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Aoki, Takeshi; Shimizu, Atsushi; Noguchi, Hiroki; Kurahayashi, Kaoru; Yasuda, Takanori; Nomoto, Yasunobu; Iigaki, Kazuhiko; Sato, Hiroyuki; Sakaba, Nariaki
Proceedings of 30th International Conference on Nuclear Engineering (ICONE30) (Internet), 9 Pages, 2023/05
The safety design philosophy is developed for the HTTR (High Temperature Engineering Test Reactor) heat application test facility connecting high temperature gas-cooled reactor (HTGR) and the hydrogen production plant. The philosophy was proposed to apply proven conventional chemical plant standards to the hydrogen production facility for ensuring public safety against anticipated disasters caused by high pressure and combustible gases. The present study also proposed the safety design philosophy to meet specific safety requirements identified to the nuclear facilities with coupling to the hydrogen production facility such as measures to ensure a capability of normal operation of the nuclear facility against a fire and/or explosion of leaked combustible material, and fluctuation of amount of heat removal occurred in the hydrogen production plant. The safety design philosophy will be utilized to establish its basic and detailed designs of the HTTR-heat application test facility.
Nomoto, Yasunobu; Mizuta, Naoki; Morita, Keisuke; Aoki, Takeshi; Okita, Shoichiro; Ishii, Katsunori; Kurahayashi, Kaoru; Yasuda, Takanori; Tanaka, Masato; Isaka, Kazuyoshi; et al.
Proceedings of 30th International Conference on Nuclear Engineering (ICONE30) (Internet), 7 Pages, 2023/05
Mizuta, Naoki; Morita, Keisuke; Aoki, Takeshi; Okita, Shoichiro; Ishii, Katsunori; Kurahayashi, Kaoru; Yasuda, Takanori; Tanaka, Masato; Isaka, Kazuyoshi; Noguchi, Hiroki; et al.
Proceedings of 30th International Conference on Nuclear Engineering (ICONE30) (Internet), 6 Pages, 2023/05
Sueyoshi, Tetsuro*; Kotaki, Tetsuya*; Furuki, Yuichi*; Fujiyoshi, Takanori*; Semboshi, Satoshi*; Ozaki, Toshinori*; Sakane, Hitoshi*; Kudo, Masaki*; Yasuda, Kazuhiro*; Ishikawa, Norito
Japanese Journal of Applied Physics, 59(2), p.023001_1 - 023001_7, 2020/02
Times Cited Count：6 Percentile：38.16(Physics, Applied)We show that Xe ion irradiation with 80 MeV to GdBa
Cu
Oy-coated conductors creates different morphologies of columnar defects (CDs) depending on the irradiation angles relative to the c-axis: continuous CDs with a larger diameter are formed for oblique irradiation at 
= 45
, whereas the same ion beam at a different angle ( = 0) induces the formation of discontinuous CDs. The direction-dependent morphologies of CDs significantly affect the angular behavior of the critical current density 
.
Sueyoshi, Tetsuro*; Kotaki, Tetsuya*; Furuki, Yuichi*; Uraguchi, Yusei*; Kai, Takashi*; Fujiyoshi, Takanori*; Shimada, Yusuke*; Yasuda, Kazuhiro*; Ishikawa, Norito
IEEE Transactions on Applied Superconductivity, 25(3), p.6603004_1 - 6603004_4, 2015/06
Times Cited Count：11 Percentile：50.43(Engineering, Electrical & Electronic)To investigate the effect of discontinuity of 1-D pinning centers on the flux pinning in a wide range of magnetic field directions, discontinuous columnar defects (CDs) and continuous CDs were formed in GdBCO coated conductors using Xe-ion irradiations with 80 and 270 MeV, respectively. An overall shift upward in Jc, for the 80-MeV-irradiated sample compared to the 270-MeV-irradiated one, can be observed in every direction of magnetic field, which is more remarkable as temperature decreases. This implies a synergetic effect of the pinning interaction between the linearity and the discontinuity for the discontinuous CDs.
Shobu, Takahisa; Shiro, Ayumi*; Yasuda, Ryo*; Koizumi, Yasuyuki; Mizutani, Haruki; Kobayashi, Takanori; Muramatsu, Toshiharu
no journal, ,
no abstracts in English
Nomoto, Yasunobu; Mizuta, Naoki; Morita, Keisuke; Aoki, Takeshi; Okita, Shoichiro; Ishii, Katsunori; Kurahayashi, Kaoru; Yasuda, Takanori; Tanaka, Masato; Isaka, Kazuyoshi; et al.
no journal, ,
no abstracts in English
Ishii, Katsunori; Mizuta, Naoki; Morita, Keisuke; Aoki, Takeshi; Kurahayashi, Kaoru; Yasuda, Takanori; Noguchi, Hiroki; Nomoto, Yasunobu; Shimizu, Atsushi; Iigaki, Kazuhiko; et al.
no journal, ,
no abstracts in English
