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Kataoka, Ryuho*; Nishiyama, Takanori*; Tanaka, Yoshimasa*; Kadokura, Akira*; Uchida, Herbert Akihito*; Ebihara, Yusuke*; Ejiri, Mitsumu*; Tomikawa, Yoshihiro*; Tsutsumi, Masaki*; Sato, Kaoru*; et al.
Earth, Planets and Space (Internet), 71(1), p.9_1 - 9_10, 2019/12
Times Cited Count:7 Percentile:40.92(Geosciences, Multidisciplinary)Transient ionization of the mesosphere was detected at around 65 km altitude during the isolated auroral expansion occurred at 2221-2226 UT on June 30, 2017. A general-purpose Monte Carlo particle transport code PHITS suggested that significant ionization is possible in the middle atmosphere due to auroral X-rays from the auroral electrons of 10 keV.
Koizumi, Atsushi*; Markevich, V. P.*; Iwamoto, Naoya; Sasaki, Sho*; Oshima, Takeshi; Kojima, Kazutoshi*; Kimoto, Tsunenobu*; Uchida, Kazuo*; Nozaki, Shinji*; Hamilton, B.*; et al.
Applied Physics Letters, 102(3), p.032104_1 - 032104_4, 2013/01
Times Cited Count:11 Percentile:44.27(Physics, Applied)Iwamoto, Naoya*; Koizumi, Atsushi*; Onoda, Shinobu; Makino, Takahiro; Oshima, Takeshi; Kojima, Kazutoshi*; Koike, Shumpei*; Uchida, Kazuo*; Nozaki, Shinji*
Materials Science Forum, 717-720, p.267 - 270, 2012/05
Times Cited Count:1 Percentile:54.91In this study, we carried out an attempt to identify the defects responsible for the degraded charge collection efficiency of the 6H-SiC pn diode irradiated with 1 MeV electrons by the alpha particle induced charge transient spectroscopy. To form defects in the SiC crystal, one of the diodes was irradiated with 1 MeV electrons at a fluence of 110 /cm. Collected charges of the diodes were measured in room temperature using 5.486 MeV alpha particles from Am source. After the electron irradiation, the collected charge of the diode at a reverse bias of 100 V decreased to 84% of its initial value. In order to investigate the relationship between degradation of collected charge and defects in detail, time-dependent collected charges of the diodes were measured in temperature ranges from 170 K to 310 K. As a result, two distinct peaks labeled X and X are found for the electron-irradiated diode, and their activation energies are estimated to be 0.30 and 0.47 eV, respectively. These two peaks are considered to correspond to the defect levels introduced by the electron irradiation. In particular, when the diodes are used in room temperature, X is more critical to the charge collection than X.
Iwamoto, Naoya; Koizumi, Atsushi*; Onoda, Shinobu; Makino, Takahiro; Oshima, Takeshi; Kojima, Kazutoshi*; Koike, Shumpei*; Uchida, Kazuo*; Nozaki, Shinji*
IEEE Transactions on Nuclear Science, 58(6), p.3328 - 3332, 2011/12
Times Cited Count:5 Percentile:38.79(Engineering, Electrical & Electronic)no abstracts in English
Iwamoto, Naoya; Onoda, Shinobu; Makino, Takahiro; Oshima, Takeshi; Kojima, Kazutoshi*; Koizumi, Atsushi*; Uchida, Kazuo*; Nozaki, Shinji*
IEEE Transactions on Nuclear Science, 58(1), p.305 - 313, 2011/02
Times Cited Count:10 Percentile:61.04(Engineering, Electrical & Electronic)no abstracts in English
Iwamoto, Naoya; Onoda, Shinobu; Makino, Takahiro; Oshima, Takeshi; Kojima, Kazutoshi*; Koizumi, Atsushi*; Uchida, Kazuo*; Nozaki, Shinji*
Proceedings of 9th International Workshop on Radiation Effects on Semiconductor Devices for Space Applications (RASEDA-9), p.222 - 225, 2010/10
Iwamoto, Naoya; Onoda, Shinobu; Oshima, Takeshi; Kojima, Kazutoshi*; Koizumi, Atsushi*; Uchida, Kazuo*; Nozaki, Shinji*
Materials Science Forum, 645-648, p.921 - 924, 2010/00
Electron irradiation effects on the charge collection efficiency (CCE) of the 6H-SiC pn diodes were investigated. The diodes were irradiated with electrons at energies from 100 keV to 1 MeV. The value of CCE of the diodes using alpha particles compared before and after the electron irradiations. In the case of 100 keV electron, no significant change in CCE was observed. On the other hand, above 200 keV, the values of CCE decreased with increasing fluence. The degradation was larger with increasing incident electron energy.
