Tang, J.*; Yamamoto, Susumu*; Koitaya, Takanori*; Yoshigoe, Akitaka; Tokunaga, Takuma*; Mukai, Kozo*; Matsuda, Iwao*; Yoshinobu, Jun*
Applied Surface Science, 480, p.419 - 426, 2019/06
Mass transports during hydrogen adsorption and absorption processes of PdCu alloys that has advantages of higher hydrogen diffusivity and economically lower-cost than the other Pd-alloys were studied. The research was made with a comparison of the well-known ordered phase of the bcc structure (the B2 phase) and a mixed phase of the fcc and B2 structures. ultrahigh vacuum X-ray photoelectron spectroscopy and ambient pressure X-ray photoelectron spectroscopy using synchrotron radiation were carried out to trace the chemical states of the Pd and Cu atoms as a function of temperatures. It is elucidated that the initial adsorption and absorption processes were similar in the two phases, but a hydrogen diffusion rate to the bulk was higher in the ordered phase than in the mixed one. We found the dynamics of the Pd and Cu atoms during the hydrogen adsorption/absorption processes largely depend on temperature. In the hydrogen atmosphere, the Pd atoms segregate at the surface below 373 K and Cu atoms segregate at the surface above 373 K. The present results agree well with the previous theoretical calculations and, thus, provide appropriate inputs toward developments of the hydrogen permeation materials.
Shimoyama, Iwao; Baba, Yuji; Hirao, Norie*
Applied Surface Science, 405, p.255 - 266, 2017/05
NEXAFS spectroscopy is applied to study orientation structures of polydimethylsilane (PDMS) films deposited on heteroatom-doped graphite substrates prepared by ion beam doping. The Si -edge NEXAFS spectra of PDMS show opposite trends of polarization dependence for non irradiated and N-irradiated substrates, and show no polarization dependence for an Ar-irradiated substrate. Based on a theoretical interpretation of the NEXAFS spectra via first-principles calculations, we clarify that PDMS films have lying, standing, and random orientations on the non irradiated, N-irradiated, and Ar-irradiated substrates, respectively. Furthermore, photoemission electron microscopy indicates that the orientation of a PDMS film can be controlled with microstructures on the order of m by separating irradiated and non irradiated areas on the graphite surface. These results suggest that surface modification of graphite using ion beam doping is useful for micro-orientation control of organic thin films.
Baba, Yuji; Shimoyama, Iwao; Hirao, Norie*
Applied Surface Science, 384, p.511 - 516, 2016/10
Chemical states of cesium as well as the other alkali metals (sodium and rubidium) sorbed in micaceous oxides have been investigated by total reflection X-ray photoelectron spectroscopy (TR-XPS). For cesium, it was shown that ultra-trace amount of cesium down to about 100 pg/cm can be detected by TR-XPS. This amount corresponds to about 200 Bq of Cs (t = 30.2y). It was demonstrated that ultra-trace amount of cesium corresponding to radioactive cesium level can be measured by TR-XPS. As to the chemical states, it was found that core-level binding energy in TR-XPS for trace-level cesium shifted to lower-energy side compared with that for thicker layer. A reverse tendency is observed in sodium. Based on charge transfer within a simple point-charge model, it is concluded that chemical bond between alkali metal and micaceous oxide for ultra-thin layer is more polarized that for thick layer.
