Take-off/incident-angle-dependence of / peak intensity ratio in soft X-ray emission and absorption spectra of graphite and hexagonal boron nitride

Muramatsu, Yasuji; Gullikson, E. M.*; Perera, R. C. C.*

Advances in X-Ray Chemical Analysis, Japan, 34, p.153 - 163, 2003/00

Take-off/incident-angle-resolved soft X-ray emission and absorption spectra of highly oriented pyrolytic graphite (HOPG) and hexagonal boron nitride (h-BN) are measured by using polarized synchrotron radiation. The angle-dependent / peak intensity ratio can be explained by the configuration of - and -orbitals, which provides the information of layer ordering in the graphite-like layered materials.