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Oshima, Takeshi; Sato, Takahiro; Oikawa, Masakazu*; Yamakawa, Takeshi; Onoda, Shinobu; Wakasa, Takeshi; Laird, J. S.; Hirao, Toshio; Kamiya, Tomihiro; Ito, Hisayoshi; et al.
Proceedings of the 6th International Workshop on Radiation Effects on Semiconductor Devices for Space Application (RASEDA-6), p.177 - 180, 2004/10
no abstracts in English
Oshima, Takeshi; Ito, Hisayoshi
Proceedings of the 6th International Workshop on Radiation Effects on Semiconductor Devices for Space Application (RASEDA-6), p.191 - 194, 2004/10
no abstracts in English
Iwata, Hiroshi*; Kagamihara, Satoshi*; Matsuura, Hideharu*; Kawakita, Shiro*; Oshima, Takeshi; Kamiya, Tomihiro
Proceedings of the 6th International Workshop on Radiation Effects on Semiconductor Devices for Space Application (RASEDA-6), p.143 - 146, 2004/10
no abstracts in English
Sato, Takahiro; Oikawa, Masakazu*; Sakai, Takuro; Okumura, Susumu; Kurashima, Satoshi; Miyawaki, Nobumasa; Fukuda, Mitsuhiro; Yokota, Wataru; Kamiya, Tomihiro
Proceedings of the 6th International Workshop on Radiation Effects on Semiconductor Devices for Space Application (RASEDA-6), p.207 - 210, 2004/10
A focused high-energy heavy ion scanning microbeam system with a spatial resolution of about 1m is being developed at the AVF cyclotron of JAERI-Takasaki. It will provide microbeams to applications such as radiation tolerance testing of semiconductor devices and radio microsurgery in biomedical science with single ion hit technique. The main system components (slits, a beam scanner, quadrupole magnets and so on) had been installed in 2002. Test operations have been carried out since last year. We report the results obtained so far.
Shindo, Hiroyuki*; Kuboyama, Satoshi*; Ikeda, Naomi*; Otomo, Hiromitsu*; Shimada, Osamu*; Hirao, Toshio; Matsuda, Sumio*
Proceedings of the 6th International Workshop on Radiation Effects on Semiconductor Devices for Space Application (RASEDA-6), p.63 - 66, 2004/10
no abstracts in English
Hirao, Toshio; Laird, J. S.; Onoda, Shinobu; Shibata, Toshihiko*; Wakasa, Takeshi; Yamakawa, Takeshi; Abe, Hiroshi; Takahashi, Yoshihiro*; Onishi, Kazunori*; Ito, Hisayoshi
Proceedings of the 6th International Workshop on Radiation Effects on Semiconductor Devices for Space Application (RASEDA-6), p.105 - 109, 2004/10
no abstracts in English
Takahashi, Yoshihiro*; Shibata, Toshihiko*; Murase, Yuji*; Onishi, Kazunori*; Hirao, Toshio; Kamiya, Tomihiro
Proceedings of the 6th International Workshop on Radiation Effects on Semiconductor Devices for Space Application (RASEDA-6), p.111 - 114, 2004/10
no abstracts in English
Laird, J. S.; Hirao, Toshio; Onoda, Shinobu; Wakasa, Takeshi; Yamakawa, Takeshi; Abe, Hiroshi; Kamiya, Tomihiro; Ito, Hisayoshi
Proceedings of the 6th International Workshop on Radiation Effects on Semiconductor Devices for Space Application (RASEDA-6), p.125 - 129, 2004/10
no abstracts in English
Abe, Tetsuo*; Onishi, Kazunori*; Takahashi, Yoshihiro*; Hirao, Toshio
Proceedings of the 6th International Workshop on Radiation Effects on Semiconductor Devices for Space Application (RASEDA-6), p.157 - 160, 2004/10
no abstracts in English
Kuboyama, Satoshi*; Ikeda, Naomi*; Hirao, Toshio; Matsuda, Sumio*
Proceedings of the 6th International Workshop on Radiation Effects on Semiconductor Devices for Space Application (RASEDA-6), p.165 - 168, 2004/10
no abstracts in English
Fukui, Hironobu*; Hamaguchi, Masafumi*; Yoshimura, Hisao*; Oyamatsu, Hisato*; Matsuoka, Fumitomo*; Noguchi, Tatsuo*; Hirao, Toshio; Abe, Hiroshi; Onoda, Shinobu; Yamakawa, Takeshi; et al.