Teraoka, Yuden; Yoshigoe, Akitaka
Applied Surface Science, 346, P. 580, 2015/08
Teraoka, Yuden; Yoshigoe, Akitaka
Applied Surface Science, 343, P. 212, 2015/07
Teraoka, Yuden; Moritani, Kosuke*; Yoshigoe, Akitaka
Applied Surface Science, 343, P. 213, 2015/07
Teraoka, Yuden; Yoshigoe, Akitaka
Applied Surface Science, 339, P. 158, 2015/06
Xu, Y.*; Ma, Y.*; Sakurai, Junya*; Teraoka, Yuden; Yoshigoe, Akitaka; Demura, Masahiko*; Hirano, Toshiyuki*
Applied Surface Science, 315, p.475 - 480, 2014/10
Hashinokuchi, Michihiro*; Yoshigoe, Akitaka; Teraoka, Yuden; Okada, Michio*
Applied Surface Science, 287, p.282 - 286, 2013/12
Hashinokuchi, Michihiro*; Tode, Mayumi*; Yoshigoe, Akitaka; Teraoka, Yuden; Okada, Michio*
Applied Surface Science, 276, p.276 - 283, 2013/07
Takahiro, Katsumi*; Ninakuchi, Yuki*; Kawaguchi, Kazuhiro; Isshiki, Toshiyuki*; Nishio, Koji*; Sasase, Masato*; Yamamoto, Shunya; Nishiyama, Fumitaka*
Applied Surface Science, 258(19), p.7322 - 7326, 2012/07
A nanometer-sized metallic particle embedded in a transparent dielectric exhibits a nonlinear susceptibility, and going to be applied to nonlinear optical devices. In the present study, well-ordered arrangements of Ag nanoparticles have been found for Ag-implanted SiO. Thermally grown SiO on Si were implanted with 350 keV-Ag ions to fluences of 0.37-1.2 10 ions/cm. Cross-sectional transmission electron microscopy and scanning transmission electron microscopy reveal the presence of a two-dimensional array of Ag nanoparticles of 25-40 nm in diameter located at a depth of 130 nm, together with the self-organization of tiny Ag nanoparticles aligned along the SiO/Si interface. X-ray photoelectron spectroscopy and X-ray diffraction confirm the stability of these Ag nanoparticles embedded in the SiO/Si is found to be stable against oxidation and sulfidation when stored in ambient conditions for more than one and a half year.
Narita, Ayumi; Baba, Yuji; Sekiguchi, Tetsuhiro; Shimoyama, Iwao; Hirao, Norie; Yaita, Tsuyoshi
Applied Surface Science, 258(6), p.2034 - 2037, 2012/01
In order to apply the organic thin films to electric and optical devices, the immobilization of organic molecules on inorganic substrate is essential. Considering optical devices, it is important to immobilize organic molecules on oxide surfaces, because many of oxides have insulating and transparent properties. In this study, we have investigated the chemical states of the interface between organic molecules with silicon alkoxide and sapphire surfaces by X-ray photoelectron spectroscopy and near edge absorption fine structure (NEXAFS). Octadecyl-triethoxy-silane (ODTS) molecules which are terminated by silicon alkoxide were adsorbed on sapphire surfaces. On the basis of the Si 1s XPS spectra for monolayer, it is supposed that the chemical bond between silicon alkoxide and the surface is formed. For Si K-edge NEXAFS spectra, the polarization dependence was observed, which suggests that the Si-O bond in ODTS was located perpendicular to the surface.
Koswattage, K.; Shimoyama, Iwao; Baba, Yuji; Sekiguchi, Tetsuhiro; Nakagawa, Kazumichi*
Applied Surface Science, 258(4), p.1561 - 1564, 2011/12
Adsorption behavior of atomic deuterium on a hexagonal boron nitride (h-BN) thin film is studied by photon-stimulated ion desorption (PSID) of D and near edge X-ray absorption fine structure (NEXAFS) at the B and N K-edges. After the adsorption of atomic deuterium, D desorption yield (h) shows clear enhancement at the B K-edge and almost no enhancement at the N K-edge. NEXAFS spectra show a large change in the B K-edge and a small change in the N K-edge after the adsorption. We propose selective adsorption of atomic deuterium on the h-BN thin film based on the experimental results, and mention the effectiveness of applying the PSID method with X-ray to study hydrogen storage materials.
Hirao, Norie; Baba, Yuji; Sekiguchi, Tetsuhiro; Shimoyama, Iwao; Honda, Mitsunori*
Applied Surface Science, 258(3), p.987 - 990, 2011/11
The lateral surface diffusion at Si-SiO interface has been observed at nanometer scale using photoelectron emission microscopy (PEEM) combined with synchrotron soft X-ray excitation. The samples investigated were Si-SiO micro-patterns prepared by O ion implantation in Si(0 0 1) wafer using a mask. The lateral spacial resolution of the PEEM system was about 41 nm. The brightness of each spot in the PEEM images changed depending on the photon energy around the Si -edge, in proportion to the X-ray absorption intensity of the corresponding valence states. It was found that the lateral diffusion occurs at lower temperature than that reported for the longitudinal diffusion at the Si-SiO interface. It was also found that no intermediate valence states such as SiO (Si) exist at the Si-SiO interface during the diffusion. The observed differences between lateral and longitudinal diffusion are interpreted by the sublimated property of silicon monoxide (SiO).
