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Gomi, Yuibi*; Takami, Kazusa*; Mizuno, Rurie*; Niikura, Megumi*; Yasuda, Ryuichi*; Deng, Y.*; Kawase, Shoichiro*; Watanabe, Yukinobu*; Abe, Shinichiro; Liao, W.*; et al.
IEEE Transactions on Nuclear Science, 72(8), p.2751 - 2762, 2025/08
Times Cited Count：2 Percentile：70.03(Engineering, Electrical & Electronic)The study of muon-induced soft errors in terrestrial settings remains underexplored even though the incidence of muon-induced soft errors tends to increas. In this study, we conducted positive and negative muon irradiation experiments on four types of 12-nm FinFET SRAMs. At the momentum where the SEU cross section peaks, 2-fin cells exhibit larger SEU cross sections than 1-fin cells for negative muons. Conversely, for positive muons, the SEU cross section is larger in 1-fin cells than in 2-fin cells due to the increased diffusion capacitance in 2-fin cells. We also performed the Monte Carlo simulations. The results suggest that a single sensitive volume with the same critical charge value cannot consistently reproduce the SEU cross sections for both types of muons.
Zheng, X.-G.*; Yamauchi, Ichihiro*; Hagihara, Masato; Nishibori, Eiji*; Kawae, Tatsuya*; Watanabe, Isao*; Uchiyama, Tomoki*; Chen, Y.*; Xu, C.-N.*
Nature Communications (Internet), 15, p.9989_1 - 9989_12, 2024/11
Times Cited Count：2 Percentile：16.31(Multidisciplinary Sciences)Watanabe, Kenichi*; Sugai, Yusuke*; Hasegawa, Sota*; Tanaka, Seishiro*; Hitomi, Keitaro*; Nogami, Mitsuhiro*; Shinohara, Takenao; Su, Y. H.; Parker, J. D.*; Kockelmann, W.*
Scientific Reports (Internet), 14, p.25224_1 - 25224_13, 2024/10
Times Cited Count：1 Percentile：10.80(Multidisciplinary Sciences)Watanabe, Miku*; Miyamoto, Goro*; Zhang, Y.*; Morooka, Satoshi; Harjo, S.; Kobayashi, Yasuhiro*; Furuhara, Tadashi*
ISIJ International, 64(9), p.1464 - 1476, 2024/07
Times Cited Count：7 Percentile：53.56(Metallurgy & Metallurgical Engineering)Li, C.-Y.; Watanabe, Akira*; Uchibori, Akihiro; Okano, Yasushi
Journal of Nuclear Science and Technology, 61(7), p.935 - 957, 2024/07
Times Cited Count：4 Percentile：39.40(Nuclear Science & Technology)Kubota, Masahiko*; Kim, S.-Y.*; Wu, H.*; Watanabe, So; Sano, Yuichi; Takeuchi, Masayuki; Arai, Tsuyoshi*
Journal of Radioanalytical and Nuclear Chemistry, 333(5), p.2413 - 2420, 2024/05
Times Cited Count：4 Percentile：64.33(Chemistry, Analytical)Deng, Y.*; Watanabe, Yukinobu*; Manabe, Seiya*; Liao, W.*; Hashimoto, Masanori*; Abe, Shinichiro; Tampo, Motonobu*; Miyake, Yasuhiro*
IEEE Transactions on Nuclear Science, 71(4, Part 2), p.912 - 920, 2024/04
Times Cited Count：3 Percentile：38.41(Engineering, Electrical & Electronic)With the miniaturization of semiconductors and the decrease in operating voltage, there is a growing interest and discussion in whether the muons in cosmic rays may be the source of single event upsets (SEUs). In the case of neutron-induced SEUs, it was reported that the irradiation side has the impact on SEU cross sections. Here, to investigate the impact of irradiation direction on muon-induced SEUs, we have measured and simulate muon-induced SEUs in 65-nm bulk SRAMs with different muon irradiation directions. It was found that the peak SEU cross section for the package side irradiation is about twice large as that for the board side irradiation. We also revealed that the difference in observed SEU cross sections between the package side and the board side irradiation is caused by differences in energy straggling due to changes in penetration depth depending on the incident direction.
