Refine your search:     
Report No.
 - 
Search Results: Records 1-20 displayed on this page of 56

Presentation/Publication Type

Initialising ...

Refine

Journal/Book Title

Initialising ...

Meeting title

Initialising ...

First Author

Initialising ...

Keyword

Initialising ...

Language

Initialising ...

Publication Year

Initialising ...

Held year of conference

Initialising ...

Save select records

Journal Articles

New progress in the observation and application of the laser-plasma in the semiconductors and dielectrics, 2; Study of non-thermal effects on femtosecond laser ablation of transparent dielectrics through the measurements of spallation dynamics

Kumada, Takayuki

Purazuma, Kaku Yugo Gakkai-Shi, 96(4), p.176 - 180, 2020/04

We have developed time-resolved reflectivity measurement system using femtosecond laser pulses, which can measure structure of thin films generated by non-thermal effect.

Journal Articles

Development of spin-contrast-variation neutron reflectometry for the structural analysis of multilayer films

Kumada, Takayuki; Akutsu, Kazuhiro*; Oishi, Kazuki*; Morikawa, Toshiaki*; Kawamura, Yukihiko*; Sahara, Masae*; Suzuki, Junichi*; Torikai, Naoya*

Journal of Applied Crystallography, 52(5), p.1054 - 1060, 2019/10

 Times Cited Count:0 Percentile:100(Chemistry, Multidisciplinary)

We developed a technique of spin-contrast-variation neutron reflectometry (SCV-NR). Polarized-neutron reflectivity curves of film samples vary as a function of their proton-polarization P. The P-dependent reflectivity curves of a polystyrene film was precisely reproduced using a common set of structure parameters and the P-dependent neutron scattering length. The reflectivity curve of poly (styrene-block-isoprene) (PSPI) presented a shoulder attributed to holes with the depth corresponding to one period of periodic lamellae on the free surface only at a specific P. In this way, structural information about specific surfaces or interfaces can be obtained by controlling the P.

Journal Articles

Development of dynamic nuclear polarization system for spin-contrast-variation neutron reflectometry

Kumada, Takayuki; 7 of others*

JPS Conference Proceedings (Internet), 22, p.011015_1 - 011015_5, 2018/11

Journal Articles

Magnetic field dependence of the canted spin moment around the interface between ferromagnetic Ni and antiferromagnetic FeMn revealed by the polarized neutron reflectivity

Amemiya, Kenta*; Sakamaki, Masako*; Mizusawa, Mari*; Takeda, Masayasu

JPS Conference Proceedings (Internet), 8, p.034004_1 - 034004_6, 2015/09

Journal Articles

Neutron reflectometers in J-PARC

Yamada, Norifumi*; Takeda, Masayasu; Yamazaki, Dai

Hamon, 24(4), p.288 - 295, 2014/11

no abstracts in English

Journal Articles

Neutron reflectometer

Takeda, Masayasu; Yamazaki, Dai; Hino, Masahiro*

Hamon, 24(3), p.200 - 205, 2014/08

no abstracts in English

JAEA Reports

Development of multilayer mirrors for use in the wavelength region of 4 nm

Ishino, Masahiko; Yoda, Osamu*; Koike, Masato

JAERI-Research 2005-019, 13 Pages, 2005/09

JAERI-Research-2005-019.pdf:1.46MB

We have developed soft X-ray multilayer mirrors for use around the wavelength region of 4 nm including the K-absorption edge of carbon ($$lambda = 4.4 nm$$). We have chosen Co$$_3$$O$$_4$$ and Cr as the final candidate materials for absorber layers, and SiO$$_2$$ and Sc for the spacer materials as the result of theoretical invitation. Co$$_3$$O$$_4$$/SiO$$_2$$, Co$$_3$$O$$_4$$/Sc and Cr/Sc multilayer mirrors have been fabricated by means of an ion beam sputtering (IBS) method. As the result of structure evaluations with X-ray diffraction measurement, we have found that the fabricated Co$$_3$$O$$_4$$/Sc and Cr/Sc multilayer mirrors have stable structures. Soft X-ray reflectivity measurements for fabricated multilayer mirrors are carried out in the wavelength region of 4 nm with a synchrotron radiation source. We have found that the Cr/Sc multilayer mirror has a high soft X-ray reflectivity. However, soft X-ray reflectivities below the absorption edge of carbon are reduced. The analyses obtained by EPMA and SIMS suggested that this phenomenon was attributed to contamination of carbon.

