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Abe, Shinichiro; Hashimoto, Masanori*; Liao, W.*; Kato, Takashi*; Asai, Hiroaki*; Shimbo, Kenichi*; Matsuyama, Hideya*; Sato, Tatsuhiko; Kobayashi, Kazutoshi*; Watanabe, Yukinobu*
IEEE Transactions on Nuclear Science, 70(8, Part 1), p.1652 - 1657, 2023/08
Times Cited Count：2 Percentile：65.72(Engineering, Electrical & Electronic)Single event upsets (SEUs) caused by neutrons is a reliability problem for microelectronic devices in the terrestrial environment. Acceleration tests using white neutron beam provide realistic soft error rates (SERs), but only a few facilities can provide white neutron beam in the world. If single-source irradiation applicable to diverse neutron source can be utilized for the evaluation of the SER in the terrestrial environment, it contributes to solve the shortage of beam time. In this study, we investigated the feasibility of the SER estimation in the terrestrial environment by any one of these measured data with the SEU cross sections obtained by PHITS simulation. It was found that the SERs estimated by our proposed method are within a factor of 2.7 of that estimated by the Weibull function. We also investigated the effect of simplification which reduce the computational cost in simulation to the SER estimation.
Hashimoto, Masanori*; Kobayashi, Kazutoshi*; Furuta, Jun*; Abe, Shinichiro; Watanabe, Yukinobu*
Integration, 69, p.161 - 179, 2019/11
Times Cited Count：13 Percentile：65.38(Computer Science, Hardware & Architecture)Soft error originating from cosmic ray is a serious concern for reliability demanding applications. Device miniaturization and lower voltage operation degrade the immunity of SRAM and flip-flops, and then soft error countermeasures will be demanded in more and more products. This paper characterizes and discusses soft error rates of SRAM and flip-flops in the terrestrial environment with the results of investigation for soft error phenomena by measurements and simulations.
Nakagawa, Kazumichi*; Kaneko, Fusae*; Ota, Yoshimi*; Tanaka, Masahito*; Kitada, Tomo*; Agui, Akane; Fujii, Kentaro; Yokoya, Akinari; Watanabe, Kazutoshi*; Yamada, Toru*
Journal of Electron Spectroscopy and Related Phenomena, 144-147, p.271 - 273, 2005/06
Times Cited Count：12 Percentile：50.03(Spectroscopy)no abstracts in English
Nakashima, Hiroshi; Takada, Hiroshi; Kasugai, Yoshimi; Meigo, Shinichiro; Maekawa, Fujio; Kai, Tetsuya; Konno, Chikara; Ikeda, Yujiro; Oyama, Yukio; Watanabe, Noboru; et al.
Proceedings of 6th Meeting of the Task Force on Shielding Aspects of Accelerators, Targets and Irradiation Facilities (SATIF-6), (OECD/NEA No.3828), p.27 - 36, 2004/00
no abstracts in English
Nakashima, Hiroshi; Takada, Hiroshi; Kasugai, Yoshimi; Meigo, Shinichiro; Maekawa, Fujio; Kai, Tetsuya; Konno, Chikara; Ikeda, Yujiro; Oyama, Yukio; Watanabe, Noboru; et al.
Journal of Nuclear Science and Technology, 39(Suppl.2), p.1155 - 1160, 2002/08
no abstracts in English
Abe, Shinichiro; Hashimoto, Masanori*; Liao, W.*; Kato, Takashi*; Asai, Hiroaki*; Shimbo, Kenichi*; Matsuyama, Hideya*; Sato, Tatsuhiko; Kobayashi, Kazutoshi*; Watanabe, Yukinobu*
no journal, ,
Single event upset (SEU) induced by secondary cosmic-ray neutrons is one of the causes of non-destructive faults (the so-called soft errors) in microelectronics. We have proposed a method to estimate the terrestrial soft error rates (SERs) based on simulation coupled with one-time neutron irradiation testing which can be applied to various kinds of neutron sources. The validity of our method has been investigated for 65-nm bulk SRAMs with the measured data using various neutron sources. This result will be reviewed on the organized session of the 67th Space Sciences and Technology Conference.
