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Journal Articles

Study of interdiffused layers in the surface and interfaces of multilayers by total-reflection soft-X-ray fluorescence spectroscopy

Imazono, Takashi; Yanagihara, Mihiro*

Photon Factory News, 22(3), p.18 - 22, 2004/11

Using soft-X-ray fluorescence spectroscopy with photon incidence at a critical angle of total reflection, it was made clear that SiO$$_2$$ existed within a depth of a few nanometers from the surface of Fe/Si multilayers. It was generated by oxidation of the interdiffused Fe$$_3$$Si layer nearest to the topmost Fe layer. Consequently, the Fe$$_3$$Si layer was found to decrease in thickness. This result suggests that the total-reflection soft-X-ray fluorescence spectroscopy is fairly useful to analyze the chemical state of elements to a depth of a few nanometers from the surface.

Journal Articles

Study of "buried" interfaces of Mo/Si multilayers using soft-X-ray emission spectroscopy

Miyata, Noboru; Ishikawa, Sadayuki*; Yanagihara, Mihiro*; Watanabe, Makoto*

Photon Factory News, 18(2), p.25 - 29, 2000/08

no abstracts in English

JAEA Reports

Design and manufacture of a testing device for the evaluation of optical elements

Shimizu, Yuichi; Yoda, Osamu; Sasuga, Tsuneo*; Teraoka, Yuden; Yokoya, Akinari; Yanagihara, Mihiro*

JAERI-Tech 2000-021, p.45 - 0, 2000/03

JAERI-Tech-2000-021.pdf:3.01MB

no abstracts in English

Journal Articles

Varied-line-spacing laminar-type holographic grating for the standard soft X-ray flat-field spectrograph

Koike, Masato; Namioka, Takeshi*; Gullikson, E. M.*; Harada, Yoshihisa*; Ishikawa, Sadayuki*; Imazono, Takashi*; Mrowka, S.*; Miyata, Noboru; Yanagihara, Mihiro*; Underwood, J. H.*; et al.

Soft X-Ray and EUV Imaging Systems (Proceedings of SPIE Vol.4146), p.163 - 170, 2000/00

no abstracts in English

Journal Articles

Comparison of mechanically ruled versus holographically varied line-spacing gratings for a soft-X-ray flat-field spectrograph

Yamazaki, Takashi; Gullikson, E. M.*; Miyata, Noboru*; Koike, Masato; Harada, Yoshihisa*; Mrowka, S.*; Kleineberg, U.*; Underwood, J. H.*; Yanagihara, Mihiro*; Sano, Kazuo*

Applied Optics, 38(19), p.4001 - 4003, 1999/07

 Times Cited Count:20 Percentile:30.63(Optics)

no abstracts in English

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