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Sato, Kazuyoshi; Ezato, Koichiro; Taniguchi, Masaki; Suzuki, Satoshi; Akiba, Masato
Journal of Plasma and Fusion Research SERIES, Vol.5, p.556 - 560, 2002/00
no abstracts in English
Hayashi, Nobuhiko; Ozeki, Takahisa; Hamamatsu, Kiyotaka; Takizuka, Tomonori
Journal of Plasma and Fusion Research SERIES, Vol.5, p.519 - 522, 2002/00
Stabilizing simulation of the neoclassical tearing mode by an electron cyclotron current drive (ECCD) in JT-60 superconducting tokamak has been done by using a 1.5D time-dependent tokamak code TOPICS and the modified Rutherford's equation. A local EC current in the center of the island stabilizes the mode. However, the EC current off the center moves the rational surface and decreases the stabilizing effect of EC. Necessary range of EC current location for the stabilization becomes wider for low EC power, or narrower for high EC power, when the EC current profile is more peaked. The long duration of EC injection widens this range. Peaked EC current profile, early injection and long injection duration lower the minimum EC power necessary for the stabilization.
Isayama, Akihiko; Ide, Toshiyuki; Ikeda, Yoshitaka; Suzuki, Takahiro; Kajiwara, Ken; JT-60 Team
Journal of Plasma and Fusion Research SERIES, Vol.5, p.324 - 327, 2002/00
no abstracts in English
Kizu, Kaname; Sasajima, Tadayuki; Masaki, Kei; Hiratsuka, Hajime; Ichige, Hisashi; Honda, Masao; Miya, Naoyuki
Journal of Plasma and Fusion Research SERIES, Vol.5, p.446 - 449, 2002/00
no abstracts in English
Matsumoto, Taro; Tokuda, Shinji; Kishimoto, Yasuaki; Naito, Hiroshi*
Journal of Plasma and Fusion Research SERIES, Vol.5, p.523 - 526, 2002/00
no abstracts in English
Takei, Nahoko; Ozeki, Takahisa; Smolyakov, A. I.*; Isayama, Akihiko; Hayashi, Nobuhiko; Iio, Shunji*; Shimada, Ryuichi*
Journal of Plasma and Fusion Research SERIES, Vol.5, p.386 - 389, 2002/00
no abstracts in English
Seki, Masami; Moriyama, Shinichi; Kajiwara, Ken; Ikeda, Yoshitaka; Sakamoto, Keishi; Imai, Tsuyoshi; Fujii, Tsuneyuki
Journal of Plasma and Fusion Research SERIES, Vol.5, p.337 - 341, 2002/00
no abstracts in English