Proceedings of the 6th International Workshop on Radiation Effects on Semiconductor Devices for Space Application (RASEDA-6), p.169 - 172, 2004/10
no abstracts in English
Onoda, Shinobu; Hirao, Toshio; Laird, J. S.; Wakasa, Takeshi; Yamakawa, Takeshi; Okamoto, Tsuyoshi*; Koizumi, Yoshiharu*; Kamiya, Tomihiro; Ito, Hisayoshi
Proceedings of the 6th International Workshop on Radiation Effects on Semiconductor Devices for Space Application (RASEDA-6), p.173 - 176, 2004/10
no abstracts in English
Nakabayashi, Masakazu*; Oyama, Hidenori*; Hanano, N.*; Hirao, Toshio; Simoen, E.*; Claeys, C.*
Proceedings of the 6th International Workshop on Radiation Effects on Semiconductor Devices for Space Application (RASEDA-6), p.183 - 186, 2004/10
no abstracts in English
Hirao, Toshio; Laird, J. S.; Onoda, Shinobu; Wakasa, Takeshi; Ito, Hisayoshi
Proceedings of the 6th International Workshop on Radiation Effects on Semiconductor Devices for Space Application (RASEDA-6), p.187 - 189, 2004/10
no abstracts in English
Takeuchi, Koichiro*; Akiyama, Masatsugu*; Hirao, Toshio
Proceedings of the 6th International Workshop on Radiation Effects on Semiconductor Devices for Space Application (RASEDA-6), p.195 - 199, 2004/10
no abstracts in English
Wakasa, Takeshi; Hirao, Toshio; Sanami, Toshiya*; Onoda, Shinobu; Abe, Hiroshi; Tanaka, Susumu; Kamiya, Tomihiro; Okamoto, Tsuyoshi*; Ito, Hisayoshi
Proceedings of the 6th International Workshop on Radiation Effects on Semiconductor Devices for Space Application (RASEDA-6), p.213 - 216, 2004/10
no abstracts in English
Kawakita, Shiro*; Shimazaki, Kazunori*; Imaizumi, Mitsuru*; Kuwajima, Saburo*; Yoda, Shinichi*; Oshima, Takeshi; Ito, Hisayoshi
Proceedings of the 6th International Workshop on Radiation Effects on Semiconductor Devices for Space Application (RASEDA-6), p.151 - 154, 2004/10
no abstracts in English
Okada, Hiroshi*; Natsume, Satoshi*; Wakahara, Akihiro*; Yoshida, Akira*; Oshima, Takeshi; Kamiya, Tomihiro
Proceedings of the 6th International Workshop on Radiation Effects on Semiconductor Devices for Space Application (RASEDA-6), p.147 - 150, 2004/10
no abstracts in English
Ekins-Daukes, N. J.*; Lee, H. S.*; Sasaki, Takuo*; Yamaguchi, Masafumi*; Khan, A.*; Takamoto, Tatsuya*; Agui, Takaaki*; Kamimura, Kunio*; Kaneiwa, Minoru*; Imaizumi, Mitsuru*; et al.
Proceedings of the 6th International Workshop on Radiation Effects on Semiconductor Devices for Space Application (RASEDA-6), p.87 - 91, 2004/10
no abstracts in English
Sato, Tatsuhiko; Niita, Koji*; Iwase, Hiroshi*; Nakashima, Hiroshi; Yamaguchi, Yasuhiro; Sihver, L.*
Proceedings of the 6th International Workshop on Radiation Effects on Semiconductor Devices for Space Application (RASEDA-6), p.25 - 28, 2004/10
Radiological protection for astronauts or semiconductor devices against cosmic rays has been an essential issue in the planning of long-term space mission. Estimation of neutron spectra inside spacecrafts as well as those of HZE particles is of prime importance in the issue. We therefore calculated the spectra inside pseudo-spacecrafts using the Particle and Heavy Ion Transport code System PHITS. The agreements between the calculated neutron spectra and the corresponding experimental data were quite satisfactory. The soft error rates (SERs) of a typical SRAM cell were estimated from the spectra by employing the MBGR model.