irradiation tests on bulk SRAM and FDSOI SRAM at two angles of incidence: 0 degree (vertical) and 45 degree (tilted). The tilted incidence drifts the muon energy peak to a higher energy. Moreover, the SEU characteristics (i.e., such as the voltage dependences of the SEU cross sections and multiple cells upset patterns) between the vertical and tilted incidences are similar.
Manabe, Seiya*; Watanabe, Yukinobu*; Liao, W.*; Hashimoto, Masanori*; Nakano, Keita*; Sato, Hikaru*; Kin, Tadahiro*; Abe, Shinichiro; Hamada, Koji*; Tampo, Motonobu*; et al.
IEEE Transactions on Nuclear Science, 65(8), p.1742 - 1749, 2018/08
Times Cited Count：17 Percentile：76.23(Engineering, Electrical & Electronic)Recently, the malfunction of microelectronics caused by secondary cosmic-ray muon is concerned as semiconductor devices become sensitive to radiation. In this study, we have performed muon irradiation testing for 65-nm ultra-thin body and thin buried oxide (UTBB-SOI) SRAMs in the Japan Proton Accelerator Research Complex (J-PARC), in order to investigate dependencies of single event upset (SEU) cross section on incident muon momentum and supply voltage. It was found that the SEU cross section by negative muon are approximately two to four times larger than those by positive muon in the momentum range from 35 MeV/c to 39 MeV/c. The supply voltage dependence of muon-induced SEU cross section was measured with the momentum of 38 MeV/c. SEU cross sections decrease with increasing supply voltage, but the decreasing of SEU cross section by negative muon is gentler than that by positive muon. Experimental data of positive and negative muon irradiation with the momentum of 38 MeV/c were analyzed by PHITS. It was clarified that the negative muon capture causes the difference between the SEU cross section by negative muon and that by positive muon.
Liao, W.*; Hashimoto, Masanori*; Manabe, Seiya*; Watanabe, Yukinobu*; Abe, Shinichiro; Nakano, Keita*; Sato, Hikaru*; Kin, Tadahiro*; Hamada, Koji*; Tampo, Motonobu*; et al.
IEEE Transactions on Nuclear Science, 65(8), p.1734 - 1741, 2018/08
Times Cited Count：24 Percentile：87.47(Engineering, Electrical & Electronic)Soft error induced by secondary cosmic-ray muon is concerned since susceptibility of semiconductor device to soft error increases with the scaling of technology. In this study, we have performed irradiation tests of muons on 65-nm bulk CMOS SRAM in the Japan Proton Accelerator Research Complex (J-PARC) and measured soft error rate (SER) to investigate mechanism of muon-induced soft errors. It was found that SER by negative muon increases above 0.5 V supply voltage, although SER by positive muon increases monotonically as the supply voltage lowers. SER by negative muon also increases with forward body bias. In addition, negative muon causes large multiple cell upset (MCU) of more than 20 bits and the ratio of MCU events to all the events is 66% at 1.2V supply voltage. These tendencies indicate that parasitic bipolar action (PBA) is highly possible to contribute to SER by negative muon. Experimental data are analyzed by PHITS. It was found that negative muon can deposit larger charge than positive muon, and such events that can deposit large charge may trigger PBA.
Tampo, Motonobu*; Hamada, Koji*; Kawamura, Naritoshi*; Inagaki, Makoto*; Ito, Takashi; Kojima, Kenji*; Kubo, Kenya*; Ninomiya, Kazuhiko*; Strasser, P.*; Yoshida, Go*; et al.
