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Yamamoto, Masahiko; Do, V. K.; Taguchi, Shigeo; Kuno, Takehiko; Takamura, Yuzuru*
Journal of Radioanalytical and Nuclear Chemistry, 327(1), p.433 - 444, 2021/01
Times Cited Count：0 Percentile：0.01(Chemistry, Analytical)A simple, practical, and reliable analytical method for determination of Na, K, Ca, Sr, and Ba by liquid electrode plasma optical emission spectrometry is developed. Appropriate emission lines for quantification, interferences from co-existing elements, and effect of measurement conditions with cell damage have been investigated. The spike and recovery tests using actual sample have been performed for method validation, and negligible sample matrix effect has been observed. Consequently, the method is successfully applied to several radioactive wastes. The obtained data have been agreed well with data from computer calculation and inductively coupled plasma optical emission spectrometry within 10% difference.
; Handa, Nuneo; Shiozawa, Kenichi; Hirata, Masaru; *
JAERI-M 90-062, 49 Pages, 1990/03
no abstracts in English
Bunko Kenkyu, 39(2), p.102 - 109, 1990/00
no abstracts in English
Bunko Kenkyu, 36(1), p.46 - 50, 1987/01
no abstracts in English
JAERI-M 85-028, 43 Pages, 1985/03
no abstracts in English
;
Bunko Kenkyu, 19(1), p.38 - 42, 1970/00
no abstracts in English
Bunseki Kagaku, 13(10), P. 1046, 1964/00
no abstracts in English
Kojundo Kinzoku No Bunseki Kensa, p.43 - 67, 1959/00
no abstracts in English
Terauchi, Masami*; Takahashi, Hideyuki*; Handa, Nobuo*; Murano, Takanori*; Koike, Masato; Imazono, Takashi; Koeda, Masaru*; Nagano, Tetsuya*; Sasai, Hiroyuki*; Oue, Yuki*; et al.
no journal, ,
As the basis of elemental mapping technology and composition analysis, X-ray emission spectroscopy excited by electron beam, have been widely used in material analysis in the electron microscope. In a soft X-ray region of 100 eV
2 keV, Emission released from bonding electrons to transition to the inner core level valence is dominant, and it is possible to measure the energy state of binding electron if the energy resolution is high enough. Authors have developed a nano-scale soft X-ray emission spectroscopy system which can be mounted to SEM/EPMA and has an extended energy range of 504000 eV with a spectral mapping software to apply more various materials based on our soft X-ray emission spectroscopic instrument for TEM. The advantage of SEM / EPMA is that flake sample preparation is not required unlike with the case of TEM analysis. A bulk sample is set as it is and, after performing morphological observation as well as elemental analysis by EDS, the energy state of the specific region can be observed. We are currently beginning the accumulation of the spectrum data of simple elements and their compounds and aiming the database construction that enables the analysis of the chemical bonding state of the elements from the spectrum shape obtained from a bulk sample.
Kodaka, Noriyasu; Yamamoto, Masahiko; Kuno, Takehiko; Takamura, Yuzuru*
no journal, ,
The K, Ca, Mg, Na, Fe, Cr, and Ni in plutonium (Pu) nitrate solution were determined by liquid electrode plasma optical emission spectrometry (LEP-OES). Since the emission line of Pu interfered the emission line of the target element in ICP-OES, removal of Pu was necessary in advance to the measurement. Contrastly, Pu emission lines were not observed, when Pu nitrate solution was measured by LEP-OES. However, emission of K, Ca, Mg, Na, Fe, Cr, and Ni was observed. Therefore each element were determined. It was found that trace elements in Pu nitrate solution can be quantified by LEP-OES without the Pu separation.
Nakanishi, Ryuzo; Saeki, Morihisa; Oba, Hironori
no journal, ,
Batsaikhan, M.; Oba, Hironori
no journal, ,
