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JAEA Reports

Commissioning of X-ray micro beam by Kirkpatrick-Baez (KB) mirror

Tanida, Hajime; Tsuji, Takuya; Kobata, Masaaki

JAEA-Technology 2021-031, 25 Pages, 2022/02

JAEA-Technology-2021-031.pdf:2.3MB

In the decommissioning of the Tokyo Electric Power Company Holdings Fukushima Daiichi Nuclear Power Station, analysis of fuel debris to understand its characteristics is very important. The fuel debris removed for testing and analyzing will be fine particulates. Non-destructive analytical methods using X-rays are effective for such samples, but in order to apply them to fine particles, the X-rays must be focused to the micrometer order. For this purpose, the Kirkpatrick-Baez (KB) mirror was introduced. In this paper, we record the selection, specification, adjustment of the mirror, and write down the example of mapping of elements and evaluation of their valence by this mirror.

Journal Articles

Development of fluorescence XAFS imaging using pinhole camera

Tanida, Hajime; Okamoto, Yoshihiro

X-sen Bunseki No Shimpo, 52, p.69 - 80, 2021/03

In the two-dimensional imaging XAFS method using an X-ray CCD detector, a transmission method has been applied to heavy elements with absorption edges at relatively high energies. Although the transmission method requires the sample to be an optimal thickness, the high-energy X-rays have high transmission capability, and can be applied to relatively thick samples. In this study, we attempted to develop a fluorescence method for fast screening of transition metal elements with the low energy X-ray absorption edges and their valence distribution in the samples such as glass materials, which are difficult to make thin. In order to obtain XAFS spectra with high sensitivity and positional resolution, a direct imaging detector without a scintillator and a pinhole were used. The results were demonstrated with a highly brilliant synchrotron radiation undulator X-ray with variable incident energy.

Journal Articles

Anomalous small-angle X-ray scattering (ASAXS) study of irradiation-induced nanostructure change in Fe-ion beam irradiated oxide dispersion-strengthened (ODS) steel

Kumada, Takayuki; Oba, Yojiro; Motokawa, Ryuhei; Morooka, Satoshi; Tominaga, Aki; Tanida, Hajime; Shobu, Takahisa; Konno, Azusa; Owada, Kenji*; Ono, Naoko*; et al.

Journal of Nuclear Materials, 528, p.151890_1 - 151890_7, 2020/01

 Times Cited Count:0 Percentile:0.01(Materials Science, Multidisciplinary)

We have developed an anomalous small-angle X-ray scattering (ASAXS) diffractometer in SPring-8 to investigate irradiation-induced nanostructural change in ion-beam irradiated stainless steel. A thermally-aged MA956 stainless steel sample displays power-law scattering that follows the Porod law at the magnitude of scattering vector, Q, below 0.5 nm$$^-1$$ and an overlapped shoulder around 0.7 nm$$^-1$$. After the ion-beam irradiation, the intensity of the shoulder remained unchanged, whereas that of the power-law scattering nearly doubled. This result indicates that none of the structural parameters of the Cr-rich nanoprecipitates, such as the number density, size, and interface roughness, were changed by the irradiation.

Journal Articles

Effect of the headgroup structure on counterion binding in adsorbed surfactant films investigated by total reflection X-ray absorption fine structure spectroscopy

Imai, Yosuke*; Tokiwa, Yuhei*; Ueno, Shusaku*; Tanida, Hajime; Watanabe, Iwao*; Matsubara, Hiroki*; Takiue, Takanori*; Aratono, Makoto*

Bulletin of the Chemical Society of Japan, 91(10), p.1487 - 1494, 2018/10

 Times Cited Count:0 Percentile:0(Chemistry, Multidisciplinary)