JPS Conference Proceedings (Internet), 8, p.036016_1 - 036016_6, 2015/09
Tampo, Motonobu; Miyabe, Masabumi; Akaoka, Katsuaki; Oba, Masaki; Oba, Hironori; Maruyama, Yoichiro; Wakaida, Ikuo
Journal of Analytical Atomic Spectrometry, 29(5), p.886 - 892, 2014/03
Times Cited Count：56 Percentile：94.09(Chemistry, Analytical)An enhancement of emission intensity from laser ablation plume, obtained by coupling a pulsed microwave using a simple wire antenna, is demonstrated to compensate the sensitivity reduction of super-high resolution spectrometer that is required for nuclear fuel analysis. A gadolinium oxide sample was irradiated with 2.45 GHz, 250 W microwave pulse, passed through a loop antenna. As a result, up to 50 fold enhancement of emission signal was achieved for gadolinium ions. The enhancement enabled to measure the mass concentration of europium per gadolinium, ranging from 5% to 100 ppm, and based on the extrapolation of calibration curve the detection limit was estimated to be significantly lower than 100 ppm. This offers a flexible and compact system of microwave-assisted laser-induced breakdown spectroscopy for nuclear fuel analysis.
Khumaeni, A.; Tampo, Motonobu; Akaoka, Katsuaki; Miyabe, Masabumi; Wakaida, Ikuo
Optics Express (Internet), 21(24), p.29755 - 29768, 2013/12
Times Cited Count：68 Percentile：93.13(Optics)Intensified microwave coupled by a loop antenna (diameter of 3 mm) has been employed to enhance the laser-induced breakdown spectroscopy (LIBS) emission. In this method, a laser plasma was induced on Gd
O
sample at a reduced pressure by focusing a pulsed Nd:YAG laser (532 nm, 10 ns, 5 mJ) at a local point, at which electromagnetic field was produced by introducing microwave radiation using loop antenna. The plasma emission was significantly enhanced by absorbing the microwave radiation, resulting in high-temperature plasma and long-lifetime plasma emission. By using this method, the enhancement of Gd lines was up to 32 times, depending upon the emission lines observed. A linear calibration curve of Ca contained in the GdO sample was made. The detection limit of Ca was approximately 2 mg/kg. This present method is very useful for identification of trace elements in nuclear fuel and radioactive materials.
Miyabe, Masabumi; Oba, Masaki; Iimura, Hideki; Akaoka, Katsuaki; Maruyama, Yoichiro; Oba, Hironori; Tampo, Motonobu; Wakaida, Ikuo
Applied Physics A, 112(1), p.87 - 92, 2013/07
Times Cited Count：35 Percentile：76.24(Materials Science, Multidisciplinary)A uranium oxide sample was ablated by 2nd harmonic radiation from a Nd:YAG laser at a fluence of 0.5 J/cm
. The temporal evolution of the ablation plume was investigated in vacuum and helium environments. In vacuum, the flow velocity perpendicular to the sample surface was determined to be 2.7 km/s for neutral atoms and 4.0 km/s for singly charged atoms. From the evolution of the plume in helium we found that an observation time of 3-5 s and an observation height of about 2.5 mm are most suited for obtaining higher sensitivity. Observation times less than 3 s were unsuitable for precise isotope analysis since the spectral modifications arising from the Doppler splitting effect are different between the two uranium isotopes. Using the established conditions, we evaluated the calibration curve linearity, limit of detection, and precision for three samples having different abundances of 
U.
Fukuda, Yuji; Sakaki, Hironao; Kanasaki, Masato; Yogo, Akifumi; Jinno, Satoshi; Tampo, Motonobu*; Faenov, A. Ya.*; Pikuz, T. A.*; Hayashi, Yukio; Kando, Masaki; et al.
Proceedings of SPIE, Vol.8779 (Internet), p.87790F_1 - 87790F_7, 2013/05
Times Cited Count：0 Percentile：0.00(Engineering, Biomedical)We demonstrate a new ion diagnosis method for high energy ions by utilizing a combination of a single CR-39 detector and plastic plates, which enables to detect high energy ions beyond the detection threshold limit of the CR-39. This detection method coupled with a magnetic spectrometer is applied to identify high energy ions of 50 MeV per nucleon in laser-driven ion acceleration experiments using cluster-gas targets.
