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Journal Articles

Stress corrosion cracking of copper in swollen bentonite simulating nuclear waste disposal environment

Fujimoto, Shinji*; Tsuchiya, Hiroaki*; Ogawa, Soma*; Iida, Yoshihisa; Taniguchi, Naoki

Materials and Corrosion, 72(1-2), p.333 - 338, 2021/01

 Times Cited Count:2 Percentile:13.49(Materials Science, Multidisciplinary)

The stress corrosion cracking (SCC) of pure copper in bentonite was examined by a slow strain rate test (SSRT). The bentonite was swollen with pure water or aqueous solutions containing NH$$_{3}$$ of 0.05 M and 0.1 M. The thick corrosion films and particulate deposits were formed on copper surface after SSRT. Typical tarnish rupture type SCC occurred on pure copper in swollen bentonite with and without NH$$_{3}$$. Crack propagation rate was enhanced by NH$$_{3}$$. It is confirmed thick oxide layer is formed on copper during plastic deformation which resulting in the tarnish crack type SCC. The many particulate deposits observed on the surface might be formed as a results of rapid dissolution of Cu$$^{2+}$$ to form porous CuO at locallized deformed sites.

Journal Articles

Applicability of redundant pairs of SOI transistors for analog circuits and their applications to phase-locked loop circuits

Makihara, Akiko*; Yokose, Tamotsu*; Tsuchiya, Yoshihisa*; Miyazaki, Yoshio*; Abe, Hiroshi; Shindo, Hiroyuki*; Ebihara, Tsukasa*; Maru, Akifumi*; Morikawa, Koichi*; Kuboyama, Satoshi*; et al.

IEEE Transactions on Nuclear Science, 60(1), p.230 - 235, 2013/02

 Times Cited Count:6 Percentile:44.51(Engineering, Electrical & Electronic)

no abstracts in English

Journal Articles

Applicability of redundant pairs of SOI transistors for analog circuits

Makihara, Akiko*; Yokose, Tamotsu*; Tsuchiya, Yoshihisa*; Tani, Koichi*; Morimura, Tadaaki*; Abe, Hiroshi; Shindo, Hiroyuki*; Ebihara, Tsukasa*; Maru, Akifumi*; Morikawa, Koichi*; et al.

Proceedings of 10th International Workshop on Radiation Effects on Semiconductor Devices for Space Applications (RASEDA-10) (Internet), p.119 - 122, 2012/12

no abstracts in English

Journal Articles

Optimization for SEU/SET immunity on 0.15 $$mu$$m fully depleted CMOS/SOI digital logic devices

Makihara, Akiko*; Asai, Hiroaki*; Tsuchiya, Yoshihisa*; Amano, Yukio*; Midorikawa, Masahiko*; Shindo, Hiroyuki*; Kuboyama, Satoshi*; Onoda, Shinobu; Hirao, Toshio; Nakajima, Yasuhito*; et al.

Proceedings of 7th International Workshop on Radiation Effects on Semiconductor Devices for Space Application (RASEDA-7), p.95 - 98, 2006/10

no abstracts in English

Oral presentation

Optimization for SEU/SET immunity on 0.15$$mu$$m fully depleted CMOS/SOI digital logic devices

Makihara, Akiko*; Asai, Hiroaki*; Tsuchiya, Yoshihisa*; Amano, Yukio*; Midorikawa, Masahiko*; Shindo, Hiroyuki*; Kuboyama, Satoshi*; Onoda, Shinobu; Hirao, Toshio; Nakajima, Yasuhito*; et al.

no journal, , 

no abstracts in English

Oral presentation

Two types of energetic radiation associeted with thunderstorm activity observed in Japan

Torii, Tatsuo; Sugita, Takeshi*; Tsuchiya, Harufumi*; Tanabe, Sachiko*; Kimura, Yoshihisa*; Kamogawa, Masashi*; Yajima, Kazuaki*; Yasuda, Hiroshi*

no journal, , 

The dose rate of the $$gamma$$-rays increases in association with the activities of the thunderstorm. They were observed on the ground in the winter season of Japan. As an observed result, the following two types of the radiation enhancements have been found during the winter thunderstorm activities; the gradual variation of photon intensity with energy of a few MeV, and the burst type of the radiation that is attributed to the injection of high energy photons with the energy over 10 MeV. Furthermore, fluctuations of energetic radiation that were seemed to be caused by a summer thunderstorm activity were observed at the top of Mt. Fuji. The largest of such fluctuations was gradual and lasted for about 20 minutes, and was found to be high-energy $$gamma$$ rays having a continuous energy spectrum up to 10 MeV or more.

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