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Yokota, Kumiko*; Tagawa, Masahito*; Yoshigoe, Akitaka; Teraoka, Yuden
Journal of Surface Analysis, 20(3), p.221 - 225, 2014/03
Tagawa, Masahito*; Kishida, Kazuhiro*; Yokota, Kumiko*; Matsumoto, Koji*; Yoshigoe, Akitaka; Teraoka, Yuden; Zhang, J.*; Minton, T. K.*
Protection of Materials and Structures from the Space Environment; Astrophysics and Space Science Proceedings, Vol.32, p.547 - 555, 2012/08
Yokota, Kumiko*; Tagawa, Masahito*; Matsumoto, Koji*; Furuyama, Yuichi*; Kitamura, Akira*; Kanda, Kazuhiro*; Tode, Mayumi; Yoshigoe, Akitaka; Teraoka, Yuden
Protection of Materials and Structures from the Space Environment; Astrophysics and Space Science Proceedings, Vol.32, p.531 - 539, 2012/08
Kanda, Kazuhiro*; Yokota, Kumiko*; Tagawa, Masahito*; Tode, Mayumi; Teraoka, Yuden; Matsui, Shinji*
Japanese Journal of Applied Physics, 50(5), p.055801_1 - 055801_3, 2011/05
Recently, the irradiation of soft X-ray synchrotron radiation (SR) to highly-hydrogenated diamond-like-carbon (H-DLC) films in vacuum results in the desorption of hydrogen and the increase of film density, hardness and refractive index. In this study, we investigated SR irradiation effects on the H-DLC with different hydrogen contents. The H-DLC thin films were deposited on an Si wafer with 200 nm thickness by an amplitude-modulated radio frequency plasma chemical vapor deposition method. The SR irradiation was carried out at NewSUBARU BL6. The SR has a continuous spectrum from IR to soft X-ray, which is lower than 1 keV. The hydrogen content dependence on SR dose was estimated using elastic recoil detection analysis (ERDA) and Rutherford backscattering (RBS) techniques. The hydrogen content was kept constant in the low-hydrogenated DLC film, while that in the high-hydrogenated DLC film decreased exponentially with soft X-ray dose.
Kanda, Kazuhiro*; Yokota, Kumiko*; Tagawa, Masahito*; Tode, Mayumi; Teraoka, Yuden; Matsui, Shinji*
Japanese Journal of Applied Physics, 50(5), p.055801_1 - 055801_3, 2011/05
Times Cited Count:13 Percentile:47.75(Physics, Applied)Tagawa, Masahito*; Yokota, Kumiko*; Kitamura, Akira*; Matsumoto, Koji*; Yoshigoe, Akitaka; Teraoka, Yuden; Kanda, Kazuhiro*; Niibe, Masahito*
Applied Surface Science, 256(24), p.7678 - 7683, 2010/10
Times Cited Count:15 Percentile:53.58(Chemistry, Physical)Surface structural changes of a hydrogenated diamond-like carbon (DLC) film exposed to a hyperthermal atomic oxygen beam were investigated by Rutherford backscattering spectroscopy (RBS), synchrotron radiation photoelectron spectroscopy (SR-PES), and near-edge X-ray absorption fine structure (NEXAFS). It was confirmed that the DLC surface was oxidized and etched by high-energy collisions of atomic oxygen. RBS and real-time mass-loss data showed a linear relationship between etching and atomic oxygen fluence. SR-PES data suggested that the oxide layer was restricted to the topmost surface of the DLC film. NEXAFS data were interpreted to mean that the sp structure at the DLC surface was selectively etched by collisions with hyperthermal atomic oxygen, and an sp
-rich region remained at the topmost DLC surface. The formation of an sp
-rich layer at the DLC surface led to surface roughening and a reduced erosion yield relative to the pristine DLC surface.
Tagawa, Masahito*; Yokota, Kumiko*; Maeda, Kenichi*; Yoshigoe, Akitaka; Teraoka, Yuden; Akamatsu, Kensuke*; Nawafune, Hidemi*
Polyimides and Other High-Temperature Polymers; Synthesis, Characterization and Applications, Vol.5, p.249 - 259, 2009/08
Surface fluorination of PMDA-ODA polyimide has been performed by a hyperthermal F beam. The fundamental properties of the F-beam-exposed polyimide surface are reported based on the analytical results by X-ray photoelectron spectroscopy and contact angle measurements. It was observed that CF, CF or CF
moieties were formed at the polyimide surfaces depending on the F beam fluences. Advancing contact angles of water can be controlled from 60 to 120 degrees by varying the F beam fluences. Surface roughness analyzed by atomic force microscopy slightly increased with atomic F beam exposures due probably to the formation of volatile products such as CF
. This is confirmed by the mass change during F beam exposure by a quartz crystal microbalance.
