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Oral presentation

Characterization of precipitated phase in Cu-Ni-Si alloy by small-angle X-ray scattering, small-angle neutron scattering, and atom probe tomography, 2

Sasaki, Hirokazu*; Akiya, Shunta*; Oba, Yojiro; Onuma, Masato*; Okubo, Tadakatsu*; Uzuhashi, Jun*

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