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Hasegawa, Kunio; Dulieu, P.*; Lacroix, V.*
Proceedings of 2017 ASME Pressure Vessels and Piping Conference (PVP 2017) (CD-ROM), 5 Pages, 2017/07
The stress intensity factors of the subsurface flaws are affected by the stress concentrations caused by the notches. The interaction of stress intensity factor increases with increasing stress concentration factor and decreasing the ligament distance between the tips of the subsurface flaws and the notches for a given notch width. Such subsurface flaws shall be transformed to surface flaws at far distance of the notch tips for conservative evaluations. This paper shows the interactions of stress intensity factors of subsurface flaws under stress concentration fields. Based on the interaction, a flaw-to-surface proximity criterion for a circular flaw is proposed under the stress concentration field induced by a notch.
Hasegawa, Kunio*; Li, Y.; Serizawa, Ryosuke*; Kikuchi, Masanori*; Lacroix, V.*
Procedia Materials Science, 12, p.36 - 41, 2016/00
Times Cited Count：0 Percentile：100If subsurface flaws are detected that are close to component free surfaces, flaw-to-surface proximity rule is used to determine whether the flaws should be treated as subsurface flaws as is, or transformed to surface flaws. However, specific factors for the proximity rules on transforming subsurface to surface flaws differ among fitness-for-service codes. The objective of the paper is to reveal the proximity factor from the stress intensity factor interaction between the subsurface flaw and the free surface.
Sagisaka, Akito; Utsumi, Takayuki*; Daido, Hiroyuki; Ogura, Koichi; Orimo, Satoshi; Takai, Mamiko; Hayashi, Yukio; Mori, Michiaki; Yogo, Akifumi; Kado, Masataka; et al.
Journal of Plasma Physics, 72(6), p.1281 - 1284, 2006/12
Times Cited Count：0 Percentile：100(Physics, Fluids & Plasmas)no abstracts in English
Nishikino, Masaharu; Tanaka, Momoko; Kawazome, Hayato; Kawachi, Tetsuya; Sasaki, Akira; Hasegawa, Noboru; Ochi, Yoshihiro; Kishimoto, Maki; Nagashima, Keisuke; Onishi, Naofumi*
AIP Conference Proceedings 827, p.499 - 504, 2006/04
no abstracts in English
Nishikino, Masaharu; Kawazome, Hayato; Tanaka, Momoko; Kishimoto, Maki; Hasegawa, Noboru; Ochi, Yoshihiro; Kawachi, Tetsuya; Nagashima, Keisuke
IPAP Conference Series 7 (Proceedings of 8th International Conference on X-ray Microscopy (XRM 2005)), p.423 - 425, 2005/00
no abstracts in English
Kobayashi, Shinji*; Sakasai, Akira; Koide, Yoshihiko; Sakamoto, Yoshiteru; Kamada, Yutaka; Hatae, Takaki; Oyama, Naoyuki; Miura, Yukitoshi
Purazuma, Kaku Yugo Gakkai-Shi, 79(10), p.1043 - 1050, 2003/10
no abstracts in English
Tomimitsu, Hiroshi; Hasegawa, Yuji*; Aizawa, Kazuya
Physics Letters A, 309(3-4), p.183 - 188, 2003/03
Times Cited Count：0 Percentile：100no abstracts in English
Kawano, Yasunori; Chiba, Shinichi; Inoue, Akira*
Proceedings of 30th EPS Conference on Controlled Fusion and Plasma Physics (CD-ROM), 4 Pages, 2003/00
It has been successful to apply CVD diamond plate as the vacuum window for infrared CO
laser interferometry and polarimetry for electron density measurement in the JT-60U tokamak. In comparison with using the conventional zinc-selenide windows, the Faraday rotation component at diamond windows was small as negligible. This resulted in the improvement of the Faraday rotation measurement for a tokamak plasma by polarimetry.
