Initialising ...
Initialising ...
Initialising ...
Initialising ...
Initialising ...
Initialising ...
Initialising ...
Fe
Mn
Si heusler alloy thin filmsNabialek, A.*; Chumak, O.*; Seki, Takeshi*; Takanashi, Koki; Baczewski, L. T.*; Szymczak, H.*
IEEE Transactions on Magnetics, 59(11), p.2501405_1 - 2501405_5, 2023/11
Times Cited Count：1 Percentile：24.05(Engineering, Electrical & Electronic)Mori, Michiyasu; Ziman, T.*
IEEE Transactions on Magnetics, 59(11), p.1300505_1 - 1300505_5, 2023/11
Times Cited Count：0 Percentile：0.00(Engineering, Electrical & Electronic)Fujimoto, Junji*; Funaki, Hiroshi*; Koshibae, Wataru*; Matsuo, Mamoru; Maekawa, Sadamichi*
IEEE Transactions on Magnetics, 58(8), p.1500407_1 - 1500407_7, 2022/08
Times Cited Count：2 Percentile：0.00(Engineering, Electrical & Electronic)
Fe
O
/Pt heterostructuresIeda, Junichi; Okayasu, Satoru; Harii, Kazuya*; Kobata, Masaaki; Yoshii, Kenji; Fukuda, Tatsuo; Ishida, Masahiko*; Saito, Eiji
IEEE Transactions on Magnetics, 58(8), p.1301106_1 - 1301106_6, 2022/08
Times Cited Count：1 Percentile：12.40(Engineering, Electrical & Electronic)The combination of spin-driven thermoelectric (STE) devices based on spin Seebeck effect (SSE), and radioactive isotopes as heat sources, has potential as a next-generation method of power generation in applications such as power supplies for space probes. However, there has been very limited knowledge available indicating the irradiation tolerance of spin thermoelectric devices. Through analysis using a heavy ion-beam accelerator and the hard X-ray photoemission spectroscopy (HAXPES) measurements, we show that a prototypical STE device based on YFeO/Pt heterostructures has tolerance to irradiation of high-energy heavy-ion beams. We used 320 MeV gold ion beams modeling cumulative damages due to fission products emitted from the surface of spent nuclear fuels. By varying the dose level, we confirmed that the thermoelectric and magnetic properties of the SSE elements are not affected by the ion-irradiation dose up to 
ions/cm
fluence and that the SSE signal is extinguished around 
ions/cm, in which the ion tracks almost fully cover the sample surface. In addition, the HAXPES measurements were performed to understand the effects at the interface of YFeO/Pt. The HAXPES measurements suggest that the chemical reaction that diminishes the SSE signals is enhanced with the increase of the irradiation dose. We share the current understandings of the damage analysis in YFeO/Pt for developing better STE devices applicable to harsh environmental usages.
Inami, Toshiya*; Shobu, Takahisa; Ishii, Kenji*
IEEE Transactions on Magnetics, 57(3, Part 2), p.6400105_1 - 6400105_5, 2021/03
Times Cited Count：0 Percentile：0.00(Engineering, Electrical & Electronic)
Yamanouchi, Michihiko*; Oyamada, Tatsuro*; Sato, Koichi*; Ota, Hiromichi*; Ieda, Junichi
IEEE Transactions on Magnetics, 55(7), p.1400604_1 - 1400604_4, 2019/07
Times Cited Count：4 Percentile：24.45(Engineering, Electrical & Electronic)Abderrahmane, A.*; Koide, Shota*; Sato, Shinichiro; Oshima, Takeshi; Sandhu, A.*; Okada, Hiroshi*
IEEE Transactions on Magnetics, 48(11), p.4421 - 4423, 2012/11
Times Cited Count：20 Percentile：67.30(Engineering, Electrical & Electronic)Recent industrial trends indicate increasing demand for Hall effect sensors for monitoring magnetic fields under extreme conditions such as high temperatures and under harmful radiation conditions. In this study, robust and high sensitivity Hall effect sensors using AlGaN/GaN heterostructures with a two-dimensional electron gas at the heterointerface were fabricated, and their magnetic properties were investigated. The AlGaN/GaN 2DEG Hall sensors were stable to at least 400 
C and even after irradiation of 380 keV protons at the fluence of 1 
10
/cm. The results showed that the AlGaN/GaN 2DEG Hall sensors had superior radiation tolerance to AlGaAs/GaAs and AlInSb/InAsSb/AlInSb magnetic sensors.
Kajiwara, Yosuke*; Takahashi, Saburo*; Maekawa, Sadamichi; Saito, Eiji*
IEEE Transactions on Magnetics, 47(6), p.1591 - 1594, 2011/06
Times Cited Count：9 Percentile：46.68(Engineering, Electrical & Electronic)Chen, Z.; ;
IEEE Transactions on Magnetics, 36(7), 298-2 Pages, 1999/12
In this paper, a method for reconstruction of a crack with faces in physical contact (closures) is proposed utilizing signals of eddy current testing(ECT).Based on a numerical model proposed for modeling the crack,a fast forward solver for simulation of the ECT signals is extended to deal with the crack closures.In order to reconstruct crack parameters in different type (e.g.,shape parameters and conductivity),an algorithm based on the conjugate gradient method was developed with use of ECT signals predicated using the rapidforward solver.Acceptable reconstruction results were obtained for several testing problems that,in turn, verified the validity of the proposed approach.
