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Oral presentation

Real-time observation of thermal oxidation process on high-index silicon surfaces by means of photoemission spectroscopy with synchrotron radiation

Ono, Shinya*; Abe, Sosuke*; Kanemura, Rui*; Yoshigoe, Akitaka; Teraoka, Yuden; Ogata, Shoichi*; Yasuda, Tetsuji*; Tanaka, Masatoshi*

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