Tagawa, Masahito*; Yokota, Kumiko*; Maeda, Kenichi*; Yoshigoe, Akitaka; Teraoka, Yuden
Applied Physics Express, 2(6), p.066002_1 - 066002_3, 2009/06
Times Cited Count:3 Percentile:13.98(Physics, Applied)Hyperthermal (kinetic energy of 10 eV) fluorine atom beam interaction with highly oriented pyrolytic graphite (HOPG) was studied. Surface analytical results of atomic fluorine-exposed HOPG using synchrotron radiation photoelectron spectroscopy showed that the fluorine reaction was limited at the topmost HOPG(0001) layer. This is due to the fact that the kinetic energy of 10 eV is not sufficient to penetrate graphite layer but is enough for breaking C-C bonds and forms CF and CF functional groups through the beam-induced fluorination reactions. It was demonstrated that the use of hyperthermal energy in the range of 10 eV is advantageous for damage-free modification of the topmost surface of carbon-based materials.
Yokota, Kumiko*; Tagawa, Masahito*; Kitamura, Akira*; Matsumoto, Koji*; Yoshigoe, Akitaka; Teraoka, Yuden; Fontaine, J.*; Belin, M.*
Transactions of the Japan Society for Aeronautical and Space Sciences, Space Technology Japan (Internet), 7(ists26), p.Pc_37 - Pc_42, 2009/06
The effect of hyperthermal atomic oxygen (AO) exposure on a surface property of Si-doped DLC was investigated. Two types of DLC were tested which contain Si atoms approximately 10 at% and 20 at%. Surface analytical results of high-resolution X-ray photoelectron spectroscopy using synchrotron radiation (synchrotron radiation photoemission spectroscopy; SR-PES) as well as Rutherford backscattering spectroscopy (RBS) have been used for characterization of the AO-exposed Si-doped DLC. It was identified by SR-PES that the SiO layer was formed by the hyperthermal AO exposure at the Si-doped DLC surface. RBS data indicates that AO exposure leads to severe thickness loss on the non-dope DLC, in contrast, SiO
layer formed by the hyperthermal atomic oxygen reaction at the Si-doped DLC protects the DLC underneath the SiO
layer.
Yokota, Kumiko*; Tagawa, Masahito*; Kitamura, Akira*; Matsumoto, Koji*; Yoshigoe, Akitaka; Teraoka, Yuden
Applied Surface Science, 255(13-14), p.6710 - 6714, 2009/04
Times Cited Count:16 Percentile:54.75(Chemistry, Physical)The densities of hydrogen and carbon atoms in a hydrogenated diamond-like carbon (DLC) film exposed to a hyperthermal atomic oxygen beam were investigated by Rutherford backscattering spectroscopy and elastic recoil detection analysis. The hydrogen density in DLC decreased upon atomic oxygen exposure with collision energy as low as 2 eV, whereas an exposure greater than 3 eV was necessary to remove carbon atoms. A high collision energy also led to hydrogen desorption in the deeper region of DLC. The surface density of hydrogen decreased 6% by atomic oxygen exposure, and was independent of the collision energy. Additionally, the non-bonded hydrogen, which could diffuse in DLC, was desorbed by the energy transfer from the atomic oxygen collisions.
Yokota, Kumiko*; Tagawa, Masahito*; Kitamura, Akira*; Matsumoto, Koji*; Yoshigoe, Akitaka; Teraoka, Yuden; Fontaine, J.*; Belin, M.*
AIP Conference Proceedings 1087, p.368 - 383, 2008/05
The effect of hyperthermal atomic oxygen (AO) exposure on a surface property of Si-doped DLC was investigated. Two types of DLC were tested which contain Si atoms approximately 10 at% and 20 at%. Surface analytical results of high-resolution X-ray photoelectron spectroscopy using synchrotron radiation (synchrotron radiation photoemission spectroscopy; SR-PES) as well as Rutherford backscattering spectroscopy (RBS) have been used for characterization of the AO-exposed Si-doped DLC. It was identified by SR-PES that the SiO layer was formed by the hyperthermal AO exposure at the Si-doped DLC surface. RBS data indicates that AO exposure leads to severe thickness loss on the non-dope DLC, in contrast, SiO
layer formed by the hyperthermal atomic oxygen reaction at the Si-doped DLC protects the DLC underneath the SiO
layer.