Motohashi, Kenji*; Saito, Yuichi; Kitazawa, Sin-iti
Applied Surface Science, 257(13), p.5789 - 5792, 2011/04
Okada, Michio*; Sowa, Makoto*; Kasai, Toshio*; Teraoka, Yuden
Applied Surface Science, 257(9), p.4257 - 4263, 2011/02
Yoshimura, Kimio; Hakoda, Teruyuki; Yamamoto, Shunya; Yoshikawa, Masahito
Applied Surface Science, 257(9), p.4428 - 4431, 2011/02
no abstracts in English
Esaka, Fumitaka; Yamamoto, Hiroyuki; Udono, Haruhiko*; Matsubayashi, Nobuyuki*; Yamaguchi, Kenji; Shamoto, Shinichi; Magara, Masaaki; Kimura, Takaumi
Applied Surface Science, 257(7), p.2950 - 2954, 2011/01
Chemical state analysis by a combination of X-ray photoelectron spectroscopy (XPS) and X-ray absorption spectroscopy (XAS) using synchrotron radiation is performed for -FeSi single crystals and homoepitaxial -FeSi films. The Si 2p XPS and Fe L-edge XAS spectra imply that the annealing at 1173 K to remove native oxide layers on the crystal induces the formation of FeSi in the surface. The formation of FeSi is also confirmed by Si K-edge XAS analysis. For the homoepitaxial -FeSi films grown on the crystals, the Si K-edge XAS spectra indicate that structurally homogeneous -FeSi films can be grown on the -FeSi single crystals when the substrate temperatures of 973 and 1073 K are applied for molecular beam epitaxy (MBE). Consequently, it is indicated that the combination of XPS and XAS using synchrotron radiation is a useful tool to clarify chemical states nondestructively.
Hakoda, Teruyuki; Yamamoto, Shunya; Kawaguchi, Kazuhiro; Yamaki, Tetsuya; Kobayashi, Tomohiro*; Yoshikawa, Masahito
Applied Surface Science, 257(5), p.1556 - 1561, 2010/12
Carbon-based films having nitrogen species on their surface were prepared on a glassy-carbon (GC) substrate as a non-platinum cathode catalyst for polymer electrolyte fuel cells by depositing cobalt and carbon in the presence of N gas using a pulse laser deposition method and then removing metal Co by HCl-washing treatment. The oxygen reduction reaction (ORR) activity was electrochemically determined using a rotating disk electrode system where the film samples on the GC substrate were replaceable. The ORR activity increased with elevating temperature of the GC substrate during the deposition. A carbon-based film prepared at 600C in the presence of 66.7 Pa N showed the highest ORR activity among the tested samples; its ORR potential was 0.66 V (vs. NHE). This film was composed of amorphous carbons doped with pyridine-type nitrogen atoms on its surface.
Tagawa, Masahito*; Yokota, Kumiko*; Kitamura, Akira*; Matsumoto, Koji*; Yoshigoe, Akitaka; Teraoka, Yuden; Kanda, Kazuhiro*; Niibe, Masahito*
Applied Surface Science, 256(24), p.7678 - 7683, 2010/10
Surface structural changes of a hydrogenated diamond-like carbon (DLC) film exposed to a hyperthermal atomic oxygen beam were investigated by Rutherford backscattering spectroscopy (RBS), synchrotron radiation photoelectron spectroscopy (SR-PES), and near-edge X-ray absorption fine structure (NEXAFS). It was confirmed that the DLC surface was oxidized and etched by high-energy collisions of atomic oxygen. RBS and real-time mass-loss data showed a linear relationship between etching and atomic oxygen fluence. SR-PES data suggested that the oxide layer was restricted to the topmost surface of the DLC film. NEXAFS data were interpreted to mean that the sp structure at the DLC surface was selectively etched by collisions with hyperthermal atomic oxygen, and an sp-rich region remained at the topmost DLC surface. The formation of an sp-rich layer at the DLC surface led to surface roughening and a reduced erosion yield relative to the pristine DLC surface.