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Journal Articles

Precise determination of surface Debye-temperature of Si(111)-7$$times$$7 surface by reflection high-energy positron diffraction

Fukaya, Yuki; Kawasuso, Atsuo; Hayashi, Kazuhiko; Ichimiya, Ayahiko

Applied Surface Science, 237(1-4), p.29 - 33, 2004/10

no abstracts in English

Journal Articles

Kinematical and dynamical analyses of reflection high-energy positron diffraction (RHEPD) patterns from Si(111)7$$times$$7 surfaces

Hayashi, Kazuhiko; Fukaya, Yuki; Kawasuso, Atsuo; Ichimiya, Ayahiko

Applied Surface Science, 237(1-4), p.34 - 39, 2004/10

no abstracts in English

Journal Articles

Structure of sub-monolayered silicon carbide films

Baba, Yuji; Sekiguchi, Tetsuhiro; Shimoyama, Iwao; Nath, K. G.

Applied Surface Science, 237(1-4), p.176 - 180, 2004/10

 Times Cited Count:7 Percentile:38.81(Chemistry, Physical)

no abstracts in English

Journal Articles

X-ray diffraction study on GaAs(001)-2$$times$$4 surfaces under molecular-beam epitaxy conditions

Takahashi, Masamitsu; Yoneda, Yasuhiro; Mizuki, Junichiro

Applied Surface Science, 237(1-4), p.219 - 223, 2004/10

 Times Cited Count:5 Percentile:30.88(Chemistry, Physical)

The GaAs(001)-$$(2times4)$$ reconstructed surface was investigated by in situ surface X-ray diffraction. The sample was subjected to measurements under molecular-beam epitaxy conditions without being transferred another chamber. Several X-ray diffraction patterns were measured with increasing the substrate temperature within the $$beta$$-phase of GaAs(001)-$$(2times4)$$ in a constant As flux of 5$$times$$10$$^{-7}$$ Torr. At relatively low temperatures up to 545$$^circ$$C, the observed X-ray diffraction patterns agree well to the $$beta$$2(2$$times$$4) surface. However, a different X-ray diffraction pattern was obtained at 585$$^circ$$C, while the $$2times 4$$ periodicity still persited. This change is explained by partial As-dimer desorption which results in a mixture of the $$beta$$2(2$$times$$4) and $$alpha$$2(2$$times$$4) structures.

Journal Articles

Nitriding transformation of titanium thin films by nitrogen implantation

Kasukabe, Yoshitaka*; Wang, J. J.*; Yamamura, Tsutomu*; Yamamoto, Shunya; Fujino, Yutaka*

Thin Solid Films, 464-465, p.180 - 184, 2004/10

 Times Cited Count:9 Percentile:45.27(Materials Science, Multidisciplinary)

no abstracts in English

Journal Articles

In-situ transmission electron microscope observation of nitriding processes of titanium thin films by nitrogen-implantation

Wang, J. J.*; Kasukabe, Yoshitaka*; Yamamura, Tsutomu*; Yamamoto, Shunya; Fujino, Yutaka*

Thin Solid Films, 464-465, p.175 - 179, 2004/10

 Times Cited Count:1 Percentile:7.49(Materials Science, Multidisciplinary)

no abstracts in English

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