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beam line separationIshii, Yasuyuki; Chiba, Atsuya; Uno, Sadanori; Saito, Yuichi; Mizuhashi, Kiyoshi; Tajima, Satoshi*; Kamiya, Tomihiro
Nuclear Instruments and Methods in Physics Research B, 260(1), p.15 - 19, 2007/07
Times Cited Count:1 Percentile:13.78(Instruments & Instrumentation)Measurement of beam energy spreads caused by an accelerator are needed to evaluation the choromatic aberration when ion beams with micorometer or nanometer sizes are formed at a focusing point. A measurement method of the beam energy spreads without using a analyzing magnet with a high resolution was developed to evaluate the chromatic aberration in a light-ion micorbeam system connected to the 3MV JAEA single-ended accelerator. The accurate beam energy spread measurement method within a resolution of 10
was developed using resonance nuclear reactions with narrow energy spreads of
A
(p,
)
Si and
Mg(p,
)
A
in a MeV energy range. Furthermore, ion species separating method, in a 0-degree beam line connected to the accelerator, was developed using parmanent magnets attached on the accelerator tube in the accelerator. The two kinds of developmet resulted in measuring baem energy spreads generated from the accelerator directly.
Takahashi, Yoshihiro*; Oki, Takahiro*; Nagasawa, Takaharu*; Nakajima, Yasuhito*; Kawanabe, Ryu*; Onishi, Kazunori*; Hirao, Toshio; Onoda, Shinobu; Mishima, Kenta; Kawano, Katsuyasu*; et al.
Nuclear Instruments and Methods in Physics Research B, 260(1), p.309 - 313, 2007/07
Times Cited Count:4 Percentile:34.86(Instruments & Instrumentation)no abstracts in English
Oikawa, Masakazu*; Sato, Takahiro; Sakai, Takuro; Miyawaki, Nobumasa; Kashiwagi, Hirotsugu; Kurashima, Satoshi; Okumura, Susumu; Fukuda, Mitsuhiro*; Yokota, Wataru; Kamiya, Tomihiro
Nuclear Instruments and Methods in Physics Research B, 260(1), p.85 - 90, 2007/07
Times Cited Count:42 Percentile:91.48(Instruments & Instrumentation)A high-energy heavy ion microbeam system has been developed in an ion accelerator facility, TIARA of JAEA Takasaki. This was the first trial to focus heavy ion beams with an energy range of a few tens MeV/n from an AVF cyclotron accelerator in the world. The focusing system equipped with a quadruplet quadrupole magnet lens, multi beam collimators and beam scanners has been optimized following almost the same way as that of previously developed microbeam system in TIARA. However the ion beams from the cyclotron accelerator has a larger energy variation
E/E and also has a larger beam current instability
I/I than those of electro-static machine in general. We had to overcome these biggest problems in microbeam forming. This paper will outline the new focusing system we have developed in TIARA, and show the results of 1
m resolution by secondary electron mapping method and of single ion hit experiment for the track detectors and semiconductor test devices.
Kurashima, Satoshi; Miyawaki, Nobumasa; Okumura, Susumu; Oikawa, Masakazu*; Yoshida, Kenichi; Kamiya, Tomihiro; Fukuda, Mitsuhiro*; Sato, Takahiro; Nara, Takayuki; Agematsu, Takashi; et al.
Nuclear Instruments and Methods in Physics Research B, 260(1), p.65 - 70, 2007/07
Times Cited Count:10 Percentile:57.91(Instruments & Instrumentation)no abstracts in English