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Hirade, Tetsuya; O'Rourke, B. E.*; Kobayashi, Yoshinori*
Journal of Physics; Conference Series, 791(1), p.012029_1 - 012029_4, 2017/02
Times Cited Count:2 Percentile:65.07We tried to observe the positron annihilation rates near surface of (room temperature ionic liquids) IL's, such as N,N,N-trimethyl-N-propylammonium bis(trifluoromethanesulfonyl)imide (TMPA-TFSI) by use of the perpendicular slow positron beamline installed at AIST. The vaper pressure of TMPA-TFSI is very small and hence it is possible to measure the positron annihilation rate in vacuum chamber directly. This represents the first energy variable experimental results of the positron annihilation rate at the near surface of an IL. The triplet positronium annihilation rate seems to be larger at nearer region to the surface of the IL's.
Takeda, Yusuke; Iida, Kiyoshi*; Sato, Shinji*; Matsuo, Tadatoshi*; Nagashima, Yasuyuki*; Okubo, Nariaki; Kondo, Keietsu; Hirade, Tetsuya
Journal of Physics; Conference Series, 791(1), p.012022_1 - 012022_4, 2017/02
Times Cited Count:1 Percentile:44.02Titanium alloy is widely used for applications such as golf club heads and structural materials for aircrafts. The surface can be exceedingly hardened by nitriding treatment that initiates defects, but there are some difficulties on use of titanium nitride because the layer can be exfoliated by stress. Therefore, we prepared samples in two different treatment conditions, (1) 810C 600 min and (2) 850
C 720 min and performed depth profile analysis of Doppler broadening of positron annihilation
-rays (DB) for these samples. According to a calculation of nitrogen diffusion depth, the nitride layer should be only about 0.05-0.1
m. However, the depth profile analysis of the DB measurement indicated that the defects introduced by nitriding treatment extended to a depth of 0.5
m.
Hyodo, Toshio*; Wada, Ken*; Mochizuki, Izumi*; Kimura, Masao*; Toge, Nobukazu*; Shidara, Tetsuo*; Fukaya, Yuki; Maekawa, Masaki*; Kawasuso, Atsuo*; Iida, Shimpei*; et al.
Journal of Physics; Conference Series, 791(1), p.012003_1 - 012003_8, 2017/02
Times Cited Count:3 Percentile:76.75no abstracts in English