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Journal Articles

Development of analytical techniques for isotopic composition determination of uranium particles in environmental sample for safeguards with Secondary Ion Mass Spectrometry

Tomita, Ryohei; Tomita, Jumpei; Suzuki, Daisuke; Yasuda, Kenichiro; Miyamoto, Yutaka

Hosha Kagaku, (48), p.1 - 15, 2023/09

Secondary Ion Mass Spectrometry (SIMS) is the method to detect secondary ions produced by the sputtering of primary ions. SIMS is one of effective method to measure isotopic composition of particles containing nuclear material in environmental sample for safeguards. We are a group member of the International Atomic Energy Agency (IAEA)'s network of analytical laboratories and have developed analytical techniques using SIMS and other mass spectrometers for nuclear safeguards. We will introduce the principle of SIMS and analytical techniques developed by our group to measure isotopic composition of uranium particles which having a particle diameter of micron order in environmental sample for safeguards.

Journal Articles

Strongly enhanced secondary ion emission by molecular ion irradiation

Yamamoto, Hiroyuki; Saito, Takeru; Asaoka, Hidehito

Journal of Trace and Microprobe Techniques, 19(4), p.571 - 579, 2001/11

 Times Cited Count:4 Percentile:14.60(Chemistry, Analytical)

no abstracts in English

Journal Articles

Silicon cluster formation by molecular ion irradiation; Relationship between iradiated ion species and cluster yield

Yamamoto, Hiroyuki; Saito, Takeru; Asaoka, Hidehito

Applied Surface Science, 178(1-4), p.127 - 133, 2001/07

 Times Cited Count:5 Percentile:31.66(Chemistry, Physical)

no abstracts in English

Journal Articles

Application of SIMS and TXRF techniques to lead air-pollution monitoring

Esaka, Fumitaka; Zheng, W.*; Watanabe, Kazuo; Magara, Masaaki; Hanzawa, Yukiko; Usuda, Shigekazu; Adachi, Takeo

Advances in Mass Spectrometry, 15, p.973 - 974, 2001/00

no abstracts in English

Journal Articles

Development and application of PIE apparatuses for high-burnup LWR fuels

; Mita, Naoaki; Nishino, Yasuharu; Amano, Hidetoshi

JAERI-Conf 99-009, p.103 - 111, 1999/09

no abstracts in English

Journal Articles

Emission of silicon cluster ions by molecular ion bombardment

Yamamoto, Hiroyuki; Baba, Yuji

Applied Physics Letters, 72(19), p.2406 - 2408, 1998/05

 Times Cited Count:9 Percentile:42.41(Physics, Applied)

no abstracts in English

Oral presentation

Development of pretreatment and analysis for environmental samples containing radiocaesium; Preliminary ToF-SIMS analysis of Cs isotope ratio in the microparticle

Tagomori, Hisaya*; Kawamura, Hidehisa*; Kusano, Keiichi*; Dohi, Terumi

no journal, , 

To investigate their spatial distribution and physicochemical properties of the radiocaesium-bearing micro particles (CsMPs), an efficient methodology for determine and analysis them is required. Here we focused on CsMPs from litters as they may affect the radiocaesium cycling in forest ecosystem. In this study we developed a method to determine CsMPs (mostly 1-10 $$mu$$m sizes) from litters by combine digestion treatment and automatic particle analysis with FE-EPMA. In total it took up to 3 days for detecting one CsMP from huge amounts of mineral-like and metallic particles. In the ToF-SIMS analysis for Cs isotope ratios of CsMPs to understand their emission source as the next step, pretreatment for easily detecting micron-sized samples is needed. To solve this problem, FIB technique was used for Gallium marking formation around target sample. Preliminary Cs isotope ratios(133Cs, 134(Cs + Ba), 135Cs, 137(Cs + Ba)) and their distributions of CsMPs were determined by applying these approaches. We developed pretreatment for microscopy and ToF-SIMS analysis of CsMPs.

Oral presentation

Analytical method to remove electrostatic discharge on uranium particle based by porous silicon particle and the effect of discharge for uranium isotopic ratio analysis by SIMS

Tomita, Ryohei; Tomita, Jumpei; Suzuki, Daisuke; Yasuda, Kenichiro; Miyamoto, Yutaka

no journal, , 

In this study, we tried to solve the problem of electrostatic discharge on uranium particle based by porous silicon particle and to analyze uranium isotopic ratio of the uranium particle-based silicon by SIMS with high accuracy. Experimental results showed that primary beam of negative oxygen (O$$^{-}$$) is effective to compensate charge of uranium particle-based silicon. The negative primary beam also enable us to analyze uranium isotopic ratio of the uranium particle-based silicon within 2$$sigma$$ range of standard deviation.

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