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Zn
Mo
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Bao, S.*; Liao, J.*; Huang, Z.*; Shangguan, Y.*; Ma, Z.*; Zhang, B.*; Cheng, S.*; Xu, H.*; Song, Z.*; Dong, S.*; et al.
Physical Review Letters, 136(9), p.096502_1 - 096502_8, 2026/03
Times Cited Count:1 Percentile:0.00(Physics, Multidisciplinary)Yao, X.*; Chen, P.*; Verma, R.*; Zhao, X.*; Yang, H.-Y.*; DeBeer-Schmitt, L.*; Aczel, A. A.*; Wu, C.-M.*; Alba-Venero, D.*; Ohara, Takashi; et al.
Physical Review Letters, 136(8), p.086702_1 - 086702_6, 2026/02
Times Cited Count:1 Percentile:86.56(Physics, Multidisciplinary)Zhu, L.*; Dong, W.*; Naeem, M.*; Kong, H.*; Hu, C.*; Fan, Z.*; Gong, W.; Harjo, S.; Lan, S.*; Wu, Y.*; et al.
Acta Materialia, 303, p.121734_1 - 121734_10, 2026/01
Times Cited Count:3 Percentile:35.08(Materials Science, Multidisciplinary)Qin, T. Y.*; Hu, F. F.*; Xu, P. G.; Zhang, R.*; Su, Y. H.; Ao, N.*; Li, Z. W.*; Shinohara, Takenao; Shobu, Takahisa; Wu, S. C.*
International Journal of Fatigue, 202, p.109233_1 - 109233_16, 2026/01
Times Cited Count:3 Percentile:72.67(Engineering, Mechanical)Hu, F. F.*; Qin, T. Y.*; Su, Y. H.; He, L. H.*; Ao, N.*; Parker, J. D.*; Shinohara, Takenao; Wu, S. C.*
International Journal of Fatigue, 193, p.108826_1 - 108826_14, 2025/04
Times Cited Count:5 Percentile:85.73(Engineering, Mechanical)Hu, F.-F.*; Qin, T.-Y.*; Ao, N.*; Xu, P. G.; Su, Y. H.; Parker, J. D.*; Shinohara, Takenao; Shobu, Takahisa; Kang, G.-Z.*; Ren, M.-M.; et al.
Journal of Traffic and Transportation Engineering, 25(2), p.75 - 93, 2025/04
Naeem, M.*; Ma, Y.*; Tian, J.*; Kong, H.*; Romero-Resendiz, L.*; Fan, Z.*; Jiang, F.*; Gong, W.; Harjo, S.; Wu, Z.*; et al.
Materials Science & Engineering A, 924, p.147819_1 - 147819_10, 2025/02
Times Cited Count:7 Percentile:87.47(Nanoscience & Nanotechnology)Ying, H.*; Yang, X.*; He, H.*; Yan, A.*; An, K.*; Ke, Y.*; Wu, Z.*; Tang, S.*; Zhang, Z.*; Dong, H.*; et al.
Scripta Materialia, 250, p.116181_1 - 116181_7, 2024/09
Times Cited Count:13 Percentile:82.00(Nanoscience & Nanotechnology)Hu, F. F.*; Qin, T. Y.*; Ao, N.*; Su, Y. H.; Zhou, L.*; Xu, P. G.; Parker, J. D.*; Shinohara, Takenao; Chen, J.*; Wu, S. C.*
Engineering Fracture Mechanics, 306, p.110267_1 - 110267_18, 2024/08
Times Cited Count:5 Percentile:49.71(Mechanics)Qin, T. Y.*; Hu, F. F.*; Xu, P. G.; Zhang, H.*; Zhou, L.*; Ao, N.*; Su, Y. H.; Shobu, Takahisa; Wu, S. C.*
International Journal of Fatigue, 185, p.108336_1 - 108336_13, 2024/08
Times Cited Count:15 Percentile:88.15(Engineering, Mechanical)Zhou, L.*; Zhang, H.*; Qin, T. Y.*; Hu, F. F.*; Xu, P. G.; Ao, N.*; Su, Y. H.; He, L. H.*; Li, X. H.*; Zhang, J. R.*; et al.
Metallurgical and Materials Transactions A, 55(7), p.2175 - 2185, 2024/07
Times Cited Count:4 Percentile:43.11(Materials Science, Multidisciplinary)Kubota, Masahiko*; Kim, S.-Y.*; Wu, H.*; Watanabe, So; Sano, Yuichi; Takeuchi, Masayuki; Arai, Tsuyoshi*
Journal of Radioanalytical and Nuclear Chemistry, 333(5), p.2413 - 2420, 2024/05
Times Cited Count:2 Percentile:42.67(Chemistry, Analytical)Baccou, J.*; Glantz, T.*; Ghione, A.*; Sargentini, L.*; Fillion, P.*; Damblin, G.*; Sueur, R.*; Iooss, B.*; Fang, J.*; Liu, J.*; et al.
