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decomposition on Si(110)Yano, Masahiro; Uozumi, Yuki*; Yasuda, Satoshi; Asaoka, Hidehito; Tsukada, Chie*; Yoshida, Hikaru*; Yoshigoe, Akitaka
e-Journal of Surface Science and Nanotechnology (Internet), 16, p.370 - 374, 2018/08
Fukaya, Yuki
e-Journal of Surface Science and Nanotechnology (Internet), 16, p.111 - 114, 2018/04
no abstracts in English
500
C) under electric fieldBaba, Yuji; Shimoyama, Iwao
e-Journal of Surface Science and Nanotechnology (Internet), 16, p.53 - 59, 2018/03
Surface ionization for cesium chloride and Cs-adsorbed soil has been investigated. For cesium chloride, neutral cesium was desorbed around 645C which is close to the melting point of cesium. While Cs
ion was desorbed from 400C. The ratio of desorbed ions and neutrals (Cs/Cs
) has a maximum around 410 C. Temperature dependence of Cs/Cs was analyzed using Saha-Langmuir equation, As a result, it was found that the temperature maximum is due to the changes of the surface work function induced by the phase transition of CsCl.
Tsuda, Yasutaka*; Makino, Takamasa*; Yoshida, Hikaru; Yoshigoe, Akitaka; Fukuyama, Tetsuya*; Okada, Michio*
no journal, ,
Initial stage of corrosion is one of the central topics in material science. In the present study, we report the results of oxidation on Cu
Pd(111) and CuPt(111) with a hyperthermal O molecular beam (HOMB) with variable incident energies, using X-ray photoemission spectroscopy in conjunction with synchrotron radiation. All experiments were performed using the Surface Reaction Analysis Apparatus constructed in BL23SU at SPring-8. The CuPd(111) and CuPt(111) samples were cleaned by Ar+ sputtering and annealing. The kinetic energy of the HOMB was set to be 2.3 eV. From the uptake curves, it was found that the oxidation of CuPt is less effective than that on CuAu and CuPd. This suppression of the surface reactivity may be caused by the Pt-rich subsurface layer.
Nakano, Hiroko; Takeuchi, Tomoaki; Hirota, Noriaki; Tsuchiya, Kunihiko
no journal, ,
no abstracts in English
Honda, Mitsunori; Shimoyama, Iwao; Okamoto, Yoshihiro; Soma, Ryunosuke*; Fukuda, Kengo*; Ochi, Masaaki*; Matsui, Toshiyuki*; Saito, Yuichi*; Iwase, Akihiro*
no journal, ,
Sekiguchi, Tetsuhiro; Yokoyama, Keiichi; Uozumi, Yuki*; Yano, Masahiro; Asaoka, Hidehito; Suzuki, Shinichi; Yaita, Tsuyoshi
no journal, ,
For nuclear transmutation of cesium-135 (Cs-135), which is long-lived fission product, we are developing selective absorbent which takes only Cs atom in, but does not CsI. In this study, absorbing property of Cs atom or CsI into fullerene (C
) solid has been investigated using synchrotron-based angle-dependent X-ray photoelectron spectroscopy (ARXPS). It was found that Cs penetrates into C deep bulk. In contrast, CsI does not diffuse into bulk, although CsI over-layer was formed on the shallow surface. Furthermore, XPS spectra were measured as a function of Ar-sputtering time in order to know Cs concentration profiles in further deep region. Results showed that Cs penetrates into deep region of several hundreds 
.
Suzuki, Yoshitaka; Niizeki, Tomotake*; Kitagawa, Tomoya*; Nishikata, Kaori; Matsukura, Minoru*; Hasegawa, Yoshio*; Tanase, Masakazu*; Fukumitsu, Nobuyoshi*; Yamauchi, Yusuke*; Ariga, Katsuhiko*; et al.
no journal, ,
no abstracts in English
Ikeura, Hiromi*; Sekiguchi, Tetsuhiro
no journal, ,
Many peaks are observed in X-ray absorption fine structure near the inner-shall edges. Such fine structures are called near-edge X-rays absorption fine structure or abbreviated as NEXAFS. NEXAFS spectra provide us with information on property of electronic states concerning partial density of states of unoccupied conduction band for materials. In this work, we have investigated several sulfur-containing thiophene derivative polymers using NEXAFS spectroscopy. We have recorded the S K-edge NEXAFS spectra of film samples of these electronic materials and tried to interpret the origin of electronic transition seen in NEXAFS on the basis of molecular orbital theory. Furthermore, we discuss whether there is a potential relation between the observed spectra and charge-transfer property of the materials.
