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Pikuz, T.*; Faenov, A.*; Matsuoka, Takeshi*; Matsuyama, Satoshi*; Yamauchi, Kazuto*; Ozaki, Narimasa*; Albertazzi, B.*; Inubushi, Yuichi*; Yabashi, Makina*; Tono, Kensuke*; et al.
Scientific Reports (Internet), 5, p.17713_1 - 17713_10, 2015/12
Times Cited Count：40 Percentile：86.89(Multidisciplinary Sciences)Nakajima, Kyo*; Teramoto, Takahiro*; Akagi, Hiroshi; Fujikawa, Takashi*; Majima, Takuya*; Minemoto, Shinichiro*; Ogawa, Kanade*; Sakai, Hirofumi*; Togashi, Tadashi*; Tono, Kensuke*; et al.
Scientific Reports (Internet), 5, p.14065_1 - 14065_11, 2015/09
Times Cited Count：38 Percentile：82.34(Multidisciplinary Sciences)We report on the measurement of deep inner-shell 2p X-ray photoelectron diffraction (XPD) patterns from laser-aligned I
molecules using X-ray free-electron laser (XFEL) pulses. The XPD patterns of the I molecules, aligned parallel to the polarization vector of the XFEL, were well matched with our theoretical calculations. Further, we propose a criterion for applying our molecular-structure-determination methodology to the experimental XPD data. In turn, we have demonstrated that this approach is a significant step toward the time-resolved imaging of molecular structures.
Pikuz, T.; Faenov, A.*; Fukuda, Yuji; Kando, Masaki; Bolton, P.; Mitorfanov, A.*; Vinogradov, A.*; Nagasono, Mitsuru*; Ohashi, Haruhiko*; Yabashi, Makina*; et al.
Optics Express (Internet), 20(4), p.3424 - 3433, 2012/02
Times Cited Count：30 Percentile：77.63(Optics)Nagasono, Mitsuru*; Harries, J.; Iwayama, Hiroshi*; Togashi, Tadashi*; Tono, Kensuke*; Yabashi, Makina*; Semba, Yasunori*; Ohashi, Haruhiko*; Ishikawa, Tetsuya*; Shigemasa, Eiji*
Physical Review Letters, 107(19), p.193603_1 - 193603_5, 2011/11
Times Cited Count：37 Percentile：81.48(Physics, Multidisciplinary)Inogamov, N. A.*; Anisimov, S. I.*; Petrov, Y. V.*; Khokhlov, V. A.*; Zhakhovskii, V. V.*; Faenov, A. Ya.*; Pikuz, T.; Fortov, V. E.*; Skobelev, I. Y.*; Kato, Yoshiaki*; et al.
Journal of Optical Technology, 78(8), p.473 - 480, 2011/08
Times Cited Count：6 Percentile：32.05(Optics)Inogamov, N. A.*; Faenov, A. Ya.*; Zhakhovsky, V. V.*; Pikuz, T. A.*; Skobelev, I. Yu.*; Petrov, Y. V.*; Khokhlov, V. A.*; Shepelev, V. V.*; Anisimov, S. I.*; Fortov, V. E.*; et al.
Contributions to Plasma Physics, 51(5), p.419 - 426, 2011/06
Times Cited Count：20 Percentile：62.54(Physics, Fluids & Plasmas)Warm dense matter, arising under the action of ultrashort EUV-FEL pulse onto LiF dielectric crystal, is characterized by high temperature of conduction electrons, with their number density achieving values of the order of atom number density at maximum laser fluences in our experiments. Expansion of matter, heated and pressurized through the electron-ion energy exchange, gives rise to the spallative ablation at small fluences and gaseous outflow from a target in the case of large fluences. Ablation threshold is low in comparison with a longer nanosecond XRL.
Fukuda, Yuji; Faenov, A. Y.; Pikuz, T. A.*; Ohashi, Haruhiko*; Semba, Yasunori*; Nagasono, Mitsuru*; Tono, Kensuke*; Togashi, Tadashi*; Yabashi, Makina*; Ishikawa, Tetsuya*
no journal, ,
We have conducted detailed focused spot shape measurements for EUVFEL using a LiF crystal radiation detector. The single shot focused spot images were recorded on the LiF detector surface as a function of detector position. As a result, we found that the spot images were distorted due to aberrations, and that laser beam was focused about 1-mm up to the laser beam axis. Moreover, we found that the LiF crystal was ablated due to high intensity of the focused beam.
Nagasono, Mitsuru*; Harries, J.; Iwayama, Hiroshi*; Tono, Kensuke*; Togashi, Tadashi*; Semba, Yasunori*; Ohashi, Haruhiko*; Yabashi, Makina*; Ishikawa, Tetsuya*; Shigemasa, Eiji*
no journal, ,
no abstracts in English
Faenov, A.*; Pikuz, T.; Fukuda, Yuji; Tanaka, Momoko; Kishimoto, Maki; Ishino, Masahiko; Nishikino, Masaharu; Kando, Masaki; Kawachi, Tetsuya; Nagasono, Mitsuru*; et al.
no journal, ,
Harries, J.; Nagasono, Mitsuru*; Iwayama, Hiroshi*; Togashi, Tadashi*; Tono, Kensuke*; Yabashi, Makina*; Semba, Yasunori*; Ohashi, Haruhiko*; Ishikawa, Tetsuya*; Shigemasa, Eiji*
no journal, ,
Nagasono, Mitsuru*; Harries, J.; Iwayama, Hiroshi*; Togashi, Tadashi*; Tono, Kensuke*; Yabashi, Makina*; Semba, Yasunori*; Ohashi, Haruhiko*; Tanaka, Hitoshi*; Ishikawa, Tetsuya*; et al.
no journal, ,
Pikuz, T.; Faenov, A.*; Fukuda, Yuji; Tanaka, Momoko; Ishino, Masahiko; Hasegawa, Noboru; Nishikino, Masaharu; Ohashi, Haruhiko*; Yabashi, Makina*; Tono, Kensuke*; et al.
no journal, ,
Faenov, A. Y.; Pikuz, T.*; Inogamov, N. A.*; Zhakhovski, V.*; Skobelev, I.*; Khokhlov, V.*; Anisimov, S. I.*; Fortov, V. E.*; Fukuda, Yuji; Kato, Yoshiaki*; et al.
no journal, ,
Inogamov, N. A.*; Faenov, A. Y.; Pikuz, T.*; Zhakhovski, V.*; Skobelev, I.*; Khokhlov, V.*; Anisimov, S. I.*; Fortov, V. E.*; Fukuda, Yuji; Kato, Yoshiaki*; et al.
no journal, ,
Nagasono, Mitsuru*; Harries, J.; Iwayama, Hiroshi*; Togashi, Tadashi*; Tono, Kensuke*; Yabashi, Makina*; Semba, Yasunori*; Ohashi, Haruhiko*; Ishikawa, Tetsuya*; Shigemasa, Eiji*
no journal, ,
Harries, J.; Nagasono, Mitsuru*; Iwayama, Hiroshi*; Togashi, Tadashi*; Tono, Kensuke*; Yabashi, Makina*; Semba, Yasunori*; Ohashi, Haruhiko*; Ishikawa, Tetsuya*; Shigemasa, Eiji*
no journal, ,