Competitive binding of binary mixed counterions to the headgroups of adsorbed surfactant films has been investigated at solution surfaces by total reflection X-ray absorption fine structure (XAFS) spectroscopy. The obtained extended XAFS $$chi$$ spectra for bromide counterions are linear combinations of the spectra of fully hydrated bromide ions (free Br) and partially dehydrated bromide ions bound to the headgroups of the surfactant ions (bound Br). From the fraction of bound Br in counterion mixed systems, two series of the relative strengths of counterion binding are proposed for the trimethylammonium (TA$$^{+}$$) and 3-methylimidazolium (MIM$$^{+}$$) headgroups: (a) TA-SO$$_{4}$$ $$<$$ TA-Cl $$<$$ TA-Br $$<$$ TA-BF$$_{4}$$ and (b) MIM-Br $$<$$ TA-Br $$<$$ TA-BF$$_{4}$$ $$<$$ MIM-BF$$_{4}$$. For the TA headgroup, matching the hydration of the headgroups and counterions gives series (a) according to Collins' law, which states that the tendency of contact ion pair formation becomes larger when the absolute values of the hydration enthalpies of the ions match. For the MIM headgroup, the number of binding sites of hydrogen bonds between the MIM headgroup and counterion is essential, which leads to series (b) because of competition between the counterion and water for interaction with the MIM headgroup.

Journal Articles

Phase-change materials; Vibrational softening upon crystallization and its impact on thermal properties

Matsunaga, Toshiyuki*; Yamada, Noboru*; Kojima, Rie*; Shamoto, Shinichi; Sato, Masugu*; Tanida, Hajime*; Uruga, Tomoya*; Kohara, Shinji*; Takata, Masaki*; Zalden, P.*; et al.

Advanced Functional Materials, 21(12), p.2232 - 2239, 2011/06

 Times Cited Count:103 Percentile:95.79(Chemistry, Multidisciplinary)

Thermal properties of the amorphous and crystalline state of phase-change materials show remarkable differences such as higher thermal displacements and a more pronounced anharmonic behavior in the crystalline phase. These findings are related to the change of bonding upon crystallization.

Journal Articles

Depth-resolved XAFS analysis of SrTiO$$_3$$ thin film

Yoneda, Yasuhiro; Tanida, Hajime*; Takagaki, Masafumi*; Uruga, Tomoya*

Transactions of the Materials Research Society of Japan, 35(1), p.99 - 102, 2010/03

Depth dependency of local structure of SrTiO$$_3$$ thin film was investigated by X-ray absorption fine structure (XAFS). In epitaxial thin films, a large strain exists between substrates and grown films. The expitaxial strain is the largest in the interface and it is relaxed as parting from the substrate. The lattice parameter of the grown film changes depending on the lattice strain. We performed depth-resolved XAFS measurements on SrTiO$$_3$$ thin film grown on LaAlO$$_3$$ substrate. The depth-resolved XAFS can extract the local structures around the surface and inner regions separately. It was clarified that the bond distance between Sr and O changed greatly depending on the depth. On the other hand, the bond distance between Sr and Ti unchanged.

Journal Articles

Magnetic and dielectric behavior of the ruthenium double perovskite oxides $$R$$$$_{2}$$$$M$$RuO$$_{6}$$ ($$R$$=La, Pr and Nd, $$M$$=Mg, Co, Ni and Zn)

Yoshii, Kenji; Ikeda, Naoshi*; Mori, Shigeo*; Yoneda, Yasuhiro; Mizumaki, Masaichiro*; Tanida, Hajime*; Kawamura, Naomi*

Transactions of the Materials Research Society of Japan, 32(1), p.51 - 54, 2007/03

Magnetic and dielectric properties of the ruthenium double perovskites $$R$$$$_{2}$$$$M$$RuO$$_{6}$$ were studied ($$M$$ = Co, Ni, Zn, Mg). The materials with the magnetic M$$^{2+}$$ ions ($$M$$ = Co and Ni) showed magnetic ordering and large dielectric constants (about 5000). On the other hand, for the non-magnetic M$$^{2+}$$ ions ($$M$$ = Mg and Zn), magnetic ordering was not observed. In addition, their dielectric constants were found to be small (about 100-200). Together with the result of the dielectric response, the large dielectric constants for $$M$$=Co and Ni may be related to a smooth response of polar regions. Investigations of the properties of $$R$$$$_{2}$$$$M$$RuO$$_{6}$$ with $$R$$=Pr and Nd are also being carried out, and their results are briefly discussed.

