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Oral presentation

Multi-scale structure analysis by using synchrotron X-ray

Yoneda, Yasuhiro

no journal, , 

Multi-scale structure analysis can be performed by using synchrotron X-rays. Local, middle-range, and average structures can be obtained by XAFS, PDF, and Rietveld refinement, respectively. We will show the outline of these methods. The results of BaTiO$$_3$$ will be shown as an example.

Oral presentation

In situ observations of surface chemical reactions using soft X-ray synchrotron radiation photoelectron spectroscopy

Yoshigoe, Akitaka

no journal, , 

The lecture concerning the utilization of surface chemistry end-station at BL23SU in SPring-8 will be held as part of the Nanotechnology Platform Japan program of MEXT for the year 2016.

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