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Tominaga, Taiki*; Sahara, Masae*; Kawakita, Yukinobu; Nakagawa, Hiroshi; Yamada, Takeshi*
Journal of Applied Crystallography, 54(6), p.1631 - 1640, 2021/12
Times Cited Count：4 Percentile：55.82(Chemistry, Multidisciplinary)Nogami, Satoshi*; Kadota, Kazunori*; Uchiyama, Hiromasa*; Arima-Osonoi, Hiroshi*; Iwase, Hiroki*; Tominaga, Taiki*; Yamada, Takeshi*; Takata, Shinichi; Shibayama, Mitsuhiro*; Tozuka, Yuichi*
International Journal of Biological Macromolecules, 190, p.989 - 998, 2021/11
Times Cited Count：6 Percentile：39.73(Biochemistry & Molecular Biology)Matsuura, Masato*; Yamada, Takeshi*; Tominaga, Taiki*; Kobayashi, Makoto*; Nakagawa, Hiroshi; Kawakita, Yukinobu
JPS Conference Proceedings (Internet), 33, p.011068_1 - 011068_6, 2021/03
The position dependence of the scattered intensity in the time-of-flight backscattering spectrometer DNA was investigated. A periodic structure for both vertical (pixel) and horizontal (PSD) directions was observed. The solar slit and over-bending of an analyzer crystal is discussed as a possible origin of the modulation in the intensity. We have developed software program for the systematic correction of the position-dependent intensity and offset energy for the elastic peak. This corrects the deviation from the true scattering intensity and improve the quality of the data, which includes the energy resolution.
Tominaga, Taiki*; Kobayashi, Makoto*; Yamada, Takeshi*; Matsuura, Masato*; Kawakita, Yukinobu; Kasai, Satoshi*
JPS Conference Proceedings (Internet), 33, p.011095_1 - 011095_5, 2021/03
A vertical movement type of sample changer for the neutron spectrometer BL02, J-PARC MLF was developed for our top-loading type cryostat. The sample changer, termed as "PEACE", can control reproducibility of the irradiated position using guides made of polyether ether ketone. The variation between the background scattering profiles of three sample positions was found to be less than plus minus 1.6%. This result is reasonable, considering the deviation of sample position of less than plus minus 0.3 mm from the vertical axis.
Tominaga, Taiki*; Kawakita, Yukinobu; Nakagawa, Hiroshi; Yamada, Takeshi*; Shibata, Kaoru
JPS Conference Proceedings (Internet), 33, p.011086_1 - 011086_5, 2021/03
We developed a quartz double cylindrical sample cell optimized for a backscattering neutron spectrometer, especially for BL02 (DNA), MLF in J-PARC. A quartz glass tube, with one end closed, is shaved to obtain a wall thickness of 0.55 mm. The inner tube is properly centered using a protrusion into the outer tube such that the interstice between the outer and inner tubes keeps constant. This quartz cell can be used for samples that should not be in contact with the aluminum surface. We verified cell's background effect between the quartz cell and Al cell by QENS measurements using D
O buffer. The elastic intensity profiles of the buffer in a low Q region were identical between both quartz cell and Al cell (A1070). In a high Q region, however, the profiles were different caused by the first sharp diffraction peak of quartz glass. For this region the data should be analyzed by consideration of absorption correction and diffraction in individual thickness of quartz cell.
Yamada, Ryohei; Odagiri, Taiki*; Iwaoka, Kazuki*; Hosoda, Masahiro*; Tokonami, Shinji*
Radiation Environment and Medicine, 8(1), p.21 - 25, 2019/02
We evaluate radon/thoron and its progeny concentration using passive-type monitors using CR-39 plates. After exposure, it is necessary to do chemical etching for CR-39 plates. In the present study, we considered shortening of chemical etching time for CR-39 and enlargement of the track diameter (i.e. etch pit diameter) aiming for introduction of automatic counting system in the future. Optimum conditions were determined by changing solution concentration, solution temperature and etching time. As a result, the optimized conditions (concentration, temperature and etching time) were determined to be 8 M NaOH solution, 75 degrees Celsius and 10 hours. This result of etching time showed that the chemical etching was completed in less than half of conventional etching time. Furthermore, it was suggested that shorter etching time would be possible if we do not consider the enlargement of conventional track diameter.
Shimizu, Kenichi*; Koike, Yuki*; Yamada, Taiki*; Oharada, Kazuya*; Tanaka, Keisuke*; Shobu, Takahisa
Zairyo, 65(9), p.657 - 664, 2016/09
The internal stress in crystalline thermoplastics, polyphenylene sulphide (PPS), reinforced by carbon fibers of 30 mass% was measured by the diffraction method using synchrotron with energy of 12.3 keV. The stress in the matrix was determined by the sin2psi method with side-inclination optics of transmitted X-ray diffractions. Using skin-layer strips cut parallel, perpendicular and 45 degree to the molding direction of the injection molded plates, the matrix stress was measured under the uniaxial applied stress. The experimental values were at least qualitatively agreed with the prediction derived based on micromechanics. The quantitative difference between experiment and prediction is mainly due to the neglect of the distribution of fiber orientations in the micromechanics prediction. These residual stresses were caused by the mismatch of the thermal expansion coefficient between matrix and fibers.
Watanabe, Kiyomasa*; Suzuki, Yasuhiro*; Yamaguchi, Taiki; Narihara, Kazumichi*; Tanaka, Kenji*; Tokuzawa, Tokihiko*; Yamada, Ichihiro*; Sakakibara, Satoru*; Morisaki, Tomohiro*; Nakajima, Noriyoshi*; et al.