Journal Articles

The Local structure of molten CdBr$$_{2}$$

Shiwaku, Hideaki; Okamoto, Yoshihiro; Yaita, Tsuyoshi; Suzuki, Shinichi; Minato, Kazuo; Tanida, Hajime*

Zeitschrift f$"u$r Naturforschung, A, 60a(1-2), p.81 - 84, 2005/01

no abstracts in English

Journal Articles

Local structure of molten CdCl$$_2$$ systems

Okamoto, Yoshihiro; Shiwaku, Hideaki; Yaita, Tsuyoshi; Suzuki, Shinichi; Minato, Kazuo; Tanida, Hajime*

Zeitschrift f$"u$r Naturforschung, A, 59a(11), p.819 - 824, 2004/11

The local structure of molten CdCl$$_2$$ and CdCl$$_2$$-KCl mixture was investigated by high-temperature XAFS technique. The nearest Cd-Cl distance decreases by melting. Similarly, the coordination number decreases from 6 to 4. It suggests that there is (CdCl$$_4$$)$$^{2-}$$ tetrahedral complex ion in the melt. It is concluded that the local structure is kept also in the mixture melt, since the same XAFS result as the pure melt was obtained.

Journal Articles

Neutron diffraction and X-ray absorption study of CaMn$$_{0.6}$$Ru$$_{0.4}$$O$$_{3}$$

Yoshii, Kenji; Nakamura, Akio; Mizumaki, Masaichiro*; Tanida, Hajime*; Kawamura, Naomi*; Abe, Hideki*; Ishii, Yoshinobu; Shimojo, Yutaka; Morii, Yukio

Journal of Magnetism and Magnetic Materials, 272-276(Suppl.), p.e609 - e611, 2004/05

 Times Cited Count:4 Percentile:26.12(Materials Science, Multidisciplinary)

no abstracts in English

Journal Articles

Structural and electronic investigation of TbPdAl by means of EXAFS and XANES measurements

Mizumaki, Masaichiro*; Yoshii, Kenji; Kitazawa, Hideaki*; Tanida, Hajime*

Journal of Solid State Chemistry, 171(1-2), p.291 - 294, 2003/02

 Times Cited Count:5 Percentile:18.41(Chemistry, Inorganic & Nuclear)

no abstracts in English

Journal Articles

Structure, magnetism and transport of La$$_{2}$$NiRuO$$_{6}$$

Yoshii, Kenji; Abe, Hideki*; Mizumaki, Masaichiro*; Tanida, Hajime*; Kawamura, Naomi*

Journal of Alloys and Compounds, 348(1-2), p.236 - 240, 2003/01

 Times Cited Count:12 Percentile:60.53(Chemistry, Physical)

no abstracts in English

Journal Articles

Local structure of molten LaCl$$_3$$ by K-absorption edge XAFS

Okamoto, Yoshihiro; Shiwaku, Hideaki; Yaita, Tsuyoshi; Narita, Hirokazu; Tanida, Hajime*

Journal of Molecular Structure, 641(1), p.71 - 76, 2002/10

 Times Cited Count:36 Percentile:69.09(Chemistry, Physical)

The local structure of molten LaCl$$_3$$ was investigated by X-ray absorption fine structure(XAFS) of the La K-edge. The nearest La$$^{3+}$$-Cl$$^-$$ distance andcoordination number were 2.89$$pm0.01$$${AA}$ and 7.4$$pm0.5$$ from the curve fitting of the 1st peak in the fourier transform magnitude $$|FT|$$. The coordination number larger than 6 suggests that the local structure of molten LaCl$$_3$$ is not a simple octahedral coordination (LaCl$$_6$$)$$^{3-}$$, but 7-fold (LaCl$$_7$$)$$^{4-}$$ and/or 8-fold (LaCl$$_8$$)$$^{5-}$$ complexes. The 1st La$$^{3+}$$-La$$^{3+}$$ distance, of which correlation was observed as a weak 2nd peak in the $$|FT|$$, was evaluated to be 4.9${AA}$. It suggests that the distorted corner-sharing connection of the complex species is predominant in the melt, inontrast with molten YCl$$_3$$ in which the edge-sharing connection of the 6-fold (YCl$$_6$$)$$^{3-}$$ mainly exists.

