Strain analysis of thermoelectric materials using high-resolution synchrotron X-ray diffraction data

中沢 駿仁*; 菖蒲 敬久; 冨永 亜希; 藤井 柾志*; 松本 大成*; 松田 美知子*; 島田 武司*; Trivedi, V.*; 橘 信*; 辻井 直人*; et al.

粉体および粉末冶金, 72(Suppl.), p.S997 - S1001, 2025/03

https://doi.org/10.2497/jjspm.15P-T21-07

A compressive strength limit is one of critical parameters for thermoelectric materials. In this study, we synthesized a single crystal of Yb-filled Co-Sb-based skutterudite. We assessed the compressive pressure dependence of internal strain using high-resolution synchrotron radiation X-rays at SPring-8. The prepared single crystal was identified as Yb0.148Co4Sb12.54, with a lattice parameter of 0.90504 nm. Compressive testing was performed until the sample fractured, revealing a compressive strength limit of 591.3 MPa. The stress-strain curve exhibited a nearly constant slope for strains exceeding 0.07 %, leading to an estimated Young's modulus of 154.6 GPa.