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論文

3D visualization of XFEL beam focusing properties using LiF crystal X-ray detector

Pikuz, T.*; Faenov, A.*; 松岡 健之*; 松山 智至*; 山内 和人*; 尾崎 典雅*; Albertazzi, B.*; 犬伏 雄一*; 矢橋 牧名*; 登野 健介*; et al.

Scientific Reports (Internet), 5, p.17713_1 - 17713_10, 2015/12

 被引用回数:36 パーセンタイル:88.1(Multidisciplinary Sciences)

we report, that by means of direct irradiation of lithium fluoride a (LiF) crystal, in situ 3D visualization of the SACLA XFEL focused beam profile along the propagation direction is realized, including propagation inside photoluminescence solid matter. High sensitivity and large dynamic range of the LiF crystal detector allowed measurements of the intensity distribution of the beam at distances far from the best focus as well as near the best focus and evaluation of XFEL source size and beam quality factor M2. Our measurements also support the theoretical prediction that for X-ray photons with energies $$sim$$10 keV the radius of the generated photoelectron cloud within the LiF crystal reaches about 600 nm before thermalization. The proposed method has a spatial resolution 0.4-2.0 micron for photons with energies 6-14 keV and potentially could be used in a single shot mode for optimization of different focusing systems developed at XFEL and synchrotron facilities.

論文

X-ray photon correlation spectroscopy study in valence fluctuation compound Eu$$_{3}$$S$$_{4}$$

中尾 裕則*; 大和田 謙二; 下村 晋*; 落合 明*; 並河 一道*; 水木 純一郎; 三村 秀和*; 山内 和人*; 村上 洋一*

AIP Conference Proceedings 1234, p.935 - 938, 2010/06

 被引用回数:2 パーセンタイル:67.03

X-ray photon correlation spectroscopy (XPCS) is a powerful tool to perform direct measurements of the dynamics of fluctuations in condensed matter systems at atomic resolution. Here we have investigated spatial and time correlations of domains in the valence fluctuated phase in a typical valence fluctuation compound Eu$$_{3}$$S$$_{4}$$ near the charge ordering temperature ($$T_{CO}$$). The spatial correlation was observed at the fundamental reflection (4 4 4) using coherent diffraction techniques, which indicated that the domain size is longer than 200 nm near $$T_{CO}$$. The time correlation of the domain was measured by the XPCS technique, and we found that the slow fluctuation of the order of 10 second exists only near $$T_{CO}$$.

論文

X-ray intensity fluctuation spectroscopy using nanofocused hard X-rays; Its application to study of relaxor ferroelectrics

大和田 謙二; 並河 一道*; 下村 晋*; 中尾 裕則*; 三村 秀和*; 山内 和人*; 松下 三芳*; 水木 純一郎

Japanese Journal of Applied Physics, 49(2), p.020216_1 - 020216_3, 2010/02

 被引用回数:3 パーセンタイル:15.04(Physics, Applied)

The use of a combination of coherent X-rays from a third-generation synchrotron light source and ultraprecise Kirkpatrick-Baez mirrors enables us to apply nanofocused hard X-rays in solid-state physics. We developed an apparatus for X-ray intensity fluctuation spectroscopy using the nanofocused hard X-rays and applied it to the study of relaxor ferroelectrics. We have successfully detected a large and slow intensity fluctuation of scattered X-rays above cubic-to-tetragonal phase transition temperature with a characteristic time scale on the order of 10 s. We speculated that the intensity fluctuation originates from domain number fluctuation, which is directly related to the dielectric response, particularly the frequency dispersion.

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