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Strasser, P.*; Abe, Mitsushi*; Aoki, Masaharu*; Choi, S.*; Fukao, Yoshinori*; Higashi, Yoshitaka*; Higuchi, Takashi*; Iinuma, Hiromi*; Ikedo, Yutaka*; Ishida, Katsuhiko*; et al.
EPJ Web of Conferences, 198, p.00003_1 - 00003_8, 2019/01
Times Cited Count:13 Percentile:99.06(Quantum Science & Technology)Ueno, Yasuhiro*; Aoki, Masaharu*; Fukao, Yoshinori*; Higashi, Yoshitaka*; Higuchi, Takashi*; Iinuma, Hiromi*; Ikedo, Yutaka*; Ishida, Katsuhiko*; Ito, Takashi; Iwasaki, Masahiko*; et al.
Hyperfine Interactions, 238(1), p.14_1 - 14_6, 2017/11
Times Cited Count:3 Percentile:86.59(Physics, Atomic, Molecular & Chemical)Strasser, P.*; Aoki, Masaharu*; Fukao, Yoshinori*; Higashi, Yoshitaka*; Higuchi, Takashi*; Iinuma, Hiromi*; Ikedo, Yutaka*; Ishida, Katsuhiko*; Ito, Takashi; Iwasaki, Masahiko*; et al.
Hyperfine Interactions, 237(1), p.124_1 - 124_9, 2016/12
Times Cited Count:7 Percentile:90.97(Physics, Atomic, Molecular & Chemical)Ishino, Masahiko; Yoda, Osamu*; Koike, Masato
JAERI-Research 2005-019, 13 Pages, 2005/09
We have developed soft X-ray multilayer mirrors for use around the wavelength region of 4 nm including the K-absorption edge of carbon (). We have chosen CoO and Cr as the final candidate materials for absorber layers, and SiO and Sc for the spacer materials as the result of theoretical invitation. CoO/SiO, CoO/Sc and Cr/Sc multilayer mirrors have been fabricated by means of an ion beam sputtering (IBS) method. As the result of structure evaluations with X-ray diffraction measurement, we have found that the fabricated CoO/Sc and Cr/Sc multilayer mirrors have stable structures. Soft X-ray reflectivity measurements for fabricated multilayer mirrors are carried out in the wavelength region of 4 nm with a synchrotron radiation source. We have found that the Cr/Sc multilayer mirror has a high soft X-ray reflectivity. However, soft X-ray reflectivities below the absorption edge of carbon are reduced. The analyses obtained by EPMA and SIMS suggested that this phenomenon was attributed to contamination of carbon.
Amemiya, Hiroshi*; Wada, Motoi*; Toyoda, Hirotaka*; Nakamura, Keiji*; Ando, Akira*; Uehara, Kazuya; Oyama, Koichiro*; Sakai, Osamu*; Tachibana, Kunihide*
Purazuma, Kaku Yugo Gakkai-Shi, 81(7), p.482 - 525, 2005/07
This article is asked to write by the Japan Society of Plasma Science and Nuclear Fusion Research. The probe diagnostics in fusion plasma is explaind for many readers of the Journal of Plasma and Fusion Research, who have much concerned on various aspects.In section one, the method to estimate the electron temperature and the density as well as the electron energy distribution function with the single probe is given. In section two, the method to estimate the ion temperature and the flow velocity with the double probe is given. The practical measurements are explained introducing the data obtained at JFT-2, JFT-2a and JFT-2M in JAERI tokamak.
Ishino, Masahiko; Yoda, Osamu
Applied Optics, 43(9), p.1849 - 1855, 2004/03
Times Cited Count:1 Percentile:8.6(Optics)The development of multilayer mirrors for continual use around the K-absorption edge of carbon (4.4 nm) has been begun. CoO, SiO, and BN are found to be suitable for multilayer mirrors based on theoretical calculations for wavelengths around the carbon K-absorption edge region. X-ray reflectivity curves with Cu X rays of the fabricated CoO/SiO multilayers have sharp Bragg peaks and the layer structures evaluated from TEM observations are uniform. On the other hand, the Bragg peaks of CoO/BN multilayers split and aggregated CoO is observed. To improve the CoO layer structure, CrO was mixed into CoO. The mixed oxide layer structure in the Mix/BN multilayer (Mix = CoO + CrO) is relatively uniform and the Bragg peaks do not split.
