Initialising ...
Initialising ...
Initialising ...
Initialising ...
Initialising ...
Initialising ...
Initialising ...
Suzuki, Ryohei*; Tani, Yukinori*; Naito, Hirotaka*; Miyata, Naoyuki*; Tanaka, Kazuya
Catalysts, 10(1), p.44_1 - 44_15, 2020/01
Times Cited Count:11 Percentile:36.02(Chemistry, Physical)We prepared biogenic Mn oxides (BMOs) using strain KR21-2, and subsequently conducted single or repeated treatment experiments in Cr(NO
)
at pH6.0. Under aerobic conditions, newly formed BMOs exhibited a rapid production of Cr(VI) without a significant release of Mn(II), demonstrating that newly formed BMO mediates a catalytic oxidation of Cr(III) with a self-regeneration step of reduced Mn. In anaerobic solution, newly formed BMOs showed a cessation of Cr(III) oxidation in the early stage of the reaction, and subsequently had a much smaller Cr(VI) production with significant release of reduced Mn(II).
Tanaka, Ryohei*; Hideshima, Iori*; Minoura, Yuya*; Yoshigoe, Akitaka; Teraoka, Yuden; Hosoi, Takuji*; Shimura, Takayoshi*; Watanabe, Heiji*
Dai-19-Kai Getosutakku KenkyuKai Yokoshu, p.5 - 8, 2014/01
Hosoi, Takuji*; Hideshima, Iori*; Tanaka, Ryohei*; Minoura, Yuya*; Yoshigoe, Akitaka; Teraoka, Yuden; Shimura, Takayoshi*; Watanabe, Heiji*
Microelectronic Engineering, 109, p.137 - 141, 2013/09
Times Cited Count:12 Percentile:52.75(Engineering, Electrical & Electronic)Hosoi, Takuji*; Hideshima, Iori*; Minoura, Yuya*; Tanaka, Ryohei*; Yoshigoe, Akitaka; Teraoka, Yuden; Shimura, Takayoshi*; Watanabe, Heiji*
Shingaku Giho, 113(87), p.19 - 23, 2013/06
An understanding of the mechanisms responsible for formation or decomposition of GeO interlayer and Ge diffusion into high-
layer is important to develop advanced metal/high-
gate stacks for Ge MOSFETs. In this work, we fabricated HfO
/GeO
/Ge gate stacks by
oxidation of thin metal Hf layers on Ge substrates. The effect of plasma oxidation on the change in the bonding states of Ge atoms in HfO
/GeO
/Ge gate stacks and the structural changes induced by metal electrode deposition and thermal annealing was systematically investigated by synchrotron radiation photoemission spectroscopy (SR-PES) and electrical characterization.
Nakagawa, Hitoshi*; Inafuku, Masashi*; Kusaba, Makoto*; Yamaguchi, Hiroyasu*; Morishita, Toshikazu*; Morita, Ryohei*; Nishimura, Minoru*; Hoeman, S.*; Yokota, Yuichiro; Hase, Yoshihiro; et al.
JAEA-Review 2007-060, JAEA Takasaki Annual Report 2006, P. 72, 2008/03
no abstracts in English
Kakizono, Toshihide*; Sugiura, Toshihiro*; Yoshihara, Ryohei; Hase, Yoshihiro; Narumi, Issei; Tanaka, Atsushi
JAEA-Review 2007-060, JAEA Takasaki Annual Report 2006, P. 91, 2008/03
no abstracts in English
Morita, Ryohei*; Morishita, Toshikazu*; Nakagawa, Hitoshi*; Nishimura, Minoru*; Yamaguchi, Hiroyasu*; Yokota, Yuichiro; Hase, Yoshihiro; Tanaka, Atsushi
JAEA-Review 2006-042, JAEA Takasaki Annual Report 2005, P. 78, 2007/02
no abstracts in English
Ozawa, Akira*; Matsuta, Kensaku*; Nagatomo, Takashi*; Mihara, Mototsugu*; Yamada, Kazunari*; Yamaguchi, Takayuki*; Otsubo, Takashi*; Momota, Sadao*; Izumikawa, Takuji*; Sumikama, Toshiyuki*; et al.
