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Journal Articles

Protected plutonium production at fast breeder reactor blanket; Chemical analysis of uranium-238 samples irradiated in experimental fast reactor Joyo

Onishi, Takashi; Koyama, Shinichi; Shiba, Tomooki*; Sagara, Hiroshi*; Saito, Masaki*

Progress in Nuclear Energy, 57, p.125 - 129, 2012/05

 Times Cited Count:1 Percentile:10.21(Nuclear Science & Technology)

In order to develop blanket fuel with high proliferation resistance in fast breeder reactor, chemical analysis of nine $$^{238}$$U samples irradiated in experimental fast reactor Joyo and Pu contents and Pu isotopic composition of the samples were measured. As results, dependence of Pu production behavior from $$^{238}$$U on neutron spectra was revealed.

Journal Articles

Study on effects of energetic ion irradiation in Gd$$_{2}$$O$$_{3}$$-doped CeO$$_{2}$$ by means of synchrotron radiation X-ray spectroscopy

Tahara, Yuki*; Shimizu, Hirotaka*; Ishikawa, Norito; Okamoto, Yoshihiro; Hori, Fuminobu*; Matsui, Toshiyuki*; Iwase, Akihiro*

Nuclear Instruments and Methods in Physics Research B, 277, p.53 - 57, 2012/04

In this study, to simulate such an environment, Gd$$_{2}$$O$$_{3}$$-doped CeO$$_{2}$$ samples were irradiated with 200 MeV Xe$$^{14+}$$ ions at room temperature using an ion beam accelerator at JAEA-Tokai. As CeO$$_{2}$$ has the same fluorite structure as that of UO$$_{2}$$ and several properties of CeO$$_{2}$$ are similar to UO$$_{2}$$, in this study CeO$$_{2}$$ was used as a simulation material of UO$$_{2}$$. To study the effects of the ion irradiation on Gd$$_{2}$$O$$_{3}$$-doped CeO$$_{2}$$, extended X-ray absorption fine structure (EXAFS) and X-ray photoelectron spectroscopy (XPS) were used at the Photon Factory of High Energy Accelerator Research Organization (KEK) as well as conventional X-ray diffraction (XRD) measurement. The EXAFS and XRD spectra show that the effects of the ion irradiation are more pronounced for higher amount of Gd$$_{2}$$O$$_{3}$$ dopant.

Oral presentation

Energy dependence of bombardment effect of 10-540-keV C$$_{60}$$ ions on a Si surface

Narumi, Kazumasa; Naramoto, Hiroshi*; Yamada, Keisuke; Chiba, Atsuya; Saito, Yuichi; Takahashi, Yasuyuki*; Maeda, Yoshihito

no journal, , 

Oral presentation

Vicinage effect on secondary-electron emission from amorphous carbon foils induced by swift C$$_{2}$$$$^{+}$$ ions

Narumi, Kazumasa; Takahashi, Yasuyuki*; Chiba, Atsuya; Saito, Yuichi; Yamada, Keisuke; Ishikawa, Norito; Sugai, Hiroyuki; Maeda, Yoshihito

no journal, , 

Oral presentation

Shape transformation of Au nanoparticles in SiO$$_{2}$$ induced by swift heavy-ion irradiation

Sasase, Masato*; Okayasu, Satoru; Yamamoto, Hiroyuki

no journal, , 

We have investigated morphological changes of nanoparticles induced by ion irradiation in order to control the size, shape and dispersion. The present study deals with the morphological change in Au nanoparticles embedded in SiO$$_{2}$$ matrix induced with 200 MeV Au ion irradiation. 200 MeV Au irradiation induced drastic changes in the size and shape of Au nanoparticles. The Au particle of changes their shape into nano-rods with length up to several hundred nanometers along the ion beam direction. The elongation of Au particles was observed at fluences higher than 1$$times$$10$$^{13}$$ ions/cm$$^{2}$$, which suggests the existence of critical fluence for the elongation of Au nanoparticles.

Oral presentation

Ion-track formation in UO$$_{2}$$ irradiated with high-energy heavy ions

Ishikawa, Norito; Sonoda, Takeshi*; Sawabe, Takashi*; Sugai, Hiroyuki; Sataka, Masao

no journal, , 

One of the intriguing characteristics of the radiation damages due to high-energy ion irradiation in UO$$_{2}$$ is the formation of continuous ion-tracks along ion-paths. It is expected that one of the determining factors of ion-track size is the electronic stopping power. If the electronic stopping power is sufficiently high exceeding a certain threshold, an ion-track can be formed by each traversing ion. In the present study, the TEM study for UO$$_{2}$$ irradiated with various high-energy ions (e.g. 100$$sim$$210 MeV Xe ions and 150$$sim$$310 MeV Au ions) has revealed that the ion-track size depends on the electronic stopping power. The dependence of ion-track size on the electronic stopping power is analyzed within the framework of thermal spike model.

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