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ionsShiina, Yoko*; Kinoshita, Ryo*; Funada, Shuhei*; Matsuda, Makoto; Imai, Makoto*; Kawatsura, Kiyoshi*; Sataka, Masao*; Sasa, Kimikazu*; Tomita, Shigeo*
Nuclear Instruments and Methods in Physics Research B, 460, p.30 - 33, 2019/12
Times Cited Count：2 Percentile：23.19(Instruments & Instrumentation)
ions through micro- and nano-capillariesTsuchida, Hidetsugu*; Majima, Takuya*; Tomita, Shigeo*; Sasa, Kimikazu*; Narumi, Kazumasa; Saito, Yuichi; Chiba, Atsuya; Yamada, Keisuke; Hirata, Koichi*; Shibata, Hiromi*; et al.
Nuclear Instruments and Methods in Physics Research B, 315, p.336 - 340, 2013/11
Times Cited Count：3 Percentile：26.71(Instruments & Instrumentation)Sakaguchi, Shinobu; Tachibana, Ikuya; Koshino, Katsuhiko; Shirozu, Hidetomo; Shirai, Nobutoshi; Imamoto, Nobuo; Tomita, Tsuneo; Tobita, Hiroo; Yamanaka, Atsushi; Kobayashi, Daisuke; et al.
JAEA-Technology 2011-006, 24 Pages, 2011/03
JAEA-Technology-2011-006.pdf:3.07MB
In the Niigataken Chuetsu-oki Earthquake on 2007, observed earthquake motion exceeded design base at the Kashiwazaki Kariwa nuclear plant. However, there was no earthquake damage in safety important equipments to stop reactor, to cool reactor, and to contain radioactive materials. One of this reason is said that many safety margin are included in the design and the permissible value. To know more accurate safety margin, shearing force examinations for the base bolts were conducted. In examinations, delegate test-bolts were made; the test bolts were selected from heavier equipment in Tokai Reprocessing Plant. In this report, the shearing strength obtained from the examinations shows more accurate safety margin.
Kudo, Hiroshi*; Iwasaki, Wataru*; Uchiyama, Rumi*; Tomita, Shigeo*; Shima, Kunihiro*; Sasa, Kimikazu*; Ishii, Satoshi*; Narumi, Kazumasa; Naramoto, Hiroshi; Saito, Yuichi; et al.
Japanese Journal of Applied Physics, Part 2, 45(22), p.L565 - L568, 2006/06
Times Cited Count：14 Percentile：47.16(Physics, Applied)The first observation of the energy distribution of electrons emitted from solids bombarded by MeV atom clusters is reported. In the backward direction, using graphite and Si bombarded by C
and Al (n 
8), an appreciable suppression of electron emission has been observed at electron energies lower than 
10 eV. Electron yield per atom decreases with increasing n, and becomes less than 50% at n 
3, relative to the case of n = 1. The experimental results cannot be explained in terms of projectile stopping cross sections nor by the clearing-the-way effect. It is probable that the suppressed electron emission is a result of the suppression of the transport or surface transmission of the produced low-energy electrons, rather than of the suppression of ionization.
microbeams by single-microcapillary methodsTsuchida, Hidetsugu*; Majima, Takuya*; Tomita, Shigeo*; Sasa, Kimikazu*; Narumi, Kazumasa; Saito, Yuichi; Chiba, Atsuya; Yamada, Keisuke; Hirata, Koichi*; Shibata, Hiromi*; et al.
no journal, ,
Tsuchida, Hidetsugu*; Nakajima, Kaoru*; Yokoe, Junya*; Sugiyama, Motohiko*; Ota, Yushi*; Majima, Takuya*; Shibata, Hiromi*; Tomita, Shigeo*; Sasa, Kimikazu*; Hirata, Koichi*; et al.
no journal, ,
no abstracts in English
Tsuchida, Hidetsugu*; Majima, Takuya*; Tomita, Shigeo*; Sasa, Kimikazu*; Hirata, Koichi*; Shibata, Hiromi*; Saito, Yuichi; Narumi, Kazumasa; Chiba, Atsuya; Yamada, Keisuke; et al.
no journal, ,
no abstracts in English