Tagawa, Masahito*; Yokota, Kumiko*; Matsumoto, Koji*; Suzuki, Mineo*; Teraoka, Yuden; Kitamura, Akira*; Belin, M.*; Fontaine, J.*; Martin, J. M.*
Surface & Coatings Technology, 202(4-7), p.1003 - 1010, 2007/12
Times Cited Count:69 Percentile:90.15(Materials Science, Coatings & Films)Effects of 5 eV atomic oxygen beam on MoS and diamond-like carbon (DLC) lubrication films are evaluated relevance to space environmental effects in the low Earth orbit. X-ray photoelectron spectra indicate that the loss of S atoms and Mo oxidation at the atomic oxygen irradiated MoS
is significant. Depth profiles of S and Mo indicate that the oxidation is restricted within 3 nm from the surface. This is due to the fact that Mo oxide plays as a protective layer against further oxidation. The surface oxidation affects the friction coefficient. However, due to the delamination of oxide layer, wear-life of the film is reduced in some conditions. In contrast, no sever oxidation states of C atoms are detected at DLC surface. However, the loss of DLC itself is measured by Rutherford backscattering spectroscopy. It is concluded that the protection of DLC film is mandatory for the use of DLC in the LEO space applications.
Tagawa, Masahito*; Yokota, Kumiko*; Tsumamoto, Shinnosuke*; Sogo, Chie*; Yoshigoe, Akitaka; Teraoka, Yuden
Applied Physics Letters, 91(3), p.033504_1 - 033504_3, 2007/07
Times Cited Count:5 Percentile:22.14(Physics, Applied)A direct oxidation reaction of Si atoms on an Si(001) surface was studied by ellipsometry and synchrotron radiation photoemission spectroscopy. In-situ ellipsometry measurements when exposed to 2.7-5.0 eV O atom beams indicated that oxide growth followed a linear relationship with an O atom fluence up to an oxide thickness of 0.6-0.7 nm. In contrast, the limit of linear growth was 0.3 nm in the case of the 1.8 eV beam. These results suggest that the backbonds of Si atoms in the first layer are directly oxidized by O atom with a translational energy between 2.7-5.0 eV.
Tagawa, Masahito*; Sogo, Chie*; Yokota, Kumiko*; Yoshigoe, Akitaka; Teraoka, Yuden; Shimura, Takayoshi*
Applied Physics Letters, 88(13), p.133512_1 - 133512_3, 2006/03
Times Cited Count:8 Percentile:30.59(Physics, Applied)Synchrotron radiation photoelectron spectroscopy (SR-PES) and crystal truncation rod (CTR) scattering profiles were used to investigate an ultrathin SiO overlayer on an Si(001) surface formed by a 5 eV O-atom beam at room temperature. The SR-PES spectra indicated that the suboxides in the O-atom-beam oxidized film were concentrated on the SiO
surface rather than at the Si/SiO
interface. The CTR scattering data of the O-atom-beam oxidation film had a lower intensity near (1 1 L) (0.3-L-0.8), suggesting a lower content of the SiO
ordered structure in the oxide film. An inverse diffusion of the interstitial Si atoms in the oxidation kinetics can explain the data.
Tagawa, Masahito*; Sogo, Chie*; Yokota, Kumiko*; Hachiue, Shunsuke; Yoshigoe, Akitaka; Teraoka, Yuden
Japanese Journal of Applied Physics, 44(12), p.8300 - 8304, 2005/12
Times Cited Count:5 Percentile:21.38(Physics, Applied)Si oxide layers formed on Si(001) substrates by irradiation of hyperthermal oxygen atomic beams at room temperature were analysed at the JAERI soft X-ray beamline by photoemission spectroscopy. It was found that sub-oxide components were scarcely observed in the Si oxide layers formed by the atomic oxygen beam.
Kanda, Kazuhiro*; Tagawa, Masahito*; Yokota, Kumiko*; Tode, Mayumi; Teraoka, Yuden; Matsui, Shinji*
no journal, ,
In this study, hydrogen desorption processes from highly-hydrogenated DLC films have been investigated by thermal desorption mass stectrometry (TDS) and elastic recoil detection analysis (ERDA). The soft X-ray irradiation was performed at BL-6 in NewSUBARU. The white light is containing infra red to 1000 eV X-ray. The TDS measurements were performed using the thermal desorption measurement system at BL23SU in SPring-8. Although a large peak was observed at around 470 K in the non-X-ray-irradiated DLC film, the peak almost disappeared after irradiation of 300 mAhr synchrotron radiation. ERDA measurements resulted in no change of hydrogen content for lowly-hydrogenated DLC film instead of large decrease of hydrogen for highly-hydrogenated DLC film depending on soft X-ray dose. Hydrogen molecules, which are seen in a TDS spectrum as a low temperature peak, desorb by soft X-ray irradiation so that density and reflective index are changed.
