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Nakajima, Kyo*; Teramoto, Takahiro*; Akagi, Hiroshi; Fujikawa, Takashi*; Majima, Takuya*; Minemoto, Shinichiro*; Ogawa, Kanade*; Sakai, Hirofumi*; Togashi, Tadashi*; Tono, Kensuke*; et al.
Scientific Reports (Internet), 5, p.14065_1 - 14065_11, 2015/09
Times Cited Count：38 Percentile：82.65(Multidisciplinary Sciences)We report on the measurement of deep inner-shell 2p X-ray photoelectron diffraction (XPD) patterns from laser-aligned I
molecules using X-ray free-electron laser (XFEL) pulses. The XPD patterns of the I molecules, aligned parallel to the polarization vector of the XFEL, were well matched with our theoretical calculations. Further, we propose a criterion for applying our molecular-structure-determination methodology to the experimental XPD data. In turn, we have demonstrated that this approach is a significant step toward the time-resolved imaging of molecular structures.
Iwasaki, Atsushi*; Sato, Takahiro*; Owada, Shigeki*; Togashi, Tadashi*; Takahashi, Eiji*; Midorikawa, Katsumi*; Aoyama, Makoto; Yamakawa, Koichi; Kannari, Fumihiko*; Yagishita, Akira*; et al.
Reza Kenkyu, 40(9), p.687 - 690, 2012/09
no abstracts in English
Wada, Ken*; Hyodo, Toshio*; Yagishita, Akira*; Ikeda, Mitsuo*; Osawa, Satoshi*; Shidara, Tetsuo*; Michishio, Koji*; Tachibana, Takayuki*; Nagashima, Yasuyuki*; Fukaya, Yuki; et al.
European Physical Journal D, 66(2), p.37 - 40, 2012/02
Times Cited Count：39 Percentile：84.90(Optics)no abstracts in English
Sato, Takahiro*; Iwasaki, Atsushi*; Ishibashi, Kazuki*; Okino, Tomoya*; Yamanouchi, Kaoru*; Adachi, Junichi*; Yagishita, Akira*; Yazawa, Hiroki*; Kannari, Fumihiko*; Aoyama, Makoto; et al.
Europhysics News, 42(5), P. 10, 2011/09
The resonant and non-resonant two-photon single ionization processes of He were investigated using intense free electron laser light in the extreme ultraviolet (XUV) region (53.4-61.4 nm) covering the 1s-2p and 1s-3p resonant transitions of He. On the basis of the dependences of the yield of He
on the XUV light-field intensity at 53.4, 58.4, 56.0 and 61.4 nm, the absolute values of the two-photon ionization cross sections of He at the four different wavelengths and their dependence on the light-field intensity were determined for the first time.
Sato, Takahiro*; Iwasaki, Atsushi*; Ishibashi, Kazuki*; Okino, Tomoya*; Yamanouchi, Kaoru*; Adachi, Junichi*; Yagishita, Akira*; Yazawa, Hiroki*; Kannari, Fumihiko*; Aoyama, Makoto; et al.
Journal of Physics B; Atomic, Molecular and Optical Physics, 44(16), p.161001_1 - 161001_5, 2011/08
Times Cited Count：39 Percentile：83.77(Optics)The resonant and non-resonant two-photon single ionization processes of He were investigated using intense free electron laser light in the extreme ultraviolet (XUV) region (53.4-61.4 nm) covering the 1s-2p and 1s-3p resonant transitions of He. On the basis of the dependences of the yield of He on the XUV light-field intensity at 53.4, 58.4, 56.0 and 61.4 nm, the absolute values of the two-photon ionization cross sections of He at the four different wavelengths and their dependence on the light-field intensity were determined for the first time.
Togashi, Tadashi*; Takahashi, Eiji*; Midorikawa, Katsumi*; Aoyama, Makoto; Yamakawa, Koichi; Sato, Takahiro*; Iwasaki, Atsushi*; Owada, Shigeki*; Okino, Tomoya*; Yamanouchi, Kaoru*; et al.
Optics Express (Internet), 19(1), p.317 - 324, 2011/01
Times Cited Count：97 Percentile：96.22(Optics)The 13th harmonic of a Ti:sapphire (Ti:S) laser in the plateau region was injected as a seeding source to a 250-MeV free-electron-laser (FEL) amplifier. When the amplification conditions were fulfilled, strong enhancement of the radiation intensity by a factor of 650 was observed. The random and uncontrollable spikes, which appeared in the spectra of the Self-Amplified Spontaneous Emission (SASE) based FEL radiation without the seeding source, were found to be suppressed drastically to form to a narrow-band, single peak profile at 61.2 nm. The properties of the seeded FEL radiation were well reproduced by numerical simulations. We discuss the future precept of the seeded FEL scheme to the shorter wavelength region.
Wada, Ken*; Hyodo, Toshio*; Yagishita, Akira*; Ikeda, Mitsuo*; Osawa, Satoshi*; Shidara, Tetsuo*; Michishio, Koji*; Suzuki, Ryohei*; Tachibana, Takayuki*; Nagashima, Yasuyuki*; et al.
no journal, ,
no abstracts in English
Wada, Ken*; Hyodo, Toshio*; Kosuge, Takashi*; Saito, Yuki*; Yagishita, Akira*; Ikeda, Mitsuo*; Osawa, Satoshi*; Suwada, Tsuyoshi*; Furukawa, Kazuro*; Shirakawa, Akihiro*; et al.
no journal, ,
no abstracts in English
