JOPSS - Search Results

Journal Articles

Measurement of local temperature around the impact points of fast ions under grazing incidence

Kokabu, Hiroki*; Yoon, S.*; Lee, H.*; Nakajima, Kaoru*; Matsuda, Makoto; Sataka, Masao*; Tsujimoto, Masahiko*; Toulemonde, M.*; Kimura, Kenji*

Nuclear Instruments and Methods in Physics Research B, 460, p.34 - 37, 2019/12

https://doi.org/10.1016/j.nimb.2019.01.006

Times Cited Count：0 Percentile：0.00(Instruments & Instrumentation)

Journal Articles

Temperature of thermal spikes induced by swift heavy ions

Matsuzaki, Shota*; Hayashi, Hiroaki*; Nakajima, Kaoru*; Matsuda, Makoto; Sataka, Masao*; Tsujimoto, Masahiko*; Toulemonde, M.*; Kimura, Kenji*

Nuclear Instruments and Methods in Physics Research B, 406(Part B), p.456 - 459, 2017/09

https://doi.org/10.1016/j.nimb.2016.12.019

Times Cited Count：5 Percentile：37.92(Instruments & Instrumentation)

Journal Articles

Tracing temperature in a nanometer size region in a picosecond time period

Nakajima, Kaoru*; Kitayama, Takumi*; Hayashi, Hiroaki*; Matsuda, Makoto; Sataka, Masao*; Tsujimoto, Masahiko*; Toulemonde, M.*; Bouffard, S.*; Kimura, Kenji*

Scientific Reports (Internet), 5, p.13363_1 - 13363_8, 2015/08

https://doi.org/10.1038/srep13363

Times Cited Count：5 Percentile：39.75(Multidisciplinary Sciences)

Journal Articles

Temperature of thermal spikes in amorphous silicon nitride films produced by 1.11 MeV C $_{60}^{3+}$ impacts

Kitayama, Takumi*; Nakajima, Kaoru*; Suzuki, Motofumi*; Narumi, Kazumasa; Saito, Yuichi; Matsuda, Makoto; Sataka, Masao*; Tsujimoto, Masahiko*; Isoda, Shoji*; Kimura, Kenji*

Nuclear Instruments and Methods in Physics Research B, 354, p.183 - 186, 2015/07

https://doi.org/10.1016/j.nimb.2014.11.002

Times Cited Count：2 Percentile：15.47(Instruments & Instrumentation)

Journal Articles

Sputtering of SiN films by 540 keV C $_{60}$ $^{2+}$ ions observed using high-resolution Rutherford backscattering spectroscopy

Nakajima, Kaoru*; Morita, Yosuke*; Kitayama, Takumi*; Suzuki, Motofumi*; Narumi, Kazumasa; Saito, Yuichi; Tsujimoto, Masahiko*; Isoda, Shoji*; Fujii, Yoshikazu*; Kimura, Kenji*

Nuclear Instruments and Methods in Physics Research B, 332, p.117 - 121, 2014/08

https://doi.org/10.1016/j.nimb.2014.02.042

Times Cited Count：7 Percentile：44.51(Instruments & Instrumentation)

Journal Articles

Surface effect on ion track formation in amorphous Si $_{3}$ N $_{4}$ films

Morita, Yosuke*; Nakajima, Kaoru*; Suzuki, Motofumi*; Narumi, Kazumasa; Saito, Yuichi; Ishikawa, Norito; Hojo, Kiichi; Tsujimoto, Masahiko*; Isoda, Shoji*; Kimura, Kenji*

Nuclear Instruments and Methods in Physics Research B, 315, p.142 - 145, 2013/11

https://doi.org/10.1016/j.nimb.2013.03.043

Times Cited Count：13 Percentile：65.98(Instruments & Instrumentation)

Journal Articles

Direct observation of fine structure in ion tracks in amorphous Si $_{3}$ N $_{4}$ by TEM

Nakajima, Kaoru*; Morita, Yosuke*; Suzuki, Motofumi*; Narumi, Kazumasa; Saito, Yuichi; Ishikawa, Norito; Hojo, Kiichi; Tsujimoto, Masahiko*; Isoda, Shoji*; Kimura, Kenji*

Nuclear Instruments and Methods in Physics Research B, 291, p.12 - 16, 2012/11

https://doi.org/10.1016/j.nimb.2012.09.007

Times Cited Count：15 Percentile：70.22(Instruments & Instrumentation)

Thin films of amorphous Si $_{3}$ N $_{4}$ (thickness 20 nm) were irradiated with 120-720 keV C $_{60}$ $^{+,2+}$ ions and observed using transmission electron microscopy (TEM). The ion track produced in an amorphous material was directly observed by TEM. For quantitative analysis, the ion tracks were also observed using high-angle annular dark field scanning transmission electron microscopy (HAADF-STEM). The observed ion track consists of a low density core (radius 2.5 nm) and a high density shell (width 2.5 nm), which is very similar to the ion tracks in amorphous SiO $_{2}$ irradiated with high energy heavy ions observed by small angle X-ray scattering (SAXS). Although the observed ion tracks may be affected by surface effects, the present result indicates that TEM and HAADF-STEM have potential to observe directly the fine structures of ion tracks in amorphous materials.

