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論文

Diffusion of $$^{8}$$Li short-lived radiotracer in Li ionic conductors of NaTl-type intermetallic compounds

須貝 宏行; 左高 正雄; 岡安 悟; 市川 進一; 西尾 勝久; 光岡 真一; 仲野谷 孝充; 長 明彦; 佐藤 哲也; 橋本 尚志; et al.

Defect and Diffusion Forum, 273-276, p.667 - 672, 2008/00

A non-destructive and on-line diffusion tracing in Li ionic conductors has been successfully conducted by using the short-lived $$alpha$$-emitting radiotracer of $$^{8}$$Li. The radiotracers produced as an energetic and pulsed ion beam are implanted into the Li ionic conductor of NaTl-type intermetallic compounds ($$beta$$-LiAl, $$beta$$-LiGa, and $$beta$$-LiIn). The $$alpha$$-particles survived on their passage from the position emitted by the diffusing $$^{8}$$Li to the surface of the specimen are measured as a function of time. The diffusion coefficients of Li obtained for the NaTl-type intermetallic compounds with different Li compositions are quantitatively discussed in terms of the interaction between the structural defects in the specimen and Li.

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