Nuclear Engineering and Design, 421, p.113035_1 - 113035_16, 2024/05
Times Cited Count:10 Percentile:93.07(Nuclear Science & Technology)
complex exhibiting intermolecular proton shifting coupled spin transitionJi, T.*; Su, S.*; Wu, S.*; Hori, Yuta*; Shigeta, Yasuteru*; Huang, Y.*; Zheng, W.*; Xu, W.*; Zhang, X.*; Kiyanagi, Ryoji; et al.
Angewandte Chemie; International Edition, 63(25), p.e202404843_1 - e202404843_6, 2024/04
Times Cited Count:4 Percentile:30.21(Chemistry, Multidisciplinary)Osawa, Naoki*; Kim, S.-Y.*; Kubota, Masahiko*; Wu, H.*; Watanabe, So; Ito, Tatsuya; Nagaishi, Ryuji
Nuclear Engineering and Technology, 56(3), p.812 - 818, 2024/03
Times Cited Count:4 Percentile:68.72(Nuclear Science & Technology)
neutron diffractionZhou, Y.*; Song, W.*; Zhang, F.*; Wu, Y.*; Lei, Z.*; Jiao, M.*; Zhang, X.*; Dong, J.*; Zhang, Y.*; Yang, M.*; et al.
Journal of Alloys and Compounds, 971, p.172635_1 - 172635_7, 2024/01
Times Cited Count:6 Percentile:27.77(Chemistry, Physical)Yang, D. S.*; Wu, Y.*; Kanatzidis, E. E.*; Avila, R.*; Zhou, M.*; Bai, Y.*; Chen, S.*; Sekine, Yurina; Kim, J.*; Deng, Y.*; et al.
Materials Horizons, 10(11), p.4992 - 5003, 2023/09
Times Cited Count:29 Percentile:85.18(Chemistry, Multidisciplinary)This paper presents a set of findings that enhances the performance of these systems through the use of microfluidic networks, integrated valves and microscale optical cuvettes formed by three-dimensional printing in hard/soft hybrid materials systems, for accurate spectroscopic and fluorometric assays. Field studies demonstrate the capability of these microcuvette systems to evaluate the concentrations of copper, chloride, and glucose in sweat, along with the sweat pH, with laboratory grade accuracy and sensitivity.
SnSe
Ren, Q.*; Gupta, M. K.*; Jin, M.*; Ding, J.*; Wu, J.*; Chen, Z.*; Lin, S.*; Fabelo, O.*; Rodriguez-Velamazan, J. A.*; Kofu, Maiko; et al.
Nature Materials, 22(8), p.999 - 1006, 2023/08
Times Cited Count:128 Percentile:99.29(Chemistry, Physical)
Sn
S
-based shandite filmsLau, Y.-C.*; Ikeda, Junya*; Fujiwara, Kohei*; Ozawa, Akihiro*; Zheng, J.*; Seki, Takeshi*; Nomura, Kentaro*; Du, L.*; Wu, Q.*; Tsukazaki, Atsushi*; et al.
Physical Review B, 108(6), p.064429_1 - 064429_11, 2023/08
Times Cited Count:14 Percentile:75.14(Materials Science, Multidisciplinary)
; Bandgap narrowing, metallization, and remarkable enhancement of photoelectric activityFang, Y.*; Kong, L.*; Wang, R.*; Zhang, Z.*; Li, Z.*; Wu, Y.*; Bu, K.*; Liu, X.*; Yan, S.*; Hattori, Takanori; et al.
Materials Today Physics (Internet), 34, p.101083_1 - 101083_7, 2023/05
Times Cited Count:11 Percentile:64.36(Materials Science, Multidisciplinary)The layered van der Waals halides are particularly sensitive to external pressure, suggesting a feasible route to pinpoint their structure with extraordinary behavior. However, a very sensitive pressure response usually lead to a detrimental phase transition and/or lattice distortion, making the approach of materials manipulation in a continuous manner remain challenging. Here, the extremely weak interlayer coupling and high tunability of layered RhI
crystals are observed. A pressure-driven phase transition occurs at a moderate pressure of 5 GPa, interlinking to a change of layer stack mode. Strikingly, such a phase transition does not affect the tendency of quasi-linear bandgap narrowing, and a metallization with an ultra-broad tunability of 1.3 eV redshift is observed at higher pressures. Moreover, the carrier concentration increases by 4 orders of magnitude at 30 GPa, and the photocurrent enhances by 5 orders of magnitude at 7.8 GPa. These findings create new opportunities for exploring, tuning, and understanding the van der Waals halides by harnessing their unusual feature of a layered structure, which is promising for future devices based on materials-by-design that are atomically thin.