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Journal Articles

Defect characterization in compositionally graded InGaAs layers on GaAs (001) grown by MBE

Sasaki, Takuo; Norman, A. G.*; Romero, M. J.*; Al-Jassim, M. M.*; Takahashi, Masamitsu; Kojima, Nobuaki*; Oshita, Yoshio*; Yamaguchi, Masafumi*

Physica Status Solidi (C), 10(11), p.1640 - 1643, 2013/11

https://doi.org/10.1002/pssc.201300284

Times Cited Count：4 Percentile：82.30(Physics, Applied)