Physical Review C, 74(2), p.021301_1 - 021301_4, 2006/08
Times Cited Count:43 Percentile:88.73(Physics, Nuclear)no abstracts in English
Kizaki, Hiroyuki*; Wada, Shinichi*; Sako, Erika*; Sumii, Ryohei*; Waki, Satoshi*; Isari, Koji*; Sekitani, Tetsuji*; Sekiguchi, Tetsuhiro; Tanaka, Kenichiro*
Journal of Electron Spectroscopy and Related Phenomena, 144-147, p.447 - 451, 2005/06
Times Cited Count:5 Percentile:27.03(Spectroscopy)no abstracts in English
Nishitani, Takeo; Ochiai, Kentaro; Yoshida, Shigeo*; Tanaka, Ryohei*; Wakisaka, Masashi*; Nakao, Makoto*; Sato, Satoshi; Yamauchi, Michinori*; Hori, Junichi; Wada, Masayuki*; et al.
Journal of Nuclear Science and Technology, 41(Suppl.4), p.58 - 61, 2004/03
no abstracts in English
Yoshida, Shigeo*; Nishitani, Takeo; Ochiai, Kentaro; Kaneko, Junichi*; Hori, Junichi; Sato, Satoshi; Yamauchi, Michinori*; Tanaka, Ryohei*; Nakao, Makoto*; Wada, Masayuki*; et al.
Fusion Engineering and Design, 69(1-4), p.637 - 641, 2003/09
Times Cited Count:9 Percentile:52.65(Nuclear Science & Technology)no abstracts in English
Tanaka, Ryohei*; Ochiai, Kentaro; Nakao, Makoto*; Yamauchi, Michinori*; Hori, Junichi; Wada, Masayuki*; Sato, Satoshi; Nishitani, Takeo
JAERI-Tech 2003-063, 62 Pages, 2003/07
no abstracts in English
Nishitani, Takeo; Ochiai, Kentaro; Yoshida, Shigeo*; Tanaka, Ryohei*; Wakisaka, Masashi*; Nakao, Makoto*; Sato, Satoshi; Yamauchi, Michinori*; Hori, Junichi; Takahashi, Akito*; et al.
Purazuma, Kaku Yugo Gakkai-Shi, 79(3), p.282 - 289, 2003/03
no abstracts in English
Wada, Shinichi*; Sumii, Ryohei*; Isari, Koji*; Waki, Satoshi*; Sako, Erika*; Sekiguchi, Tetsuhiro; Sekitani, Tetsuji*; Tanaka, Kenichiro*
Surface Science, 528(1-3), p.242 - 248, 2003/03
Times Cited Count:46 Percentile:84.38(Chemistry, Physical)no abstracts in English
Wada, Shinichi*; Sako, Erika*; Sumii, Ryohei*; Waki, Satoshi*; Isari, Koji*; Sekiguchi, Tetsuhiro; Sekitani, Tetsuji*; Tanaka, Kenichiro*
Nuclear Instruments and Methods in Physics Research B, 199, p.361 - 365, 2003/01
Times Cited Count:11 Percentile:58.58(Instruments & Instrumentation)no abstracts in English
Morita, Ryohei*; Morishita, Toshikazu*; Nakagawa, Hitoshi*; Nishimura, Minoru*; Yamaguchi, Hiroyasu*; Yokota, Yuichiro; Hase, Yoshihiro; Tanaka, Atsushi
no journal, ,
no abstracts in English
Tanaka, Ryohei*; Hideshima, Iori*; Minoura, Yuya*; Yoshigoe, Akitaka; Teraoka, Yuden; Hosoi, Takuji*; Shimura, Takayoshi*; Watanabe, Heiji*
no journal, ,
no abstracts in English
Hosoi, Takuji*; Hideshima, Iori*; Tanaka, Ryohei*; Minoura, Yuya*; Yoshigoe, Akitaka; Teraoka, Yuden; Shimura, Takayoshi*; Watanabe, Heiji*
no journal, ,
Tanaka, Ryohei*; Hideshima, Iori*; Minoura, Yuya*; Yoshigoe, Akitaka; Teraoka, Yuden; Hosoi, Takuji*; Shimura, Takayoshi*; Watanabe, Heiji*
no journal, ,
no abstracts in English
Hideshima, Iori*; Tanaka, Ryohei*; Minoura, Yuya*; Yoshigoe, Akitaka; Teraoka, Yuden; Hosoi, Takuji*; Shimura, Takayoshi*; Watanabe, Heiji*
no journal, ,
no abstracts in English
Nakagawa, Hitoshi*; Inafuku, Masashi*; Kusaba, Makoto*; Yamaguchi, Hiroyasu*; Morishita, Toshikazu*; Morita, Ryohei*; Nishimura, Minoru*; Hoeman, S.*; Yokota, Yuichiro; Hase, Yoshihiro; et al.
no journal, ,
no abstracts in English