Investigation of deep levels in diamond based radiation detector by transient charge spectroscopy with focused heavy ion microbeam

Ando, Yushi*; Kambayashi, Yuya*; Kada, Wataru*; Onoda, Shinobu; Makino, Takahiro; Sato, Shinichiro; Umezawa, Hitoshi*; Mokuno, Yoshiaki*; Shikata, Shinichi*; Hanaizumi, Osamu*; et al.

no journal, , 

A transient spectroscopy analysis of pulse signals induced by heavy ion micro probe was applied for chemical vapor deposition (CVD) diamond-based radiation detector to investigate the effects of native defects in on the degradation of charge collection efficiency. A high-purity CVD diamond with thickness of 100 m was employed for the analysis, and as a result, a defect with activation energy of 0.27 eV which is involved in the degradation of CCE was detected.