JOPSS - Search Results

Journal Articles

Analytical examination of a spiral beam scanning method for uniform irradiation

Fukuda, Mitsuhiro; Okumura, Susumu; Arakawa, Kazuo

JAERI-Conf 97-003, 00(00), p.441 - 443, 1997/03

https://jopss.jaea.go.jp/pdfdata/JAERI-Conf-97-003.pdf

no abstracts in English

Journal Articles

Dissociative scattering of low-energy SiF $_{3}$ $^{+}$ and SiF $^{+}$ ions (5200eV) on Cu(100) surface

Yamamoto, Hiroyuki; Baba, Yuji; Sasaki, Teikichi

JAERI-Conf 97-003, p.340 - 344, 1997/03

https://jopss.jaea.go.jp/pdfdata/JAERI-Conf-97-003.pdf#page=365

Dissociative scattering of molecular SiF $_{3}$ $^{+}$ and SiF $^{+}$ ions from a Cu(100) single crystal surface has been investigated in the incident energy range from 5 eV to 200 eV. The observed data show that onset energies of dissociation for SiF $_{3}$ $^{+}$ and SiF $^{+}$ ions are 30 eV and 40 eV, respectively. The obtained threshold energies are consistent with a impulsive collision model where the dissociation of incident ion is caused by vibrational excitation during collision.

Journal Articles

Formation of oxide-trapped charges in 6H-SiC MOS structures

Yoshikawa, Masahito; Oshima, Takeshi; Ito, Hisayoshi; Nashiyama, Isamu; Okumura, Hajime*; Yoshida, Sadafumi*

JAERI-Conf 97-003, p.265 - 268, 1997/03

no abstracts in English

Journal Articles

Study of transient current induced by heavy-ion microbeams in Si and GaAs

Hirao, Toshio; Nashiyama, Isamu; Kamiya, Tomihiro; Suda, Tamotsu*

JAERI-Conf 97-003, p.249 - 252, 1997/03

no abstracts in English

Journal Articles

Analysis on anomalous degradation in silicon solar cell designed for space use

Oshima, Takeshi; Morita, Yosuke; Nashiyama, Isamu; Kawasaki, Osamu*; Hisamatsu, Tadashi*; Matsuda, Sumio*; Nakao, Tetsuya*; Wako, Yoshihito*

JAERI-Conf 97-003, p.256 - 260, 1997/03

no abstracts in English

Journal Articles

High energy ion irradiation effects on polymer materials; LET dependence of G value of scission of polymethylmethacrylate (PMMA)

Kudo, Hisaaki; Sasuga, Tsuneo; Seguchi, Tadao

JAERI-Conf 97-003, p.273 - 276, 1997/03

no abstracts in English

Journal Articles

Effects of ion beam irradiation on semiconductor devices

Nashiyama, Isamu; Hirao, Toshio; Ito, Hisayoshi; Oshima, Takeshi

JAERI-Conf 97-003, p.22 - 25, 1997/03

no abstracts in English

Journal Articles

Study of defects in radiation tolerant semiconductor SiC

Ito, Hisayoshi; Kawasuso, Atsuo; Oshima, Takeshi; Yoshikawa, Masahito; Nashiyama, Isamu; Okumura, Hajime*; Yoshida, Sadafumi*

JAERI-Conf 97-003, p.253 - 255, 1997/03

no abstracts in English

Journal Articles

Development of heavy-ion irradiation technique for single-event in semiconductor devices

Nemoto, Norio*; Akutsu, Takeo*; Naito, Ichiro*; Matsuda, Sumio*; Ito, Hisayoshi; Agematsu, Takashi; Kamiya, Tomihiro; Nashiyama, Isamu

JAERI-Conf 97-003, p.234 - 236, 1997/03

no abstracts in English

Journal Articles

Biological effect of penetration controlled irradiation with ion beams

Tanaka, Atsushi; Shimizu, Takashi*; Kikuchi, Masahiro; Kobayashi, Yasuhiko; Yamashita, Takao*; Watanabe, Hiroshi

JAERI-Conf 97-003, p.323 - 326, 1997/03

no abstracts in English

Journal Articles

Synthesis of $^{188}$ Re-DMSA complex using carrier-free $^{188}$ Re

Hashimoto, Kazuyuki; Md.S.Islam*; Izumo, Mishiroku

JAERI-Conf 97-003, p.313 - 317, 1997/03

https://jopss.jaea.go.jp/pdfdata/JAERI-Conf-97-003.pdf

no abstracts in English

Journal Articles

Distribution of products in polymer materials induced by ion-beam irradiation

Sugimoto, Masaki; Kudo, Hisaaki; Sasuga, Tsuneo; Seguchi, Tadao; Hama, Yoshimasa*; Hamanaka, Kenichi*; Matsumoto, Hideya*

JAERI-Conf 97-003, p.269 - 272, 1997/03

no abstracts in English

Journal Articles

Depth profiling of oxide-trapped charges in 6H-SiC MOS structures by slant etching method

Saito, Kazunari; Yoshikawa, Masahito; Oshima, Takeshi; Ito, Hisayoshi; Nashiyama, Isamu; Takahashi, Yoshihiro*; Onishi, Kazunori*

JAERI-Conf 97-003, p.243 - 248, 1997/03

no abstracts in English

Journal Articles

Uptake and transport of positron-emitting tracer ( $^{18}$ F) in plants

Kume, Tamikazu; Matsuhashi, Shimpei; ; Ito, Hitoshi; Fujimura, Takashi; ; Uchida, Hiroshi*; Ishioka, Noriko; Matsuoka, Hiromitsu; Osa, Akihiko; et al.

Applied Radiation and Isotopes, 48(8), p.1035 - 1043, 1997/00

https://doi.org/10.1016/S0969-8043(97)00117-6

Times Cited Count：54 Percentile：95.01(Chemistry, Inorganic & Nuclear)

no abstracts in English

Journal Articles