Measurement of niobium reaction rate for material surveillance tests in fast reactors

Ito, Chikara; Maeda, Shigetaka; Inoue, Toshihiko; Tomita, Hideki*; Iguchi, Tetsuo*

Radiation Protection, 40(6), p.491 - 495, 2020/11

A highly accurate and precise technique for measurement of the Nb(n,n')Nb reaction rate was established for the material surveillance tests, etc. in fast reactors. The self-absorption effect on the measurement of the characteristic X-rays emitted by Nb was decreased by the solution and evaporation to dryness of niobium dosimeter. A highly precise count of the number of Nb atoms was obtained by measuring the niobium solution concentration using inductively coupled plasma mass spectrometry. X-rays of Nb were measured accurately by means of comparing the X-ray intensity of irradiated niobium solution with that of the solution in which stable Nb was added. The difference between both intensities indicates the effect of Ta, which is generated from an impurity tantalum, and the intensity of X-rays from Nb was evaluated. Measurement error of the Nb(n,n')Nb reaction rate was reduced to be less than 4%, which was equivalent to the other reaction rate errors of dosimeters used for Joyo dosimetry. In addition, an advanced technique using Resonance Ionization Mass Spectrometry was proposed for the precise measurement of Nb yield, and Nb will be resonance-ionized selectively by discriminating the hyperfine splitting of the atomic energy levels between Nb and Nb at high resolution.