Yamauchi, Emiko*; Watanabe, Ritsuko; Oikawa, Miyoko*; Fujimoto, Hirofumi*; Yamada, Akinori*; Saito, Kimiaki; Murakami, Masahiro*; Hashido, Kazuo*; Tsuchida, Kozo*; Takada, Naoko*; et al.
Journal of Insect Biotechnology and Sericology, 77(1), p.17 - 24, 2008/02
The frequency of single strand breaks (SSBs) occurring on both strands of the pBR322 plasmid DNA region flanked by a pair of primers used for polymerase chain reaction (PCR) amplifications was determined after irradiation with Cs -rays. We refined that real time PCR is suitable for the detection and quantitative analysis of SSBs caused by -ray irradiation. The utility of this approach was also supported by the comparison of the practical experimental data with the Monte Carlo simulation. The potential application of this PCR method for the detection of genomic DNA damage was also confirmed.
Yachi, Shigeyasu; Sato, Tadashi; Suga, Shinichi*; Komuro, Yuichi; Uchida, Masaaki; Nakajima, Kunihisa; Nakamura, Jinichi; Amezawa, Hiroo; Omura, Hideaki*; Minato, Kazuo; et al.
JAERI-Review 2003-025, 162 Pages, 2003/09
The report contains example of answers to the Problems of 31st(1999) to 35th(2003) Examinations for the Chief Engineer of Nuclear Fuel which were conducted as a national qualification examination. Brief explanations or references are given to some answers.
Uchida, Masaaki; ; Arai, Yasuo; Minato, Kazuo; ; Takada, Kazuo; Ikawa, Katsuichi
JAERI-Review 94-001, 94 Pages, 1994/08
no abstracts in English
Shibata, Hiromi*; Tsuchida, Hidetsugu*; Ito, Akio*; Saito, Yuichi; Chiba, Atsuya; Narumi, Kazumasa; Arakawa, Kazuo
no journal, ,
no abstracts in English
Iwamoto, Naoya; Onoda, Shinobu; Oshima, Takeshi; Kojima, Kazutoshi*; Koizumi, Atsushi*; Uchida, Kazuo*; Nozaki, Shinji*
no journal, ,
no abstracts in English
Iwamoto, Naoya; Onoda, Shinobu; Oshima, Takeshi; Kojima, Kazutoshi*; Koizumi, Atsushi*; Uchida, Kazuo*; Nozaki, Shinji*
no journal, ,
no abstracts in English
Iwamoto, Naoya; Onoda, Shinobu; Makino, Takahiro; Oshima, Takeshi; Kojima, Kazutoshi*; Koike, Shumpei*; Koizumi, Atsushi*; Uchida, Kazuo*; Nozaki, Shinji*
no journal, ,
no abstracts in English
Koike, Shumpei*; Iwamoto, Naoya; Onoda, Shinobu; Oshima, Takeshi; Kojima, Kazutoshi*; Koizumi, Atsushi*; Ono, Hiroshi*; Uchida, Kazuo*; Nozaki, Shinji*
no journal, ,
no abstracts in English
Iwamoto, Naoya; Onoda, Shinobu; Makino, Takahiro; Oshima, Takeshi; Kojima, Kazutoshi*; Koizumi, Atsushi*; Uchida, Kazuo*; Nozaki, Shinji*
no journal, ,
no abstracts in English
Koizumi, Atsushi*; Markevich, V. P.*; Iwamoto, Naoya; Sasaki, Sho*; Koike, Shumpei*; Oshima, Takeshi; Kojima, Kazutoshi*; Kimoto, Tsunenobu*; Uchida, Kazuo*; Nozaki, Shinji*; et al.
no journal, ,
no abstracts in English
Koike, Shumpei*; Iwamoto, Naoya; Onoda, Shinobu; Oshima, Takeshi; Kojima, Kazutoshi*; Koizumi, Atsushi*; Ono, Hiroshi*; Uchida, Kazuo*; Nozaki, Shinji*
no journal, ,
no abstracts in English
Matsumoto, Hiroshi*; Suzuki, Fumiko*; Sugawara, Hirotaka*; Yoshioka, Masakazu*; Higashi, Yasuo*; Matsumoto, Noriyuki*; Hasegawa, Kazuo; Kondo, Yasuhiro; Uchida, Kazuhide*; Kurokawa, Shinichi*
no journal, ,