Sugimoto, Makoto; ; Isono, Takaaki; Koizumi, Norikiyo; Nakajima, Hideo; Kato, Takashi; Nishi, Masataka; Takahashi, Yoshikazu; Ando, Toshinari; Tsuji, Hiroshi; et al.
IEEE Transactions on Magnetics, 32(4), p.2328 - 2331, 1996/07
Times Cited Count：6 Percentile：50.71(Engineering, Electrical & Electronic)no abstracts in English
Al insert to be tested in ITER central solenoid model coilKoizumi, Norikiyo; ; ; Takahashi, Yoshikazu; Sugimoto, Makoto; Nakajima, Hideo; Kato, Takashi; Nunoya, Yoshihiko; Ando, Toshinari; Tsuji, Hiroshi; et al.
IEEE Transactions on Magnetics, 32(4), p.2236 - 2239, 1996/07
Times Cited Count：11 Percentile：63.69(Engineering, Electrical & Electronic)no abstracts in English
; Koizumi, Norikiyo; Takahashi, Yoshikazu; Matsui, Kunihiro; Tsuji, Hiroshi; Shimamoto, Susumi
IEEE Transactions on Magnetics, 32(4), p.2858 - 2861, 1996/07
Times Cited Count：2 Percentile：30.90(Engineering, Electrical & Electronic)no abstracts in English
Al conductorAndo, Toshinari; Sugimoto, Makoto; Koizumi, Norikiyo; Nunoya, Yoshihiko; Matsui, Kunihiro; Nishi, Masataka; Tsuji, Hiroshi; Shimamoto, Susumi
IEEE Transactions on Magnetics, 32(4), p.2324 - 2327, 1996/07
Times Cited Count：14 Percentile：69.06(Engineering, Electrical & Electronic)no abstracts in English
Yoshida, Kiyoshi; Shimada, M.*; Matsukawa, Makoto; C.Sborchia*; B.Stepanov*; J.Stoner*;
IEEE Transactions on Magnetics, 32(4), p.2240 - 2243, 1996/07
Times Cited Count：2 Percentile：30.90(Engineering, Electrical & Electronic)no abstracts in English
; Suzuki, Junichi; ; Morii, Yukio
IEEE Transactions on Magnetics, 30(6), p.4029 - 4031, 1994/11
Times Cited Count：10 Percentile：66.22(Engineering, Electrical & Electronic)no abstracts in English
Sugimoto, Makoto; Isono, Takaaki; Koizumi, Norikiyo; Takahashi, Yoshikazu; Nishi, Masataka; Okuno, Kiyoshi; Yoshida, Kiyoshi; Nakajima, Hideo; Ando, Toshinari; Hosono, Fumikazu*; et al.
IEEE Transactions on Magnetics, 30(4), p.2042 - 2045, 1994/07
Times Cited Count：1 Percentile：24.59(Engineering, Electrical & Electronic)no abstracts in English
Al cable-in-conduit conductor for fusion machinesTakahashi, Yoshikazu; Sugimoto, Makoto; Isono, Takaaki; Nakajima, Hideo; Ando, Toshinari; Oshikiri, Masayuki*; Hosono, Fumikazu*; ; ; Hanawa, Hiromi*; et al.
IEEE Transactions on Magnetics, 30(4, Part2), p.2531 - 2534, 1994/07
no abstracts in English
Nishi, Masataka; Ando, Toshinari; Isono, Takaaki; Sugimoto, Makoto; Koizumi, Norikiyo; Yoshida, Kiyoshi; Kawano, Katsumi; Takahashi, Yoshikazu; ; Tsuji, Hiroshi; et al.
IEEE Transactions on Magnetics, 28(1), p.597 - 600, 1992/01
Times Cited Count：5 Percentile：52.09(Engineering, Electrical & Electronic)no abstracts in English
Sn demo poloidal coil(DPC-EX)Ando, Toshinari; Takahashi, Yoshikazu; Okuno, Kiyoshi; Tsuji, Hiroshi; Hiyama, Tadao; Nishi, Masataka; Tada, Eisuke; Yoshida, Kiyoshi; Koizumi, Norikiyo; Nakajima, Hideo; et al.
IEEE Transactions on Magnetics, 28(1), p.206 - 209, 1992/01
Times Cited Count：4 Percentile：47.60(Engineering, Electrical & Electronic)no abstracts in English
Sn coilNishi, Masataka; Isono, Takaaki; Takahashi, Yoshikazu; Ando, Toshinari; Tsuji, Hiroshi; ; Aoki, Nobuo*; ;
IEEE Transactions on Magnetics, 27(2), p.2280 - 2283, 1991/03
Times Cited Count：3 Percentile：41.40(Engineering, Electrical & Electronic)no abstracts in English
