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Miura, Kenta*; Sato, Takahiro; Ishii, Yasuyuki; Kiryu, Hiromu*; Ozawa, Yusuke*; Koka, Masashi; Takano, Katsuyoshi*; Okubo, Takeru; Yamazaki, Akiyoshi; Kada, Wataru; et al.
Key Engineering Materials, 534, p.158 - 161, 2013/00
Times Cited Count:5 Percentile:90.18Miura, Kenta*; Machida, Yuki*; Uehara, Masato*; Kiryu, Hiromu*; Ozawa, Yusuke*; Sasaki, Tomoyuki*; Hanaizumi, Osamu*; Sato, Takahiro; Ishii, Yasuyuki; Koka, Masashi; et al.
Key Engineering Materials, 497, p.147 - 150, 2012/00
Times Cited Count:7 Percentile:95.32Unno, Tomoya*; Agui, Akane; Matsumoto, Sayaka*; Suzuki, Kosuke*; Sakurai, Hiroshi*
no journal, ,
no abstracts in English
Kikuchi, Shusuke*; Umenyi, A. V.*; Inada, Kazuki*; Kawashima, Akihiro*; Noguchi, Katsuya*; Sasaki, Tomoyuki*; Miura, Kenta*; Hanaizumi, Osamu*; Yamamoto, Shunya; Kawaguchi, Kazuhiro; et al.
no journal, ,
Light emission around a wavelength () of 500 nm from SiO
substrates implanted with Si and C ions and annealed at 1100
C has been reported. In this report, we investigated photoluminescence (PL) properties of SiO
substrates implanted with Si and C ions and annealed at the lower temperature of 700
C. PL peaks by Si-ion implantation were observed around
= 650 nm, and PL peaks by C-ion implantation were observed around
= 450 nm from SiO
substrates annealed at 700
C. The PL peak wavelength became shorter by increasing the ratio of C to Si ions. Consequently, it was confirmed that it is possible to control the emission wavelength by the ratio of C to Si ions. Our samples showed typical light-emission though the annealing temperature was lower than the temperature reported by other groups.