Osawa, Naoki*; Kim, S.-Y.*; Kubota, Masahiko*; Wu, H.*; Watanabe, So; Ito, Tatsuya; Nagaishi, Ryuji
Nuclear Engineering and Technology, 56(3), p.812 - 818, 2024/03
Times Cited Count：5 Percentile：64.33(Nuclear Science & Technology)
CoSiYamauchi, Hiroki; Sari, D. P.*; Yasui, Yukio*; Sakakura, Terutoshi*; Kimura, Hiroyuki*; Nakao, Akiko*; Ohara, Takashi; Honda, Takashi*; Kodama, Katsuaki; Igawa, Naoki; et al.
Physical Review Research (Internet), 6(1), p.013144_1 - 013144_9, 2024/02
Watanabe, Kenichi*; Sugai, Yusuke*; Hasegawa, Sota*; Hitomi, Keitaro*; Nogami, Mitsuhiro*; Shinohara, Takenao; Su, Y. H.; Parker, J. D.*; Kockelmann, W.*
Sensors and Materials, 36(1), p.149 - 154, 2024/01
Times Cited Count：2 Percentile：23.26(Instruments & Instrumentation)Yamada, Ryohei*; Tamakuma, Yuki*; Kuwata, Haruka*; Saigusa, Yumi*; Watanabe, Yuki; Hirota, Seiko*; Jin, Q.*; Cai, Y.*
Hoken Butsuri (Internet), 58(3), p.169 - 177, 2023/11
no abstracts in English
Oikawa, Kenichi; Sato, Hirotaka*; Watanabe, Kenichi*; Su, Y. H.; Shinohara, Takenao; Kai, Tetsuya; Kiyanagi, Yoshiaki*; Hasemi, Hiroyuki
Journal of Physics; Conference Series, 2605, p.012013_1 - 012013_6, 2023/10
Gomi, Yuibi*; Takami, Kazusa*; Mizuno, Rurie*; Niikura, Megumi*; Deng, Y.*; Kawase, Shoichiro*; Watanabe, Yukinobu*; Abe, Shinichiro; Liao, W.*; Tampo, Motonobu*; et al.
Proceedings of 23rd European Conference on Radiation and its Effects on Components and Systems (RADECS 2023)(Internet) , 4 Pages, 2023/09
Times Cited Count：1 Percentile：57.23(Engineering, Electrical & Electronic)It has been suggested that the effect of muon-induced soft errors will increase by shrinking of the semiconductor process. However, muon irradiation experiments for FinFETs has not been reported. We performed positive and negative muon irradiation experiments on 12-nm FinFET and 28-nm planar SRAMs at MUSE in J-PARC. The negative muon-induced single event upset (SEU) cross section is more than ten times larger than that of the positive muon. The negative muon-induced SEU cross section of FinFETs decreases by the same ratio as neutron-induced one compared to planar SRAMs.
