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Journal Articles

Development of an atomated single cell irradiation system combined with a high-energy heavy ion microbeam system

Kamiya, Tomihiro; Yokota, Wataru; Kobayashi, Yasuhiko; Cholewa, M.*; Krochmal, M. S.*; Laken, G.*; Larsen, I. D.*; Fiddes, L.*; Parkhill, G.*; Dowsey, K.*

Nuclear Instruments and Methods in Physics Research B, 181(1-4), p.27 - 31, 2001/07

 Times Cited Count:30 Percentile:10.41(Instruments & Instrumentation)

no abstracts in English

Journal Articles

STIM imaging for mammalian cell samples before micro-PIXE analyses in air environment at JAERI Takasaki light ion microbeam system

Kamiya, Tomihiro; Sakai, Takuro; Oikawa, Masakazu*; Sato, Takahiro*; Ishii, Keizo*; Sugimoto, Asuka*; Matsuyama, Shigeo*

International Journal of PIXE, 9(3-4), p.217 - 225, 1999/11

no abstracts in English

Journal Articles

An Automated single ion hit at JAERI heavy ion microbeam to observe individual radiation damage

Kamiya, Tomihiro; Sakai, Takuro; *; *; Hirao, Toshio

Nuclear Instruments and Methods in Physics Research B, 158(1-4), p.255 - 259, 1999/00

 Times Cited Count:6 Percentile:52.28(Instruments & Instrumentation)

no abstracts in English

Journal Articles

JAERI heavy ion microbeam single ion hit experiment

Kamiya, Tomihiro; Sakai, Takuro; *; *; Hirao, Toshio

F-113-'98/NIES, p.60 - 63, 1998/00

no abstracts in English

Journal Articles

Accuracy of beam positioning in TIARA

Kamiya, Tomihiro; ; *; Suda, Tamotsu*; Hirao, Toshio

Nuclear Instruments and Methods in Physics Research B, 130(1-4), p.285 - 288, 1997/00

 Times Cited Count:12 Percentile:30.05(Instruments & Instrumentation)

no abstracts in English

Journal Articles

Beam positioning and single ion hit system in the high energy heavy ion microbeam apparatus

Kamiya, Tomihiro; ; Suda, Tamotsu*; *

BEAMS 1995: Dai-6-Kai Ryushisen No Sentanteki Oyo Gijutsu Ni Kansuru Shimpojiumu, 0, p.127 - 130, 1995/00

no abstracts in English

Journal Articles

Control of JAERI heavy ion microbeam system and beam measurement

Kamiya, Tomihiro; Yuto, Hidenori; Tanaka, Ryuichi

Dai-5-Kai Tandemu Kasokuki Oyobi Sono Shuhen Gijutsu No Kenkyukai Hokokushu, p.116 - 119, 1992/07

no abstracts in English

Journal Articles

Single ion hit system in heavy ion microbeam apparatus

Kamiya, Tomihiro; *; Tanaka, Ryuichi

Dai-3-Kai Ryushisen No Sentanteki Oyo Gijutsu Ni Kansuru Shimpojiumu, p.453 - 456, 1992/00

no abstracts in English

Journal Articles

Microbeam system for study of single event upset of semiconductor devices

Kamiya, Tomihiro; *; Minehara, Eisuke; Tanaka, Ryuichi; Odomari, Iwao*

Nuclear Instruments and Methods in Physics Research B, 64, p.362 - 366, 1992/00

 Times Cited Count:29 Percentile:9.15(Instruments & Instrumentation)

no abstracts in English

Journal Articles

Development of ion microprobe system at WASEDA University

M.Koh*; *; *; *; *; *; *; Kamiya, Tomihiro; *; Minehara, Eisuke; et al.

Proceedings of International Workshop on Radiation Effects of Semiconductor Devices for Spasce Application, p.105 - 111, 1992/00

no abstracts in English

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