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Shibata, Kaoru; Yamada, Takeshi*; Matsuura, Masato*; Tominaga, Taiki*; Kamazawa, Kazuya*; Kawakita, Yukinobu; Nakajima, Kenji; Kambara, Wataru; Inamura, Yasuhiro; Nakatani, Takeshi; et al.
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no abstracts in English
Shibata, Kaoru; Kawakita, Yukinobu; Nakajima, Kenji; Takahashi, Nobuaki*; Matsuura, Masato*; Tominaga, Taiki*; Yamada, Takeshi*
no journal, ,
We developed a simultaneous multiple incident band measurement method for broadband micro eV spectrum measurement on the Si crystal analyzer back scattering TOF spectrometer DNA at J-PARC.
Shibata, Kaoru; Takahashi, Nobuaki*; Kawakita, Yukinobu; Matsuura, Masato*; Tominaga, Taiki*; Yamada, Takeshi*; Nakajima, Kenji; Kobayashi, Makoto*; Inamura, Yasuhiro
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Shibata, Kaoru; Kawakita, Yukinobu; Matsuura, Masato*; Tominaga, Taiki*; Yamada, Takeshi*
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no abstracts in English
eV high energy resolution TOF type Si crystal analyzer backscattering spectrometer DNA at J-PARC/MLFShibata, Kaoru; Takahashi, Nobuaki*; Kawakita, Yukinobu; Matsuura, Masato*; Tominaga, Taiki*; Yamada, Takeshi*
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Shibata, Kaoru; Kawakita, Yukinobu; Fujiwara, Satoru*; Nakagawa, Hiroshi; Yamada, Takeshi*; Tominaga, Taiki*; Matsuura, Masato*
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The time-of-flight (TOF) type near-backscattering spectrometer (n-BSS), DNA, with Si crystal analyzers was built and started operation in 2012 at the Materials and Life Science Experimental Facility (MLF) of the Japan Proton Accelerator Research Complex (J-PARC). DNA is the first n-BSS with pulse shaping chopper installed at a spallation pulsed neutron source.
Shibata, Kaoru; Kawakita, Yukinobu; Nakagawa, Hiroshi; Yamada, Takeshi*; Tominaga, Taiki*; Matsuura, Masato*
no journal, ,
A time-of-flight (TOF) type near-backscattering spectrometer (n-BSS), DNA was built and started operation in 2012 at the Materials and Life Science Experimental Facility (MLF) of the Japan Proton Accelerator Research Complex (J-PARC). It offers a high-energy resolution of about 1.6 micro eV and very wide energy scan range: -400 
E/[micro eV] +600 with signal-to-noise ration of 
100,000. Those factors gave big advantage to enlarge application fields to dynamical behaviors of atoms and spins in bio-molecules, soft-materials and strongly-correlated electron system in nanosecond timescale or in micro-eV energy region.
Kawakita, Yukinobu; Matsuura, Masato*; Tominaga, Taiki*; Yamada, Takeshi*; Kobayashi, Makoto*; Nakagawa, Hiroshi
no journal, ,
The ToF back scattering spectrometer, DNA, installed at the BL02 of MLF in J-PARC, is a tool for quasi-elastic and inelastic neutron scattering. DNA is a unique back-scattering spectrometer with a pulse shaping chopper with maximum rotation speed of 300 Hz. After scattered by the measuring sample, neutrons only with 2.08 meV are selected by Si111 analyzer mirrors. High efficiency and high signal-to-noise ratio are achieved to detect weak signals in inelastic energy region by analyzer mirrors coated with a Gd neutron absorber on the rear of a Si wafer. The subjects of DNA are atomic and spin dynamics ranged from pico to nano second order in bio-molecules, softmatters, and solid state materials such as ionic conductors including batteries and strongly-correlated electron system. In this presentation, in addition of specification of DNA spectrometer, grade-up activities including commissioning work of new analyzer mirrors Si311 and so on will be introduced.
Kawakita, Yukinobu; Matsuura, Masato*; Tominaga, Taiki*; Yamada, Takeshi*; Kobayashi, Makoto*; Nakagawa, Hiroshi
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The ToF back scattering spectrometer, DNA at BL02, MLF, J-PARC, is a tool for quasi-elastic and inelastic neutron scattering studies aiming at atomic and spin dynamics ranged from pico to nano sec in bio-molecules, softmatters and solid state materials such as ionic conductors including batteries and strongly-correlated electron system. High signal-to-noise ratio are achieved by Si analyzer mirrors back-coated with a Gd neutron absorber. DNA equips a pulse shaping chopper of max 300 Hz and Si111 analyzer mirrors which select the scattered neutrons only with 2.08 meV with the Bragg angle of 87.5 degree and cover a momentum transfer from 0.08 to 1.9 (1/A). Recently we start installation of Si311 analyzer mirrors too which select a scattered neutron with 7.64 meV and widen a momentum transfer range up to 3.79 (1/A). In this presentation, we introduce the spec of DNA including recent commissioning for Si311 analyzer mirrors and several applications to materials science.
Kawakita, Yukinobu; Matsuura, Masato*; Tominaga, Taiki*; Yamada, Takeshi*; Tamatsukuri, Hiromu; Nakagawa, Hiroshi
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Kawakita, Yukinobu; Matsuura, Masato*; Tominaga, Taiki*; Yamada, Takeshi*; Tamatsukuri, Hiromu; Nakagawa, Hiroshi; Ouchi, Keiichi*
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Kawakita, Yukinobu; Matsuura, Masato*; Tominaga, Taiki*; Yamada, Takeshi*; Tamatsukuri, Hiromu; Nakagawa, Hiroshi; Ouchi, Keiichi*
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