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Journal Articles

Defect layer in SiO$$_2$$-SiC interface proved by a slow positron beam

Maekawa, Masaki; Kawasuso, Atsuo; Yoshikawa, Masahito; Miyashita, Atsumi; Suzuki, Ryoichi*; Odaira, Toshiyuki*

Physica B; Condensed Matter, 376-377, p.354 - 357, 2006/04

https://doi.org/10.1016/j.physb.2005.12.091
 Times Cited Count：2 Percentile：11.86(Physics, Condensed Matter)

no abstracts in English

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