Journal Articles

Standard X-ray mirror systems for SPring-8 beamlines

Uruga, Tomoya*; Tanida, Hajime*; Yoneda, Yasuhiro; Takeshita, K.*; Goto, Shunji*; Ishikawa, Tetsuya*

Nuclear Instruments and Methods in Physics Research A, 467-468(Part1), p.782 - 784, 2001/07

 Times Cited Count:8 Percentile:54.01(Instruments & Instrumentation)

no abstracts in English

Journal Articles

Structural study on lanthanide complexes with tridentate ligands in solution

Narita, Hirokazu; Yaita, Tsuyoshi; Okamoto, Yoshihiro; Takai, Konomi; Shiwaku, Hideaki; Shimada, Asako*; Yamamoto, Takeshi*; Tanida, Hajime*

Spring-8 Experiment Report, Vol.6, P. 9, 2001/00

no abstracts in English

Journal Articles

The XAFS beamline BL01B1 at SPring-8

Uruga, Tomoya*; Tanida, Hajime*; Yoneda, Yasuhiro; Takeshita, Kunikazu*; Emura, Shuichi*; Takahashi, Masao*; Harada, Makoto*; Nishihata, Yasuo; Kubozono, Yoshihiro*; Tanaka, Tsunehiro*; et al.

Journal of Synchrotron Radiation, 6(Part3), p.143 - 145, 1999/05

An x-ray absorption fine-structure (XAFS) spectroscopy beamline, BL01B1, was installed at a bending magnet source at SPring-8 and has been open to users since October 1997. It was designed for XAFS experiments covering a wide energy range. Position tables and automatical control programs were established to adjust the x-ray optics and achieve the designed performance of the beamline under each experimental condition. This has enabled conventional XAFS measurements to be made with a good data quality from 4.5 to 110 keV.

Journal Articles

Eu ${it K}$-XAFS of europium dioxymonocyanamide with the convension He$$^+$$ ion yield method

Takahashi, Masao*; Harada, Makoto*; Watanabe, Iwao*; Uruga, Tomoya*; Tanida, Hajime*; Yoneda, Yasuhiro; Emura, Shuichi*; Tanaka, Tsunehiro*; Kimura, Hidekazu*; Kubozono, Yoshihiro*; et al.

Journal of Synchrotron Radiation, 6(3), p.222 - 224, 1999/05

 Times Cited Count:10 Percentile:59.73(Instruments & Instrumentation)

no abstracts in English

Oral presentation

Introduction of the undulator Quick-XAFS system on BL11XU at SPring-8, and an application to Pd complex in the column chromatography

Shiwaku, Hideaki; Yaita, Tsuyoshi; Okamoto, Yoshihiro; Narita, Hirokazu*; Tanida, Hajime*

no journal, , 

no abstracts in English

Oral presentation

Depth resolved XAFS study on SrTiO$$_3$$ thin film

Yoneda, Yasuhiro; Uruga, Tomoya*; Tanida, Hajime*; Takagaki, Masafumi*

no journal, , 

Depth dependency of local structure of SrTiO$$_3$$ thin film was investigated by X-ray absorption fine structure (XAFS). In epitaxial thin films, a large strain exists between substrates and grown films. The epitaxial strain is the largest in the interface and it is relaxed as parting from the substrate. The lattice parameter of the grown film changes depending on the lattice strain. We performed depth-resolved XAFS measurements on SrTiO$$_3$$ thin film grown on LaAlO$$_3$$ substrate. The depth-resolved XAFS can extract the local structures around the surface and inner regions separately. It was clarified that the bond distance between Sr and O changed greatly depending on the depth. On the other hand, the bond distance between Sr and Ti unchanged.

Oral presentation

Development of the anomalous small-angle X-ray scattering method at BL22XU

Tominaga, Aki; Oba, Yojiro; Shobu, Takahisa; Owada, Kenji*; Tanida, Hajime; Konno, Azusa; Morooka, Satoshi; Motokawa, Ryuhei; Kumada, Takayuki

no journal, , 

In steel materials, it is known that precipitation of Cr rich phase hardens ferrite phase and decreases toughness in base material. Small angle X-ray scattering is a promising method for analysis of this precipitation process because the precipitate is nanometer size. However, it is usually difficult to separate the scattering between the Fe phase and Cr phase since Fe and Cr are close in atomic number. Therefore, in order to observe the state of phase separation of Cr, we developed an anomalous X-ray small angle scattering (A-SAXS) method at BL22XU.

38 (Records 1-20 displayed on this page)