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Ono, Hirotaka*; Iwase, Akihiro*; Matsumura, Daiju; Nishihata, Yasuo; Mizuki, Junichiro; Ishikawa, Norito; Baba, Yuji; Hirao, Norie; Sonoda, Takeshi*; Kinoshita, Motoyasu
Nuclear Instruments and Methods in Physics Research B, 266(12-13), p.3013 - 3017, 2008/06
Times Cited Count:64 Percentile:95.71(Instruments & Instrumentation)Radiation damage of CeO
irradiated with 200MeV Xe is characterized by EXAFS and XPS measurement. It is found that oxygen deficiencies are created after the irradiation, and charge state of Ce is changed from +4 to +3.
Matsunami, Noriaki*; Sataka, Masao; Okayasu, Satoru; Ishikawa, Norito; Tazawa, Masato*; Kakiuchida, Hiroshi*
Nuclear Instruments and Methods in Physics Research B, 266(12-13), p.2986 - 2989, 2008/06
Times Cited Count:9 Percentile:51.53(Instruments & Instrumentation)Irradiation effects of Cu
O irradiated with 100 MeV Xe ions were studied. X-ray diffraction intensity and optical properties were analyzed.
irradiated with high-energy ions by means of X-ray diffraction measurementIshikawa, Norito; Chimi, Yasuhiro; Michikami, Osamu*; Ota, Yasuyuki*; Ohara, Kota; Lang, M.*; Neumann, R.*
Nuclear Instruments and Methods in Physics Research B, 266(12-13), p.3033 - 3036, 2008/06
Times Cited Count:46 Percentile:91.85(Instruments & Instrumentation)Cerium dioxide films are irradiated with high-energy heavy ions with the energy range of 150 MeV to 2.7 GeV, and X-ray diffraction profile is examined. As a result, the data can be explained by creation of nanometer-size ion track with disordered lattice structure, and the ion track is oxygen deficient.

Sonoda, Takeshi*; Kinoshita, Motoyasu*; Ishikawa, Norito; Sataka, Masao; Chimi, Yasuhiro; Okubo, Nariaki; Iwase, Akihiro*; Yasunaga, Kazufumi*
Nuclear Instruments and Methods in Physics Research B, 266(12-13), p.2882 - 2886, 2008/06
Times Cited Count:35 Percentile:87.53(Instruments & Instrumentation)High-energy particle irradiation effects of CeO
is investigated using electron microscopy. It is found that ion track is formed only when the electronic energy transfer exceeds 16 keV/nm.