Oral presentation

Direct observation of fine structure in ion tracks in amorphous thin films by TEM

Morita, Yosuke*; Nakajima, Kaoru*; Suzuki, Motofumi*; Kimura, Kenji*; Narumi, Kazumasa; Saito, Yuichi; Ishikawa, Norito; Hojo, Kiichi; Tsujimoto, Masahiko*; Isoda, Shoji*

no journal, ,

no abstracts in English

Oral presentation

TEM observation of ion tracks in amorphous Si $_{3}$ N $_{4}$ produced by irradiation with several 100's keV C $_{60}$ ions

Morita, Yosuke*; Nakajima, Kaoru*; Suzuki, Motofumi*; Kimura, Kenji*; Narumi, Kazumasa; Saito, Yuichi; Tsujimoto, Masahiko*; Isoda, Shoji*

no journal, ,

no abstracts in English

Oral presentation

HAADF-STEM observation of ion tracks in amorphous Si $_{3}$ N $_{4}$ thin films

Morita, Yosuke*; Nakajima, Kaoru*; Suzuki, Motofumi*; Kimura, Kenji*; Narumi, Kazumasa; Saito, Yuichi; Tsujimoto, Masahiko*; Isoda, Shoji*

no journal, ,

no abstracts in English

Oral presentation

Direct observation of ion tracks in amorphous insulator thin films with transmission electron microscopy

Nakajima, Kaoru*; Morita, Yosuke*; Kitayama, Takumi*; Suzuki, Motofumi*; Kimura, Kenji*; Narumi, Kazumasa; Saito, Yuichi; Ishikawa, Norito; Hojo, Kiichi; Tsujimoto, Masahiko*; et al.

no journal, ,

no abstracts in English

Oral presentation

Sputtering of amorphous SiN induced by 540 keV C $_{60}$ $^{2+}$ irradiation

Kitayama, Takumi*; Morita, Yosuke*; Nakajima, Kaoru*; Suzuki, Motofumi*; Narumi, Kazumasa; Saito, Yuichi; Matsuda, Makoto; Sataka, Masao*; Tsujimoto, Masahiko*; Isoda, Shoji*; et al.

no journal, ,

Oral presentation

Measurement of local temperature around the impact points of fast ions

Hayashi, Hiroaki*; Kitayama, Takumi*; Morita, Yosuke*; Nakajima, Kaoru*; Narumi, Kazumasa; Saito, Yuichi; Matsuda, Makoto; Sataka, Masao*; Tsujimoto, Masahiko*; Isoda, Shoji*; et al.

no journal, ,

no abstracts in English

Oral presentation

Sputtering of amorphous SiN induced by 540 keV C $_{60}$ $^{2+}$ irradiation

Kitayama, Takumi*; Morita, Yosuke*; Nakajima, Kaoru*; Suzuki, Motofumi*; Kimura, Kenji*; Narumi, Kazumasa; Saito, Yuichi; Matsuda, Makoto; Sataka, Masao*; Tsujimoto, Masahiko*; et al.

no journal, ,

no abstracts in English

Oral presentation

Thickness dependence of length of ion tracks induced in amorphous SiN membranes by bombardment of C $_{60}$ ions

Nakajima, Kaoru*; Morita, Yosuke*; Kitayama, Takumi*; Suzuki, Motofumi*; Kimura, Kenji*; Narumi, Kazumasa; Saito, Yuichi; Tsujimoto, Masahiko*; Isoda, Shoji*

no journal, ,

no abstracts in English

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Measurement of local temperature around the impact points of fast ions under grazing incidence

Temperature of thermal spikes induced by swift heavy ions

Tracing temperature in a nanometer size region in a picosecond time period

Temperature of thermal spikes in amorphous silicon nitride films produced by 1.11 MeV C $_{60}^{3+}$ impacts

Sputtering of SiN films by 540 keV C $_{60}$ $^{2+}$ ions observed using high-resolution Rutherford backscattering spectroscopy

Surface effect on ion track formation in amorphous Si $_{3}$ N $_{4}$ films

Direct observation of fine structure in ion tracks in amorphous Si $_{3}$ N $_{4}$ by TEM

Direct observation of fine structure in ion tracks in amorphous thin films by TEM

TEM observation of ion tracks in amorphous Si $_{3}$ N $_{4}$ produced by irradiation with several 100's keV C $_{60}$ ions

HAADF-STEM observation of ion tracks in amorphous Si $_{3}$ N $_{4}$ thin films

Direct observation of ion tracks in amorphous insulator thin films with transmission electron microscopy

Sputtering of amorphous SiN induced by 540 keV C $_{60}$ $^{2+}$ irradiation

Measurement of local temperature around the impact points of fast ions

Sputtering of amorphous SiN induced by 540 keV C $_{60}$ $^{2+}$ irradiation

Thickness dependence of length of ion tracks induced in amorphous SiN membranes by bombardment of C $_{60}$ ions