Kotaki, Hideyuki; Kando, Masaki; Oketa, Takatsugu; Masuda, Shinichi; Koga, J. K.; Kondo, Shuji; Kanazawa, Shuhei; Yokoyama, Takashi*; Matoba, Toru; Nakajima, Kazuhisa
Physics of Plasmas, 9(4), p.1392 - 1400, 2002/04
Times Cited Count：42 Percentile：18.36(Physics, Fluids & Plasmas)no abstracts in English
laser interferometerChiba, Shinichi; Kawano, Yasunori; Tsuchiya, Katsuhiko; Inoue, Akira*
JAERI-Research 2001-050, 59 Pages, 2001/11
JAERI-Research-2001-050.pdf:15.28MB
no abstracts in English
Onodera, Seiji; Hirose, Hideyuki; Izawa, Kazuhiko; Tanino, Shuichi; Kaminaga, Jota*; Sakuraba, Koichi; Miyauchi, Masakatsu; Tonoike, Kotaro; Miyoshi, Yoshinori; Yanagisawa, Hiroshi; et al.
JAERI-Tech 2001-057, 54 Pages, 2001/09
JAERI-Tech-2001-057.pdf:4.28MB
no abstracts in English
Tomimitsu, Hiroshi; Hasegawa, Yuji*; Aizawa, Kazuya
Journal of the Physical Society of Japan, Vol.70, Supplement A, p.462 - 464, 2001/05
no abstracts in English
Kotaki, Hideyuki; Kando, Masaki; Kondo, Shuji; Masuda, Shinichi; Kanazawa, Shuhei; Yokoyama, Takashi*; Matoba, Toru; Nakajima, Kazuhisa
Proceedings of 13th Symposium on Accelerator Science and Technology, 3 Pages, 2001/00
no abstracts in English
Tajima, Toshiki; Soyama, Kazuhiko; Koga, J. K.; Takuma, Hiroshi
Journal of the Physical Society of Japan, 69(12), p.3840 - 3846, 2000/12
Times Cited Count：2 Percentile：72.77(Physics, Multidisciplinary)no abstracts in English
Onodera, Seiji; Sono, Hiroki; Hirose, Hideyuki; Tanino, Shuichi; Kaminaga, Jota*; Myomae, Tomoki*; Murakami, Kiyonobu; Sakuraba, Koichi; Miyauchi, Masakatsu; Tonoike, Kotaro; et al.
JAERI-Tech 2000-059, 46 Pages, 2000/11
JAERI-Tech-2000-059.pdf:2.86MB
no abstracts in English
Cu, 
Cu, Cu, 
Hg and HgTomimitsu, Hiroshi; Hasegawa, Yuji*; Aizawa, Kazuya
Physics Letters A, 274(5-6), p.175 - 183, 2000/09
Times Cited Count：5 Percentile：55.03no abstracts in English
Uesaka, Mitsuru*; Kinoshita, Kenichi*; Watanabe, Takahiro*; Sugahara, Jun*; Ueda, Toru*; Yoshii, Koji*; Kobayashi, Tetsuya*; Halz, N.*; Nakajima, Kazuhisa; Sakai, Fumio*; et al.
IEEE Transactions on Plasma Science, 28(4), p.1133 - 1142, 2000/08
Times Cited Count：10 Percentile：64.04(Physics, Fluids & Plasmas)no abstracts in English
Uesaka, Mitsuru*; Watanabe, Takahiro*; Kinoshita, Kenichi*; Sugahara, Jun*; Harano, Hideki*; Ueda, Toru*; Yoshii, Koji*; Nakajima, Kazuhisa; Sakai, Fumio*; Kotaki, Hideyuki; et al.
Nippon Genshiryoku Gakkai-Shi, 42(4), p.310 - 324, 2000/04
Times Cited Count：0 Percentile：100(Nuclear Science & Technology)no abstracts in English
*; *; ; Aoto, Kazumi
JNC-TY9400 2000-010, 138 Pages, 2000/03
JNC-TY9400-2000-010.pdf:5.15MB
None
Ishitsuka, Etsuo; Sagawa, Hisashi; Nagashima, Akira; Sugie, Tatsuo; Nishitani, Takeo; Yamamoto, Shin; Kawamura, Hiroshi
Effects of Radiation on Materials (ASTM STP 1366), p.1176 - 1185, 2000/00
no abstracts in English
