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論文

The Belle II SVD data readout system

Thalmeier, R.*; 谷田 聖; 他97名*

Nuclear Instruments and Methods in Physics Research A, 845, p.633 - 638, 2017/02

 被引用回数:6 パーセンタイル:51.82(Instruments & Instrumentation)

The Belle II Experiment at the High Energy Accelerator Research Organization (KEK) in Tsukuba, Japan, will explore the asymmetry between matter and antimatter and search for new physics beyond the standard model. 172 double-sided silicon strip detectors are arranged cylindrically in four layers around the collision point to be part of a system which measures the tracks of the collision products of electrons and positrons. A total of 1748 radiation-hard APV25 chips read out 128 silicon strips each and send the analog signals by time-division multiplexing out of the radiation zone to 48 Flash Analog Digital Converter Modules (FADC). Each of them applies processing to the data; for example, it uses a digital finite impulse response filter to compensate line signal distortions, and it extracts the peak timing and amplitude from a set of several data points for each hit, using a neural network. We present an overview of the SVD data readout system, along with front-end electronics, cabling, power supplies and data processing.

論文

EMC studies for the vertex detector of the Belle II experiment

Thalmeier, R.*; 谷田 聖; 他102名*

Journal of Instrumentation (Internet), 11(1), p.C01044_1 - C01044_10, 2016/01

 被引用回数:2 パーセンタイル:11.21(Instruments & Instrumentation)

The upgrade of the Belle II experiment plans to use a vertex detector based on two different technologies, DEPFET pixel (PXD) technology and double side silicon microstrip (SVD) technology. The vertex electronics are characterized by the topology of SVD bias that forces to design a sophisticated grounding because of the floating power scheme. The complex topology of the PXD power cable bundle may introduce some noise inside the vertex area. This paper presents a general overview of the EMC issues present in the vertex system, based on EMC tests on an SVD prototype and a study of noise propagation in the PXD cable bundle based on Multi-conductor transmission line theory.

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