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須貝 宏行; 左高 正雄; 岡安 悟; 市川 進一; 西尾 勝久; 光岡 真一; 仲野谷 孝充; 長 明彦; 佐藤 哲也; 橋本 尚志; et al.
Defect and Diffusion Forum, 273-276, p.667 - 672, 2008/00
A non-destructive and on-line diffusion tracing in Li ionic conductors has been successfully conducted by using the short-lived -emitting radiotracer of
Li. The radiotracers produced as an energetic and pulsed ion beam are implanted into the Li ionic conductor of NaTl-type intermetallic compounds (
-LiAl,
-LiGa, and
-LiIn). The
-particles survived on their passage from the position emitted by the diffusing
Li to the surface of the specimen are measured as a function of time. The diffusion coefficients of Li obtained for the NaTl-type intermetallic compounds with different Li compositions are quantitatively discussed in terms of the interaction between the structural defects in the specimen and Li.