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Journal Articles

Quantitative evaluation of charge-reduction effect in cluster constituent ions passing through a foil

Chiba, Atsuya; Saito, Yuichi; Narumi, Kazumasa; Yamada, Keisuke; Kaneko, Toshiaki*

Nuclear Instruments and Methods in Physics Research B, 315, p.81 - 84, 2013/11

 Times Cited Count:0 Percentile:0.01(Instruments & Instrumentation)

The average charge of the constituent ions resulting from foil-induced dissociation of cluster ion is smaller than that of the single ion passing through the foil at same speed. This charge reduction effect is one of the most important phenomena for understanding the interaction of cluster ions with electrons in a solid, and the theories suggested that it strongly depends on the internuclear distance of the constituent ions. However, the relationship between the internuclear distance and the charge state has still not been shown quantitatively. We developed a method to evaluate the relationship by analyzing the divergence angle of the constituent ions after foil penetration using Coulomb explosion imaging technique. As a result for 6-MeV C$$_{2}$$$$^{+}$$, it was shown quantitatively that the charge reduction effect decreases with increasing the internuclear distance of the constituent ion in the solid.

Journal Articles

Characterization of epitaxial transformation phenomena induced by the interaction of implanted N-ions with Ti thin films

Kasukabe, Yoshitaka*; Shimoda, Hiroyuki*; Chen, Y.*; Yamamoto, Shunya; Yoshikawa, Masahito; Fujino, Yutaka*

Nuclear Instruments and Methods in Physics Research B, 315, p.131 - 135, 2013/11

 Times Cited Count:1 Percentile:12.7(Instruments & Instrumentation)

Epitaxial transformation phenomena of titanium films due to Nitrogen-implantation have been clarified through in-situ observations by using transmission electron microscope(TEM)and electron energy loss spectroscope (EELS), along with molecular orbital calculations. The N$$^{2+}$$ ions with 62 keV are implanted into as-deposited Ti films which consist of hcp-Ti and TiH$$_{rm x}$$ with preferred orientations, in the 400 kV analytic high resolution TEM combined with ion accelerators at JAEA Takasaki. The result of EELS measurements indicates that the hcp-fcc transformation occurs preferentially above a critical concentration ratio, N/Ti $$sim$$ 0.25. This means that above the N/Ti $$sim$$ 0.25, the invasion of implanted N atom to the N-unoccupied octahedral site in the neighboring unit cell next to the N-occupied one in hcp-Ti occurs preferentially, and induces the growth of nucleus of the hcp-fcc transformation.

Oral presentation

Translational energy induced oxidation of Ni(111) surface at room temperature by supersonic O$$_{2}$$ molecular beam

Teraoka, Yuden; Inoue, Keisuke*; Jinno, Muneaki*; Okada, Ryuta; Yoshigoe, Akitaka

no journal, , 

Oral presentation

Surface modification of Teflon by nitrogen ion beam irradiation

Kitamura, Akane; Sato, Takahiro; Koka, Masashi; Kamiya, Tomihiro; Kobayashi, Tomohiro*

no journal, , 

Oral presentation

Electrical resistivity change due to high-energy X-ray irradiation of oxide ceramics

Ishikawa, Norito; Chimi, Yasuhiro

no journal, , 

Electrical resistivity change due to high-energy X-ray irradiation of oxide ceramics (EuBa$$_{2}$$Cu$$_{3}$$O$$_{y}$$) is observed by in-situ measurement at KEK Photon Factory. Electrical resistivity increase depends on X-ray energy, and all the data can be scaled by the energy absorbed by the specimen.

Oral presentation

Direct observation of fine structure in ion tracks in amorphous thin films by TEM

Morita, Yosuke*; Nakajima, Kaoru*; Suzuki, Motofumi*; Kimura, Kenji*; Narumi, Kazumasa; Saito, Yuichi; Ishikawa, Norito; Hojo, Kiichi; Tsujimoto, Masahiko*; Isoda, Shoji*

no journal, , 

no abstracts in English

Oral presentation

Cluster effect on damage accumulation in a Si crystal bombarded with 10-540-keV C$$_{60}$$ ions

Narumi, Kazumasa; Naramoto, Hiroshi*; Yamada, Keisuke; Chiba, Atsuya; Saito, Yuichi; Morita, Yosuke*; Nakajima, Kaoru*; Kimura, Kenji*; Maeda, Yoshihito

no journal, , 

no abstracts in English

Oral presentation

Production of C$$_{60}$$ microbeams by single-microcapillary methods

Tsuchida, Hidetsugu*; Majima, Takuya*; Tomita, Shigeo*; Sasa, Kimikazu*; Narumi, Kazumasa; Saito, Yuichi; Chiba, Atsuya; Yamada, Keisuke; Hirata, Koichi*; Shibata, Hiromi*; et al.

no journal, , 

Oral presentation

Ion scattering on polarity-controlled ZnO surfaces by MeV ions

Motohashi, Kenji*; Saito, Yuichi; Miyawaki, Nobumasa

no journal, , 

An almost complete reflection of a 2.5-MeV proton beam on an evaporated Au layer was found at a grazing-incidence angle. We studied the mechanism of collisions between MeV ions and polarity-controlled ZnO surfaces in order to investigate the efficient reflection of swift ions on solid surfaces. The experiment was performed at the TIARA. C+ (2 MeV) ion beams were irradiated on the ZnO single crystals with two opposite surfaces, so-called "Zn and O faces", and the energy of the ions scattered at 3$$^{circ}$$ with respect to the beam axis was measured. It was revealed that the energy distribution of the scattered ions on the two opposite surfaces at an incidence angle of 2$$^{circ}$$ were significantly different. A larger energy loss and a higher yield of scattered ions on the Zn face compared to the O face suggest that elastic collisions with surface atoms play key roles.

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