Journal Articles

Growth and characterization of thin films on hydrogen layers

Asaoka, Hidehito

KEK Proceedings 2004-5, p.52 - 53, 2004/08

no abstracts in English

Journal Articles

Optimization of the silicon oxide layer thicknesses inserted in the Mo/Si multilayer interfaces for high heat stability and high reflectivity

Ishino, Masahiko; Yoda, Osamu

Journal of Applied Physics, 92(9), p.4952 - 4958, 2002/11

 Times Cited Count:5 Percentile:74.37(Physics, Applied)

no abstracts in English

Journal Articles

New evaluation beamline for soft X-ray optical elements

Koike, Masato; Sano, Kazuo*; Yoda, Osamu; Harada, Yoshihisa*; Ishino, Masahiko; Moriya, Naoji*; Sasai, Hiroyuki*; Takenaka, Hisataka*; Gullikson, E. M.*; Mrowka, S.*; et al.

Review of Scientific Instruments, 73(3), p.1541 - 1544, 2002/03

 Times Cited Count:20 Percentile:29.1(Instruments & Instrumentation)

no abstracts in English

Journal Articles

Soft X-ray reflectivity and structure evaluation of CoCr/C multilayer X-ray mirrors for spectral region around 6nm

Takenaka, Hisataka*; Nagai, Komei*; Ito, Hisashi*; Muramatsu, Yasuji; Kawamura, T.*; Gullikson, E. M.*; Perera, R. C. C.*

Nuclear Instruments and Methods in Physics Research A, 467-468(Part1), p.337 - 340, 2001/07

 Times Cited Count:8 Percentile:44.53

no abstracts in English

Journal Articles

Soft X-ray reflectivity and structure evaluation of Ni/C/Ti/C multilayer X-ray mirrors for water-window region

Takenaka, Hisataka*; Ito, Hisashi*; Nagai, Komei*; Muramatsu, Yasuji; Gullikson, E. M.*; Perera, R. C. C.*

Nuclear Instruments and Methods in Physics Research A, 467-468(Part1), p.341 - 344, 2001/07

 Times Cited Count:24 Percentile:15.37

no abstracts in English

Journal Articles

On the proposal of quantitative temperature measurement by using three-color technique combined with several infrared sensors having different detecton wavelength bands

Inagaki, Terumi*; Ishii, Toshimitsu

Infrared Physics & Technology, 41(6), p.325 - 337, 2000/12

 Times Cited Count:19 Percentile:27.39

no abstracts in English

JAEA Reports

None

*

JNC-TJ7420 2000-007, 28 Pages, 2000/03

JNC-TJ7420-2000-007.pdf:11.92MB

no abstracts in English

JAEA Reports

Design and manufacture of a testing device for the evaluation of optical elements

Shimizu, Yuichi; Yoda, Osamu; Sasuga, Tsuneo*; Teraoka, Yuden; Yokoya, Akinari; Yanagihara, Mihiro*

JAERI-Tech 2000-021, p.45 - 0, 2000/03

JAERI-Tech-2000-021.pdf:3.01MB

no abstracts in English

Journal Articles

Neutron irradiation test of optical components for fusion reactor

Ishitsuka, Etsuo; Sagawa, Hisashi; Nagashima, Akira; Sugie, Tatsuo; Nishitani, Takeo; Yamamoto, Shin; Kawamura, Hiroshi

Effects of Radiation on Materials (ASTM STP 1366), p.1176 - 1185, 2000/00

no abstracts in English

Journal Articles

Optical spectra of excitons in lithium oxide

Ishii, Yoshinobu; *; *

Journal of the Physical Society of Japan, 68(2), p.696 - 697, 1999/02

 Times Cited Count:28 Percentile:20.66(Physics, Multidisciplinary)

no abstracts in English

Journal Articles

FTIR reflection absorption spectroscopy for organic thin film on ITO substrate

Tamada, Masao; Koshikawa, Hiroshi; Hosoi, Fumio; Suwa, Takeshi

Thin Solid Films, 315(1-2), p.40 - 43, 1998/00

 Times Cited Count:12 Percentile:42

no abstracts in English

Journal Articles

Temperature dependency of optical properties of thermochromic materials

Kubo, Shinji; Akino, Norio; Akiyama, Mitsunobu*; *

Netsu Bussei, 11(2), p.39 - 45, 1997/00

no abstracts in English

Journal Articles

High reflection LH experiments with the JT-60U launcher with oversized waveguides

Tuccillo, A. A.*; S.Podda*; Seki, Masami; Asakura, Nobuyuki; Ide, Shunsuke; Ikeda, Yoshitaka; Kimura, Haruyuki; Kondoh, Takashi; Naito, Osamu; Ushigusa, Kenkichi; et al.

AIP Conference Proceedings 355, p.114 - 117, 1995/00

no abstracts in English

56 (Records 1-20 displayed on this page)