Tagawa, Masahito*; Yokota, Kumiko*; Yoshigoe, Akitaka; Teraoka, Yuden
no journal, ,
A laser detonation atomic beam method forms intense, hyperthermal, pulsed broad atomic/molecular beams. Translational energy of impinging atoms ranging 1-10eV can promote surface chemical reactions without activating physical sputtering. Therefore, atomic beams with hyperthermal energies are effective for lowering a process temperature of surface modification. In this study, an Si(001):H surface was exposed to hyperthermal O-atom beam at room temperature and the surface oxide film formed was analyzed by synchrotron radiation photoemission spectroscopy at BL23SU in SPring-8. It was made clear that the oxide film formed by a hyperthermal O-atom beam exhibited some unique features. (1)The atomic beam oxide film contains less amount of suboxides compared with conventional high-temperature oxidation. (2)A distribution of suboxide is different from high-temperature oxidation; i.e., suboxides concentrated at SiO surface rather than Si/SiO
interface. The suboxide distribution can be explained by the back diffusion of interstitial Si atom. (3)An impinging energy affects the direct oxidation reaction. (4)Silicon nitride can also be formed by hyperthermal N/N
beam.
Kanda, Kazuhiro*; Yokota, Kumiko*; Tagawa, Masahito*; Tode, Mayumi; Teraoka, Yuden; Matsui, Shinji*
no journal, ,
In the present study, we investigated the desorption of hydrogen from highly-hydrogenated diamond-like-carbon (DLC) films by irradiation of synchrotron radiation (SR) soft X-rays in vacuum. The irradiation of SR was carried out at BL-6 of NewSUBARU. The SR energy is ranging from infra red to soft X-ray, which was lower than 1 keV. The hydrogen content in the DLC films has been determined by Rutherford backscattering (RBS) and elastic recoil detection analysis (ERDA) techniques. Although the hydrogen content in the low-hydrogenated DLC film was independent on the soft X-ray dose, that for the high-hydrogenated DLC film decreased exponentially with the soft X-ray dose. This implies that the desorption of hydrogen takes place from the high-hydrogenated DLC films by the soft X-ray irradiation.
Tagawa, Masahito*; Sogo, Chie*; Miyagai, Suguru*; Yokota, Kumiko*; Yoshigoe, Akitaka; Teraoka, Yuden
no journal, ,
Ultra-thin oxide-layers on Si(001) surfaces, formed by an atomic oxygen beam with hyperthermal incident energy, were analysed by photoemission spectroscopy with synchrotron radiation. The formation of ultra-thin oxide-layers was performed in Kobe University. The photoemission spectroscopy was performed at the surface chemistry experimental station installed in the JAEA soft X-ray beamline in the SPring-8. Comparing the photoemission spectra with those of thermal oxidation with oxygen gas, it was found that a few suboxides were observed in the ultra-thin oxide-layers formed by atomic oxygem beams.
Yokota, Kumiko*; Asada, Hidetoshi*; Tagawa, Masahito*; Ohara, Hisanori*; Nakahigashi, Takahiro*; Yoshigoe, Akitaka; Teraoka, Yuden; Martin, J. M.*; Belin, M.*
no journal, ,
Hydrogenated diamond-like carbon (DLC) is expected as a lubricant for space uses because of its ultra low friction charactor in vacuum. Thus, DLC films were exposed to atomic oxygens which were generated by a laser detonation method simulating a low orbit space environment. The DLC surfaces were analysed and the results are reported in this talk. The hydrogenated amorphous DLC was fabricated by a RF-CVD method on Si substrates. Relative collision energy of space planes against atomic oxygens can be simulated with the space environment experimental apparatus. The DLC films exposed to atomic oxygens were analysed by an SR-PES method etc. The SR-PES was performed at the surface chemical reaction analysis station installed in the BL23SU of SPring-8. It was suggested that some volatile oxides were formed and desorbed from the DLC surface when DLC surface was irradiated by atomic oxygens with an incident energy of 4.2 eV and fluence of 510
atoms/cm
.