Ishino, Masahiko; Yoda, Osamu; Takenaka, Hisataka*; Sano, Kazuo*; Koike, Masato
Surface & Coatings Technology, 169-170(1-3), p.628 - 631, 2003/06
no abstracts in English
Ishino, Masahiko; Yoda, Osamu; Sano, Kazuo*; Koike, Masato
X-Ray Mirrors, Crystals, and Multilayers II (Proceedings of SPIE Vol.4782), p.277 - 284, 2002/12
no abstracts in English
Ishino, Masahiko; Yoda, Osamu
Journal of Applied Physics, 92(9), p.4952 - 4958, 2002/11
Times Cited Count:6 Percentile:28.33(Physics, Applied)no abstracts in English
Koike, Masato; Sano, Kazuo*; Harada, Yoshihisa*; Yoda, Osamu; Ishino, Masahiko; Tamura, Keisuke*; Yamashita, Kojun*; Moriya, Naoji*; Sasai, Hiroyuki*; Jinno, Masafumi*; et al.
X-Ray Mirrors, Crystals, and Multilayers II (Proceedings of SPIE Vol.4782), p.300 - 307, 2002/07
For the purpose of realizing an evaluation beamline for characterizing soft X-ray optical elements in a wide wavelength range of 0.7-25 nm, we have designed and constructed a new type of monochromator that combined two types of Monk-Gillieson monochromators. One is a conventional type equipped with three varied-line-spacing plane gratings, allowing a choice of two included angles. The other is a new type that employs a scanning mechanism based on Surface Normal Rotation (SNR). The SNR scheme provides high throughput at short wavelengths and simple scanning mechanism by means of a grating rotation about its normal. The monochromator is operated in the SNR and conventional modes over the ranges of 0.7-2.0 nm and 2.0-25 nm, respectively. In this paper we describe the optical and mechanical designs of the monochromator, wavelength calibrations in the SNR mode, and preliminary experimental data, such as the transmittance of an Al filter at 0.8 nm and the total yield photoelectron measurement on a MgO powder in a wavelength rage of 0.7-2 nm.
Ishino, Masahiko; Yoda, Osamu; Haishi, Yasuyuki*; Arimoto, Fumiko*; Takeda, Mitsuhiro*; Watanabe, Seiichi*; Onuki, Somei*; Abe, Hiroaki
Japanese Journal of Applied Physics, Part 1, 41(5A), p.3052 - 3056, 2002/05
Times Cited Count:12 Percentile:45.92(Physics, Applied)no abstracts in English
Koike, Masato; Sano, Kazuo*; Yoda, Osamu; Harada, Yoshihisa*; Ishino, Masahiko; Moriya, Naoji*; Sasai, Hiroyuki*; Takenaka, Hisataka*; Gullikson, E. M.*; Mrowka, S.*; et al.
Review of Scientific Instruments, 73(3), p.1541 - 1544, 2002/03
Times Cited Count:20 Percentile:68.31(Instruments & Instrumentation)no abstracts in English
Ulyanenkov, A.*; Matsuo, R.*; Omote, Kazuhiko*; Inaba, Katsuhiko*; Harada, Jimpei*; Ishino, Masahiko; Nishii, Masanobu; Yoda, Osamu
Journal of Applied Physics, 87(10), p.7255 - 7260, 2000/05
Times Cited Count:33 Percentile:76.33(Physics, Applied)no abstracts in English
Shimizu, Yuichi; Yoda, Osamu; Sasuga, Tsuneo*; Teraoka, Yuden; Yokoya, Akinari; Yanagihara, Mihiro*
JAERI-Tech 2000-021, p.45 - 0, 2000/03
no abstracts in English
Koike, Masato; Namioka, Takeshi*; Gullikson, E. M.*; Harada, Yoshihisa*; Ishikawa, Sadayuki*; Imazono, Takashi*; Mrowka, S.*; Miyata, Noboru; Yanagihara, Mihiro*; Underwood, J. H.*; et al.
Soft X-Ray and EUV Imaging Systems (Proceedings of SPIE Vol.4146), p.163 - 170, 2000/00
no abstracts in English
Miyashita, Atsumi; Yoda, Osamu; *
Hyomen Kagaku, 20(3), p.180 - 185, 1999/00
no abstracts in English
Yoda, Osamu; Miyashita, Atsumi
Journal of Applied Physics, 75(10), p.5450 - 5452, 1994/05
Times Cited Count:1 Percentile:11.23(Physics, Applied)no abstracts in English
*; Aoki, Yasushi; Yoda, Osamu; Nagai, Shiro
Nuclear Instruments and Methods in Physics Research B, 88, p.261 - 266, 1994/00
Times Cited Count:19 Percentile:82.28(Instruments & Instrumentation)no abstracts in English
Yoda, Osamu; Miyashita, Atsumi; *; *; *; *
Japanese Journal of Applied Physics, 32(SUPPL.32-2), p.255 - 257, 1993/00
no abstracts in English
*; Aoki, Yasushi; Yoda, Osamu; Nagai, Shiro; D.M.Rueck*
Nuclear Instruments and Methods in Physics Research B, 80-81, p.1168 - 1170, 1993/00
Times Cited Count:3 Percentile:43.06(Instruments & Instrumentation)no abstracts in English