Li, C.-Y.; Watanabe, Akira*; Uchibori, Akihiro; Okano, Yasushi
Proceedings of 30th International Conference on Nuclear Engineering (ICONE30) (Internet), 10 Pages, 2023/05
Akuzawa, Tadashi*; Kim, S.-Y.*; Kubota, Masahiko*; Wu, H.*; Watanabe, So; Sano, Yuichi; Takeuchi, Masayuki; Arai, Tsuyoshi*
Journal of Radioanalytical and Nuclear Chemistry, 331(12), p.5851 - 5858, 2022/12
Times Cited Count：7 Percentile：60.30(Chemistry, Analytical)Otosaka, Shigeyoshi*; Jeon, H.*; Hou, Y.*; Watanabe, Takahiro; Aze, Takahiro*; Miyairi, Yosuke*; Yokoyama, Yusuke*; Ogawa, Hiroshi*
Nuclear Instruments and Methods in Physics Research B, 527, p.1 - 6, 2022/09
Times Cited Count：0 Percentile：0.00(Instruments & Instrumentation)The measurement the radiocarbon of dissolved organic matter (DO
C) in seawater can provide information about a timescale of the dynamics of dissolved organic matter as well as about its sources in the ocean. Due to the low DOC concentration in seawater, in spite of the development of accelerator mass spectrometry, a relatively large volume of seawater (
1 L) is required for that analysis. In addition, complicated processing such as UV irradiation that emits high heat is required. In this study, we have developed a safer and easier method to analyze DOC in seawater than the conventional method. A particularly significant change was the adoption of a low-pressure mercury lamp in the decomposition system, which enabled direct decomposition of organic matter at lower temperatures. We also propose a method to quantitatively evaluate the accuracy of this system by analyzing simulated seawater consists of a soluble reference material of organic matter and sodium chloride. This method is expected to be applied not only to carbon isotope ratio analysis but also to analysis of trace elements and isotopes of various dissolved organic substances.
Nguyen, T. H.*; Le Ba, T.*; Tran, C. T.*; Nguyen, T. T.*; Doan, T. T. T.*; Do, V.-K.; Watanabe, Masayuki; Pham, Q. M.*; Hoang, S. T.*; Nguyen, D. V.*; et al.
Hydrometallurgy, 213, p.105933_1 - 105933_11, 2022/08
Times Cited Count：31 Percentile：86.51(Metallurgy & Metallurgical Engineering)A continuous counter-current extraction for the selective recovery of thorium (Th) and uranium (U) from the Yen Phu (Vietnam) rare earth concentrate leach solutions was systematically studied. The primary amine N1923 was used as an extractant which was prepared in the isoparaffin IP-2028 diluent. Thorium and uranium were selectively recovered in a hydrometallurgical circuit established by continuous mixer-settler extraction, scrubbing, and back-extraction at the laboratory scale. The desired purity of Th and U can be achieved by managing the volume ratio of organic to aqueous phase (O/A ratio) in the corresponding steps. Highly pure Th and U were recovered from the pregnant back-extraction liquor and the raffinate, respectively, which have satisfactory properties for further processing of the subsequent nuclear materials.
Li, C.-Y.; Watanabe, Akira*; Uchibori, Akihiro; Okano, Yasushi
Dai-26-Kai Doryoku, Enerugi Gijutsu Shimpojiumu Koen Rombunshu (Internet), 4 Pages, 2022/07
Identifying accident scenarios that could lead to severe accidents and evaluating their frequency of occurrence are essential issues. This study aims to establish the methodology of the dynamic Probabilistic Risk Assessment (PRA) for sodium-cooled fast reactors that can consider the time dependency and the interdependence of each event. Specifically, the Continuous Markov chain Monte Carlo (CMMC) method is newly applied to the SPECTRA code, which analyzes the severe accident conditions of nuclear reactors, to develop an evaluation methodology for typical external hazards. Currently, a fault-tree model of air coolers of decay heat removal system is implemented as the CMMC method, and a series of preliminary analysis of the plant's transient characteristics under the scenario of volcanic ashfall has been conducted.
Sasada, Seiji*; Takahashi, Yoshihito*; Takeuchi, Keisuke*; Hiroi, Kosuke; Su, Y. H.; Shinohara, Takenao; Watanabe, Kenichi*; Uritani, Akira*
Japanese Journal of Applied Physics, 61(4), p.046004_1 - 046004_8, 2022/03
Times Cited Count：2 Percentile：10.14(Physics, Applied)Lu, K.; Katsuyama, Jinya; Masaki, Koichi; Watanabe, Tadashi*; Li, Y.
Journal of Pressure Vessel Technology, 143(3), p.031704_1 - 031704_8, 2021/06
Times Cited Count：3 Percentile：14.19(Engineering, Mechanical)